1,720,981 research outputs found
Elemental Mapping In Natural Rubber Latex Films By Electron Energy Loss Spectroscopy Associated With Transmission Electron Microscopy
No full textElement distribution maps from Hevea brasiliensis natural rubber latex thin films were obtained, by electron energy-loss spectroscopic imaging in a low-energy (80 kV) transmission electron microscope. C, N, O, P, Na, Ca, Mg, Al, Si, and S maps are presented for latex fractionated by centrifugation, either followed by dialysis or not. Most elements forming non-carbon compounds are concentrated in small, electron-dense spots surrounded by a carbon-rich matrix of polymer, thus showing that the rubber is filled with small particles compatible with the polyisoprene matrix. Ca distribution is unique, since it closely parallels the C distribution, evidencing an important role for -COO--Ca2+-COO- ionic bridges in the structure of natural rubber.741125412546Cyr, D.R., Natural rubber (1984) Encyclopedia of Chemical Technology, 20, p. 468. , Kirk-Othmer: New York(1999) Rubber Stat. Bull., 53Cornish, K., Siler, D.J., (1996) Chemtech, 26, pp. 38-44Sethuraj, M.R., Mathew, N.M., (1992) Natural Rubber: Biology, Cultivation and Technology, , Elsevier Science: AmsterdamTanaka, Y., Tangpakdee, J., (1997) Rubber Chem. Technol., 70, pp. 707-713Gazeley, K.F., Gorton, A.D.T., Pendle, T.D., Latex concentrates: Properties and composition (1988) Natural Rubber Science and Technology, , Roberts, A.D., Ed.Oxford University: New YorkBurfield, D.R., Gan, S.N., (1977) Polymer, 18, pp. 607-611Burfield, D.R., Gan, S.N., (1977) J. Polym. Sci. Polym. Chem., 15, pp. 2721-2730Kawahara, S., Kakubo, T., Sakdapipanich, J.T., Isono, Y., Tanaka, Y., (2000) Polymer, 41, pp. 7483-7488Gan, S.N., Ting, K.F., (1993) Polymer, 34, pp. 2142-2147Cooper, W., (1958) J. Polym. Sci., 28, pp. 195-206Xu, Z.S., Lu, G.H., Cheng, S.Y., (1995) J. Appl. Polym. Sci., 56, pp. 575-580Kim, J.H., Park, Y.J., (1999) Colloids Surf. A, 153, pp. 583-590Chen, G.-N., Chen, K.-N., (1999) J. Appl. Polym. Sci., 71, pp. 903-913Matsuda, H., Minoura, Y., (1979) J. Appl. Polym. Sci., 24, pp. 811-826Sato, K., (1983) Rubber Chem. Technol., 56, pp. 942-958Wiese, H., Rupaner, R., (1999) Colloid Polym. Sci., 217, pp. 372-375Huang, R.Y.M., Wei, Y., (1994) J. Appl. Polym. Sci., 53, pp. 179-185Ben Jar, P.-Y., Wu, Y.S., (1997) Polymer, 38, pp. 2557-2560De, S.K., Antony, P., Bandyopadhyay, S., (2000) Polymer, 41, pp. 787-793Jérôme, R., Moussaf, N., (1999) Polymer, 40, pp. 6831-6839D'Auzac, J., Jacob, J.-L., Chrestin, H., (1989) Physiology of Rubber Tree Latex, , CRC Press: Boca Raton, FLSouthorn, S.A., Yip, E., (1968) J. Rubber Res. Inst. Malaya, 20, pp. 201-215Webster, C.C., Baulkwill, W., (1989) J. Rubber, , Longman: New YorkVerhaar, G., (1973) Processing of Natural Rubber, , Agricultural Services Bulletin: AmsterdamJapan Patent 11,315,165-A, 1999Japan Patent 11,349,731-A, 2000Japan Patent 2,000,001,570-A, 2000Cardoso, A.H., Leite, C.A.P., Galembeck, F., (1998) Langmuir, 14, pp. 3187-3194Cardoso, A.H., Leite, C.A.P., Galembeck, F., (1999) Langmuir, 15, pp. 4447-4453Teixeira-Neto, E., Leite, C.A.P., Cardoso, A.H., Silva, M.C.V., Braga, M., Galembeck, F., (2000) J. Colloid Interface Sci., 231, pp. 182-189Amalvy, J.I., Asua, J.M., Leite, C.A.P., Galembeck, F., (2001) Polymer, 