1,721,011 research outputs found
Microelectronics Reliability - SPECIAL ISSUE 23rd EUROPEAN SYMPOSIUM ON THE RELIABILITY OF ELECTRON DEVICES, FAILURE PHYSICS AND ANALYSIS, Cagliari, Italy, 1–5 October 2012
No full textMonte Carlo modeling in the low-energy domain of the secondary electron emission of polymethylmethacrylate for critical-dimension scanning electron microscopy
No full textThe main scattering mechanisms governing the transport of
electrons in PMMA in an energy domain ranging from the energy of the
primary electron beam down to few hundreds of meV are identified. A
quantitative Monte Carlo model for the emission of secondary electrons
is developed to be applied for critical dimensions extraction from highresolution
scanning electron microscopy SEM images. Selected results
are presented, which demonstrate the accuracy of the proposed
approach. © 2010 Society of Photo-Optical Instrumentation Engineers
On the Use of Neural Networks to Solve the Reverse Modelling Problem for the Quantification of Dopant Profiles Extracted by Scanning Probe Microscopy Techniques
No full textA novel thermomechanics-based lifetime prediction model for cycle fatigue failure mechanisms in power semiconductors
No full textIn this paper, we propose different procedures to extract the statistical distribution of the thermal cycles suffered by power devices submitted to arbitrary mission profiles and we discuss the different lifetimes predicted by them under the assumption of linear accumulation of the damage produced by low cycling fatigue. Furthermore, we introduce a novel prediction procedure, which is based on some fundamental equations, which take into consideration the creep experienced by compliant materials when they are submitted to thermal cycles
Lifetime extrapolation for IGBT modules under realistic operation conditions
No full textIn this paper a systematic approach is presented for extrapolating the lifetime due to bond wire lift-off in IGBT modules submitted to cyclic loading. Application profiles of the device are considered, as they are usually encountered in real current converters for railway traction systems. The proposed lifetime prediction scheme is based on the principle of the linear accumulation of the fatigue damage and takes into account the redundancy of the bond wires
Lifetime prediction and design of reliability tests for high power devices in automotive applications
No full textMicroelectronics Reliability - SPECIAL ISSUE 29th EUROPEAN SYMPOSIUM ON THE RELIABILITY OF ELECTRON DEVICES, FAILURE PHYSICS AND ANALYSIS, Aalborg, Denmark, 1–5 October 2018
No full text
Going Beyond Counting First Authors in Author Co-citation Analysis
Full text linkThe present study examines one of the fundamental aspects of author co-citation analysis (ACA) - the way co-citation
counts are defined. Co-citation counting provides the data on which all subsequent statistical analyses and mappings
are based, and we compare ACA results based on two different types of co-citation counting - the traditional type that
only counts the first one among a cited work's authors on the one hand and a non-traditional type that takes into
account the first 5 authors of a cited work on the other hand. Results indicate that the picture produced through this non-traditional author co-citation counting contains more coherent author groups and is therefore considerably clearer. However, this picture represents fewer specialties in the research field being studied than that produced through the traditional first-author co-citation counting when the same number of top-ranked authors is selected and analyzed. Reasons for these effects are discussed
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