1,720,973 research outputs found

    Wikipedia citations: A comprehensive data set of citations with identifiers extracted from English Wikipedia

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    Wikipedia’s content is based on reliable and published sources. To this date, relatively little is known about what sources Wikipedia relies on, in part because extracting citations and identifying cited sources is challenging. To close this gap, we release Wikipedia Citations, a comprehensive data set of citations extracted from Wikipedia. We extracted29.3 million citations from 6.1 million English Wikipedia articles as of May 2020, and classified as being books, journal articles, or Web content. We were thus able to extract 4.0 million citations to scholarly publications with known identifiers—including DOI, PMC, PMID, and ISBN—and further equip an extra 261 thousand citations with DOIs from Crossref. As a result, we find that 6.7 and that Wikipedia cites just 2% of all articles with a DOI currently indexed in the Web of Science. We release our code to allow the community to extend upon our work and update the data set in the future

    Going Beyond Counting First Authors in Author Co-citation Analysis

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    The present study examines one of the fundamental aspects of author co-citation analysis (ACA) - the way co-citation counts are defined. Co-citation counting provides the data on which all subsequent statistical analyses and mappings are based, and we compare ACA results based on two different types of co-citation counting - the traditional type that only counts the first one among a cited work's authors on the one hand and a non-traditional type that takes into account the first 5 authors of a cited work on the other hand. Results indicate that the picture produced through this non-traditional author co-citation counting contains more coherent author groups and is therefore considerably clearer. However, this picture represents fewer specialties in the research field being studied than that produced through the traditional first-author co-citation counting when the same number of top-ranked authors is selected and analyzed. Reasons for these effects are discussed

    Variations on the Author

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    “Variations on the Author” discusses two of Eduardo Coutinho’s recent films (Um Dia na Vida, from 2010, and Últimas Conversas, posthumously released in 2015) and their contribution to the general question of documentary authorship. The director’s filmography is characterized by a consistent yet self-effacing form of authorial self-inscription: Coutinho often features as an interviewer that rather than express opinions propels discourses; an interviewer that is good at listening. This mode of self-inscription characterizes him as an author who is not expressive but who is nonetheless markedly present on the screen. In Um Dia na Vida, however, Coutinho is completely absent form the image, while Últimas Conversas, on the contrary, includes a confessional prologue that moves the director from the margins to the center of his films. This article examines the ways in which these works stand out in the filmography of a director who offers new insights into the notion of cinematic authorship

    Appropriate Similarity Measures for Author Cocitation Analysis

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    We provide a number of new insights into the methodological discussion about author cocitation analysis. We first argue that the use of the Pearson correlation for measuring the similarity between authors’ cocitation profiles is not very satisfactory. We then discuss what kind of similarity measures may be used as an alternative to the Pearson correlation. We consider three similarity measures in particular. One is the well-known cosine. The other two similarity measures have not been used before in the bibliometric literature. Finally, we show by means of an example that our findings have a high practical relevance.information science;Pearson correlation;cosine;similarity measure;author cocitation analysis

    Dispelling the Myths Behind First-author Citation Counts

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    We conducted a full-scale evaluative citation analysis study of scholars in the XML research field to explore just how different from each other author rankings resulting from different citation counting methods actually are, and to demonstrate the capability of emerging data and tools on the Web in supporting more realistic citation counting methods. Our results contest some common arguments for the continued use of first-author citation counts in the evaluation of scholars, such as high correlations between author rankings by first-author citation counts and other citation counting methods, and high costs of using more realistic citation counting methods that are not well-supported by the ISI databases. It is argued that increasingly available digital full text research papers make it possible for citation analysis studies to go beyond what the ISI databases have directly supported and to employ more sophisticated methods

    Author Index

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    AI-Enabled Hardware Security Approach for Aging Classification and Manufacturer Identification of SRAM PUFs