42, pp. 2479-2489Galembeck, A., Costa, C.A.R., Da Silva, M.C.V.M., Souza, E.F., Galembeck, F., (2001) Polymer, 42, pp. 4845-4851Cardoso, A.H., Leite, C.A.P., Galembeck, F., (2001) Colloids Surf. A, 181, pp. 49-55Braga, M., Costa, C.A.R., Leite, C.A.P., Galembeck, F., (2001) J. Phys. Chem. B, 105, pp. 3005-3011Cooke, P.M., (2000) Anal. Chem., 72, pp. 169R-188RPeng, W., Zhou, Z., China Patent 1,230,565-A, 2000Japan Patent 1,1349,731-A, 2000Gu, W., Guo, G., Taiwan Patent 354,797-A, 199
Esi-tem Imaging Of Surfactants And Ions Sorbed In Stöber Silica Nanoparticles
No full textThe sorption of surfactants and NaCl in silica nanosized particles creates unexpected spatial distributions of solutes that were evidenced by electron spectroscopy imaging in the transmission electron microscope (ESI/TEM). The spectral images show that simple ions (Na+, Cl-, Br -) are actually absorbed within the particles irrespective of their charges, while surfactant chains are adsorbed at the particle surfaces. The expected effect of the surfactants on particle aggregation is also observed in the micrographs. In the case of salt, close-packed silica particle arrays are formed at low ionic strength, but only coarse aggregates form at higher salt concentrations. The particles absorb both Na+ and Cl- ions in similar amounts, from 0.5 mol L-1 NaCl, but Na+ ions are depleted from the particles' immediate outer vicinity, where Cl- ions are in turn accumulated. These results confirm that Stöber silica nanoparticles are highly porous and reveal their potential usefulness as carriers of small molecules and ions, due to the small particle size, exceptional colloidal stability, and this newly found sorption behavior. © 2006 American Chemical Society.221771597166Bjelopavlic, M., Singh, P.K., El-Shall, H., Moudgil, B.M., (2000) J. Colloid Interface Sci., 226, pp. 159-165Pasquato, L., Pengo, P., Scrimin, P., (2005) Supramol. Chem., 17, pp. 163-171Phadtare, S., Vinod, V.P., Wadgaonkar, P.P., Rao, M., Sastry, M., (2004) Langmuir, 20, pp. 3717-3723Piech, M., Walz, J.Y., (2004) J. Phys. Chem. B, 108, pp. 9177-9188Bailey, R.E., Nie, S.M., (2003) J. Am. Chem. Soc., 125, pp. 7100-7106Manciu, F.S., Tallman, R.E., McCombe, B.D., Weinstein, B.A., Lucey, D.W., Sahoo, Y., Prasad, P.N., (2005) Phys. E, 26, pp. 14-18Lu, S.W., Sohling, U., Mennig, M., Schmidt, H., (2002) Nanotechnology, 13, pp. 669-673Caruso, F., Lichtenfelf, H., Giersig, M., Möhwald, H., (1998) J. Am. Chem. Soc., 120, pp. 8523-8524Galembeck, F., Lima, E.C.O., Massen, N.C., Monteiro, V.A.R., Souza, E.F., (1996) Fine Particles Science and Technology: from Micro- to Nanoparticles, pp. 267-279. , Pelizzetti, E., Ed.Kluwer: Dordrecht, The NetherlandsChen, Y., Ford, W.T., Materer, N.F., Teeters, D., (2000) J. Am. Chem. Soc., 122, pp. 10472-10473Pan, G.S., Tse, A.S., Kesavamoorthy, R., Asher, S.A., (1998) J. Am. Chem. Soc., 120, pp. 6518-6524Mori, H., Müller, A.H.E., Klee, J.E., (2003) J. Am. Chem. Soc., 125, pp. 3712-3713Stöber, W., Fink, A., Bohn, E., (1968) J. Colloid Interface Sci., 26, pp. 62-69Hardikar, V.V., Matrjevic, E., (2000) J. Colloid Interface Sci., 227, pp. 133-136Chabanov, A.A., Jun, Y., Norris, D.J., (2004) Appl. Phys. Lett., 84, pp. 3573-3575Pontoni, D., Narayanan, T., Rennie, A.R., (2002) Langmuir, 18, pp. 56-59Green, D.L., Lin, J.S., Lam, Y.F., Hu, M.Z.C., Schaefer, D.W., Harris, M.T., (2003) J. Colloid Interface Sci., 255, pp. 346-358Tolnai, G., Csempesz, F., Kabai-Faix, M., Kalman, E., Keresztes, Z., Kovacs, A.L., Rambsden, J.J., Horvolgyi, Z., (2001) Langmuir, 17, pp. 2683-2687Liu, J., Pelton, R., Hrymak, A.N., (2000) J. Colloid Interface Sci., 227, pp. 408-411Kobayashi, Y., Katakami, H., Mine, E., Nagao, D., Konno, M., Liz-Marzan, L.M., (2005) J. Colloid Interface Sci., 283, pp. 392-396Costa, C.A.R., Leite, C.A.P., Souza, E.F., Galembeck, F., (2001) Langmuir, 17, pp. 189-194Costa, C.A.R., Leite, C.A.P., Galembeck, F., (2003) J. Phys. Chem. B, 107, pp. 4747-4755Leite, C.A.P., Souza, E.F., Galembeck, F., (2001) J. Braz. Chem. Soc., 12, pp. 519-525Iler, R.K., (1979) The Chemistry of Silica, , Wiley. New YorkJain, T.K., Roy, I., De, T.K., Maitra, A., (1998) J. Am. Chem. Soc., 120, pp. 11092-11095Kulak, A., Hall, S.R., Mann, S., (2004) Chem. Commun., 5, pp. 576-577Bauer, D., Buchhammer, H., Fuchs, A., Jaeger, W., Killmann, E., Lunkwitz, K., Rehmet, R., Schwarz, S., (1999) Colloids Surf., A, 156, pp. 291-305Oh, M.H., So, J.H., Lee, J.D., Yang, S.M., (1999) Korean J. Chem. Eng., 16, pp. 532-537Suratwala, T., Hanna, M.L., Whitman, P., (2004) J. Non-cryst. Solids, 349, pp. 368-376Kim, D.Y., Kowach, G.R., Johnson, D.W., Bhandarkar, S., Du, H., (2004) J. Non-cryst. Solids, 342, pp. 18-24Ohno, T., Suzuki, H., Takahashi, J., Shimada, S., Ota, T., Takahashi, M., Hikichi, Y., (2002) Key Eng. Mater., 206, pp. 2185-2188Amalvy, J.I., Percy, M.J., Armes, S.P., Leite, C.A.P., Galembeck, F., (2005) Langmuir, 21, pp. 1175-1179Phan, T.N.T., Louvard, N., Bachiri, S.A., Perselho, J., Foissy, A., (2004) Colloids Surf., 244, pp. 131-140Gabriel, U., Charlet, L., Schlapfer, C.W., Vial, J.C., Brachmann, A., Geipel, G., (2001) J. Colloid Interface Sci., 239, pp. 358-368Dekany, I., Nemeth, J., Szekeres, M., Schoonheydt, R., (2003) Colloid Polym. Sci., 282, pp. 1-6Wang, Z., Friedrich, D.M., Bersersluis, M.R., Hemmer, S.L., Joly, A.G., Huesemann, M.H., Truex, M.I., Peyton, B.M., (2001) Environ. Sci. Technol., 35, pp. 2710-2716Bhosale, S., Wang, T.Y., Li, G.T., Siggel, U., Fuhrhop, J.H., (2004) J. Am. Chem. Soc., 126, pp. 13111-13118Ozkaya, D., Zhou, W., Thomas, I.M., Midgley, P., Keast, V.J., Hermans, S., (1999) Catal. Lett., 60, pp. 113-120Qalembeck, F., Souza, E.F., (1999) Polymer Interfaces and Emulsions, pp. 119-166. , Esumi, K., Ed.Marcel Dekker: New YorkRosemary, M.I., MacLeren, I., Pradeep, T., (2004) Carbon, 42, pp. 2352-2356Rippel, M.M., Leite, C.A.P., Lee, L.T., Galembeck, F., (2005) Colloid Polym. Sci., 283, pp. 570-574Sun, X.H., Li, C.P., Wong, W.K., Wong, N.B., Lee, C.S., Lee, S.T., Leo, B.K., (2002) J. Am. Chem. Soc., 124, pp. 14464-14471Wiacek, A., Chibowski, E., (2000) Colloids Surf., B, 17, pp. 175-190Soltys, A., Lazarz, M., Chibowski, E., (1997) Colloids Surf., A, 127, pp. 163-173Castaing, R., Hennenquin, J.F., Henry, L., Slodzian, G., The magnetic prism as an optical system (1967) Focusing of Charged Particles, pp. 265-293. , Septier, A., Ed.Academic Press: New YorkEgerton, R.F., (1986) Electron Energy-loss Spectroscopy in the Electron Microscope, , Plenum PressNew YorkReimer, L., Zepke, U., Moesch, J., Schulze-Hillert, S., Ross-Messemer, M., Probst, W., Weimer, E., (1992) EELS