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    Semiconductor microelectronics integrated circuits (ICs) are increasingly integrated into modern life-critical applications, from intelligent infrastructure and consumer electronics to the Internet of Things (IoT) and advanced military and medical systems. Unfortunately, these applications are vulnerable to new hardware security attacks, including microelectronics counterfeits and hardware modification attacks. Physical Unclonable Functions (PUFs) are state-of-the-art hardware security solutions that utilize process variations of integrated circuits for device authentication, secret key generation, and microelectronics counterfeit detection. The negative impact of aging on Static Random Access Memory Physical Unclonable Functions (SRAM PUFs) has significant consequences for microelectronics authentication, security, and reliability. This research thoroughly examines the effect of aging on the reliability of SRAM PUFs used for secure and trusted microelectronics integrated circuit applications. It initially provides an overview of SRAM PUFs, highlighting their significance and essential features while addressing encountered challenges. The study then covers mitigation techniques, including multi-modal PUFs, that already exist to boost the resilience of SRAM PUFs against aging impacts, highlighting their advantages and the gap in the research addressed in this research. This work proposes a novel AI-enabled security for reliable SRAM PUFs. The proposed approach aims to study and countermeasure the impact of aging on SRAM PUF by analyzing data samples, including Bias Temperature Instability (BTI), Bit Flips, Accelerated aging, and Hot Carrier Injection (HCI) and to study their effects on SRAM PUF cell properties and output. Accelerated aging is a direct result of a change in the environmental temperature and voltage for a few hours. We aim to mitigate the impact of accelerated aging on the reliability authentication and encryption keys of SRAM PUFs. Further, AI-assisted approach is used to analyze SRAM PUF stability under accelerated aging operating conditions. Illegal memory chips from shady companies around the world have compromised the safety and reliability of electronic devices. Detecting these manufacturer details is crucial to detecting illegal and substandard manufacturing prior to their integration into key systems. This paper presents a novel approach designed specifically to analyze the SRAM PUF manufacturers. The suggested technique assigns a distinct process variation to every manufacturer, facilitating the classification of the manufacturer, without the need for elaborate registration or verification protocols. The experimental results show the reliability and stability factors of SRAM PUF, including its influence on environmental conditions and the associated effects of aging. Our findings stress the importance of reliable and trustworthy PUF-based hardware security to reliably classify older microelectronic devices from new ones. Using 345 FPGA tested chips, the results show that using different ML models, we can efficiently classify these chips to correctly distinguish the manufacturer, aging impacts, and component, with F1 scores of 96% and 98%

    koamabayili/VECTRON-author-checklist: VECTRON author checklist

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    We have done our best to complete the author checklist relating to the use of animals in the hut study. Note that the objective for the hut study was to evaluate the IRS treatment applications for residual efficacy against Anopheles mosquitoes, including the local An. coluzzii mosquito population. Cows were only used to attract mosquitoes into the huts and no tests were carried out directly on the cows. The author checklist is intended for use with studies where experiments are carried out on animals, which is why we have had such difficulty in completing this for the hut study, as many of the questions do not relate to how the cows were used

    Analog Low Dropout Regulator Design Within a 12nm FinFET Node

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    Modern ICs require the use of multiple voltage regulators to regulate power, this creates the need for analog low dropout regulator (LDO) designs in more advanced nodes such as for the 12nm FinFET process. Analog design is particularly challenging in FinFET processes due to a variety of factors, such as quantized parameters, large parasitic values and length of diffusion effects. An analog LDO was chosen for its improved power supply rejection ratio (PSRR) over digital and hybrid approach which is a key metric for voltage sensitive applications. The LDO was designed through an iterative approach to address the difficulty of designing analog devices in a FinFET node. The LDO has a good post layout line regulation of 0.57%/V, however a post layout has a load regulation of 4.9%/A. The LDO achieved a PSRR of -43dB at 100kHz and a noise value of 103 nV/√Hz at a current draw of 50mA and a layout size of 0.007225mm2. The PSRR is significantly better than comparable works that use a digital or hybrid LDO approach. The circuit had an overshoot value of 15mV, and a voltage undershoot value of 10mV when switching current by 100mA. In addition, the circuit was tested underneath multiple corners that would be used for automotive qualification from SS -40C to FF 125C with 13 corners total tested. The design was iterated to meet specifications on all corners. There are issues with the PSRR values and overshoot values at the SS -40C corner that are discussed. Potential fabrication of the circuit is also discussed
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