Spectroscopy: A Reference Handbook of Standard Data for Identification and Interpretation of Electron Energy-loss Spectra and for Generation of Electron Spectroscopic Images, , Carl Zeiss: Oberkochen, GermanyProbst, W., personal communicationJoy, D.C., (1986) Principles of Analytical Electron Microscopy, p. 256. , Plenum Press: New YorkPrinciples of Analytical Electron Microscopy, 50, p. 20Kiraly, Z., Tun, L., Dekany, I., Bean, K., Vincent, B., (1995) Magy. Kem. Foly., 101, pp. 501-510Denkov, N.D., Velev, O.D., Kralchevsky, P.A., Ivanov, I.B., Yoshimura, H., Nagayama, K., (1992) Langmuir, 8, pp. 3183-3190Cardoso, A.H., Leite, C.A.P., Galembeck, F., (2001) Colloids Surf., A, 181, pp. 49-55Szekeres, M., Tóth, J., Dékány, I., (2002) Langmuir, 18, pp. 2678-2685Goncalves, M.D., Marques, G.D.S., Galembeck, F., (1983) Sep. Sci. Technol., 18, pp. 893-904Wiese, H., Rupaner, R., (1999) Colloid Polym. Sci., 277, pp. 372-375Kazakov, S.V., Kaholek, M., (2002) Proc. SPIE Int. Soc. Opt. Eng., 4695, pp. 42-51Lee, L.-T., Leite, C.A.P., Galembeck, F., (2004) Langmuir, 20, pp. 4430-4435Galembeck, F., Costa, C.A.R., Galembeck, A., Silva, M.D.C.V.M., (2001) An. Acad. Bras. Ciênc., 73, pp. 495-51
Particle And Polymer Microchemistry And Electric Domain Mapping
No full textNew microscopy techniques are increasing accessible, yielding hitherto unavailable information on the spatial distribution of chemical constituents in sub-micron and nanosized particles, as well as in polymer films and other materials; this work describes four relevant examples. First, elemental distribution maps of a polystyrene latex obtained by electron spectroscopy coupled to transmission microscopy (ESI-TEM) show that particle C/S ratio is highly variable, evidencing the large differences in polymer Mw's, in different particles. Second, electric potential maps of latex macrocrystals obtained by scanning electron potential microscopy (SEPM) show negative large islands dispersed in a positive continuum, with large electric potential gradients. Backscattered electron imaging (BEI) evidences a core-and-shell structure of silica particles: the particles are made out of smaller domains with variable average atomic number, concentrated at the particle outer layers. The fourth example is a complex columnar structure of electric domains, in crystalline alumina, obtained by SEPM.374159166Galembeck, F., Souza, E.F., (1999) Polymers Interfaces and Emulsions, , K. Esumi, M. Dekker: New YorkCardoso, A.H., Leite, C.A.P., Galembeck, F., (1998) Langmuir., 14, p. 3187Terris, B.D., Sterm, J.E., Rugar, D., Mamin, H.J., (1990) J. Vac. Sci. Technol., A, 8, p. 374Goldstein, J.I., Newbury, D.E., Echlin, P., Rimig Jr., D.C., Lyman, C.E., Fiori, C., Lifshin, E., (1992) Scanning Electron Microscopy and X-ray Microanalysis, , New York: PlenumBraga, M., Costa, C.A.R., Leite, C.A.P., Galembeck, F., (2001) J. Phys. Chem. B, 15, p. 3005Galembeck, A., Costa, C.A.R., Da Suva, M.C.V.M., Souza, E.F., Galembeck, F., (2001) Polymer, 11, p. 4845Leite, C.A.P., De Souza, E.F., Galembeck, F., (2001) Jornal of the Brazilian Chemical Society, 12, p. 519Costa, C.A.R., Leite, C.A.P., De Souza, E.F., Galembeck, F., (2001) Langmuir, 17, p. 18
Polymer Electrostatics: Detection And Speciation Of Trapped Electric Charges By Electric Probe And Analytical Electron Microscopy
No full textThis work reviews new probe and electron microscopy approaches for the detection of charged domains in insulating polymers, as well as for the identification of the charge-bearing species: scanning electric potential microscopy (SEPM), electric force microscopy (EFM) and energy-loss spectroscopy imaging in the transmission electron microscope (ESI-TEM). The SEPM and EFM micrographs show patterned domains bearing excess electric charges and extending for tens of nanometers, in polymer latex particles and films. The charged species are identified by ESI-TEM as emulsion polymerization initiator and surfactant residues, as well as the associated counter-ions. Charged domains are also observed in common thermoplastic polymers, producing unexpectedly large electric potential gradients.1891526Galembeck, A., Costa, C.A.R., Silva, M.C.V.M., Souza, E.F., Galembeck, F., (2001) Polymer, 42, p. 4845Wu, K., Iedema, M.J., Cowin, J.P., (1999) Science, 286, p. 2482Bauer-Gogonea, S., Gerhard-Multhaupt, R., (1996) IEEE Trans Dielectr Electr Insul, 3, p. 677Malecki, J.A., (1999) Phys Rev B, 59, p. 9954Lacabanne, C., Goyaud, P., Boyer, R.F., (1980) Polym Sci J, 18, p. 277Shrivastava, K., Ranade, J.D., Srivastava, A.P., (1980) Thin Solid Films, 67, p. 201Mudarra, M., Belana, J., Cañadas, J.C., Diego, J.A., (1999) Polymer, 40, p. 2569Skinner, S.M., Svage, R.L., Rutzler J.E., Jr., (1953) Appl Phys J, 24, p. 438Skinner, S.M., (1955) Appl Phys J, 26, p. 509Ribeiro, J.C., (1950) An Acad Bras Cienc, 22, p. 325Eyerer, P., (1972) Adv Colloid Interface Sc, 3, p. 223Rollik, D., Bauer, S., Gerhard-Multhaupt, R., (1999) J Appl Phys, 85, p. 3282Terris, B.D., Stern, J.E., Rugar, D., Mamin, H.J., (1980) J Vac Sci Technol A-Vac Surf Films, 8, p. 374Nonnenmacher, M., O'Boyle, M.P., Wickramasinghe, H.K., (1991) Appl Phys Lett, 58, p. 2921Saurenbach, F., Terris, B.D., (1990) Appl Phys Lett, 56, p. 1703Schmidt, W.F., (1997) Liquid State Electronics of Insulating Liquids, , CRC Press, Boca Raton N.YGalembeck, F., Costa, C.A.R., Galembeck, A., Silva, M.C.V.M., (2001) An AcadBras Cienc, 73, p. 495Moita-Neto, J.M., Monteiro, V.A.R., Galembeck, F., (1996) Colloids Surf A, 108, p. 83Braga, M., Costa, C.A.R., Leite, C.A.P., Galembeck, F., (2001) J Phys Chem B, 105, p. 3005Keslarek, A.J., Costa, C.A.R., Galembeck, F., (2001) Langmuir, 17, p. 7886Cardoso, A.H., Leite, C.A.P., Galembeck, F., (1998) Langmuir, 14, p. 3187Nunes, S.P., Galembeck, F., (1983) J Polym Sci Part C - Polym Lett, 21, p. 49Heinicke, G., (1984) Tribochemistry, , Hanser, Berli
Going Beyond Counting First Authors in Author Co-citation Analysis
Get PDFThe present study examines one of the fundamental aspects of author co-citation analysis (ACA) - the way co-citation
counts are defined. Co-citation counting provides the data on which all subsequent statistical analyses and mappings
are based, and we compare ACA results based on two different types of co-citation counting - the traditional type that
only counts the first one among a cited work's authors on the one hand and a non-traditional type that takes into
account the first 5 authors of a cited work on the other hand. Results indicate that the picture produced through this non-traditional author co-citation counting contains more coherent author groups and is therefore considerably clearer. However, this picture represents fewer specialties in the research field being studied than that produced through the traditional first-author co-citation counting when the same number of top-ranked authors is selected and analyzed. Reasons for these effects are discussed
Variations on the Author
Get PDF“Variations on the Author” discusses two of Eduardo Coutinho’s recent films (Um Dia na Vida, from 2010, and Últimas Conversas, posthumously released in 2015) and their contribution to the general question of documentary authorship. The director’s filmography is characterized by a consistent yet self-effacing form of authorial self-inscription: Coutinho often features as an interviewer that rather than express opinions propels discourses; an interviewer that is good at listening. This mode of self-inscription characterizes him as an author who is not expressive but who is nonetheless markedly present on the screen. In Um Dia na Vida, however, Coutinho is completely absent form the image, while Últimas Conversas, on the contrary, includes a confessional prologue that moves the director from the margins to the center of his films. This article examines the ways in which these works stand out in the filmography of a director who offers new insights into the notion of cinematic authorship
Appropriate Similarity Measures for Author Cocitation Analysis
Get PDFWe provide a number of new insights into the methodological discussion about author cocitation analysis. We first argue that the use of the Pearson correlation for measuring the similarity between authors’ cocitation profiles is not very satisfactory. We then discuss what kind of similarity measures may be used as an alternative to the Pearson correlation. We consider three similarity measures in particular. One is the well-known cosine. The other two similarity measures have not been used before in the bibliometric literature. Finally, we show by means of an example that our findings have a high practical relevance.information science;Pearson correlation;cosine;similarity measure;author cocitation analysis
Morphology And Microchemistry Of Colloidal Polymers
No full textColloidal polymers are highly versatile due to the variety of properties and functions that can be created by changing monomer composition, surfactant, initiator and reaction protocol. Microchemical and morphological observation of the particles and particle aggregates as well as films and monoliths made with them is allowing us to understand the connections between nanosized structural features and macroscopic properties and this is essential for the creation of valuable new polymer materials. Electron spectroscopy imaging (ESI) in the transmission electron microscope (TEM) uses electron energy loss spectroscopy (EELS) to provide a wealth of information on particle constituents and their topological distribution, allowing a number of correlations with the polymer mechanical, thermal, optical and electrical properties. On the other hand, scanning probe microscopy (SPM) techniques allow direct measurement of particle and film properties such as adhesion, stiffness, electrostatic potential as well as rheology information with high spatial resolution, down to 10-20 nm and under many different experimental conditions. Information from the joint use of these techniques is revealing a wealth of nanostructures within colloidal polymers requiring a revision of many preconceived ideas on these materials. Copyright © 2006 WILEY-VCH Verlag GmbH & Co. KGaA.245-246307314(1986) Principles of Analytical Electron Microscopy, , D. C. Joy, A. D. Romig, Jr, J. l. Goldstein, Eds, Plenum, New YorkEggerton, R.F., (1986) Electron Energy-Loss Spectroscopy in the Electron Microscope, , Plenum, New YorkCrazier, P.A., (1995) Ultramicroscopy, 58, p. 157F. Galembeck, Latex Dispersions and Emulsions in:Encyclopedia of Surface and Colloid Science, Second Edition, Taylor and Francis, New York 2006, p.5/3261-3277Schaffer, B., Grogger, W., Hofer, F., (2003) Micron, 34, p. 1Horiuchi, S., Hamanaka, T., Aoki, T., Miyakawa, T., Narita, R., Wakabayashi, H., (2003) J. Electron Microscopy, 52, p. 255F. Galembeck and Carlos Alberto R. Costa, Electric Scanning Probe Techniques: Kelvin Force Microscopy and Electric Force Microscopy in: Encyclopedia of Surface and Colloid Science, Second Edition, Taylor and Francis, New York 2006, p. 3/1874-1883Galembeck, F., Costa, C.A.R., Galembeck, A., da Silva, M.C.V.M., (2001) Anais da Academia Brasileira de Ciências, 73, p. 495Teixeira-Neto, E., Kaupp, G., Galembeck, F., (2003) J. Phys. Chem. B, 107, p. 14255Teixeira-Neto, E., Kaupp, G., Galembeck, F., (2004) Colloids Surfaces A, 243, p. 79Braga, M., Costa, C.A.R., Leite, C.A.P., Galembeck, F., (2001) J. Phys. Chem. B, 105, p. 3005Amalvy, J.I., Asua, J.M., Leite, C.A.P., Galembeck, F., (2001) Polymer, 42, p. 2479Keslarek, A.J., Leite, C.A.P., Galembeck, F., (2004) J. Braz. Chem. Soc, 15, p. 66Valadares, L.R., Leite, C.A.P., Galembeck, F., (2006) Polymer, 47, p. 672Cardoso, A.C., Leite, C.A.P., Galembeck, F., (1998) Langmuir, 14, p. 3187Santos, J.P., Corpart, P., Wong, K., Galembeck, F., (2004) Langmuir, 20, p. 10576Rippel, M.M., Leite, C.A.P., Lee, L.T., Galembeck, F., (2005) Colloid and Polymer Sci, 283, p. 570Rippel, M.M., Costa, C.A.R., Galembeck, F., (2004) J. Braz. Chem. Soc, 15, p. 66Rippel, M.M., Lee, L.T., Leite, C.A.P., Galembeck, F., (2003) J. Coloid. Interf. Sci, 268, p. 330Galembeck, A., Costa, C.A.R., da Silva, M.C.V.M., Galembeck, F., (2001) J. Coloid. Interf. Sci, 234, p. 39
Dispelling the Myths Behind First-author Citation Counts
Get PDFWe conducted a full-scale evaluative citation analysis study of scholars in the XML research field to explore just how different from each other author rankings resulting from different citation counting methods actually are, and to demonstrate the capability of emerging data and tools on the Web in supporting more realistic citation counting methods. Our results contest some common arguments for the continued
use of first-author citation counts in the evaluation of scholars, such as high correlations between author rankings by first-author citation counts and other citation
counting methods, and high costs of using more realistic citation counting methods that are not well-supported by the ISI databases. It is argued that increasingly available digital full text research papers make it possible for citation analysis studies to go beyond what the ISI databases have directly supported and to employ more
sophisticated methods
- …
