1,721,047 research outputs found
STRUCTURAL CHARACTERIZATION AND THERMAL-STABILITY OF W/SI MULTILAYERS
No full textTungsten/silicon multilayers with tungsten layers of a thickness of 1-2 nm were prepared by means of electron beam deposition. Their structure and thermal stability under rapid thermal annealing were investigated by a combination of x-ray diffraction techniques and cross-sectional transmission electron microscopy. The crystallization behavior was found to depend on the interdiffusion and mixing at the tungsten/silicon interfaces during deposition as well as during annealing. The as-deposited tungsten/silicon multilayers were amorphous and remained stable after annealing at 250-degrees-C/40 s. Interdiffusion and crystallization occurred after annealing all samples from 500-degrees-C/40 s up to 1000-degrees-C/20 s. By performing the same heat treatment in the tungsten/silicon multilayers, the formation of body-centered cubic W was observed with a layer thickness ratio delta(W)/delta(Si) = 1, whereas tetragonal WSi2 was detected in tungsten/silicon multilayers with a layer thickness ratio of delta(W)/delta(Si) less-than-or-equal-to 0.25. This dependence of the crystallization products on the layer thickness ratio delta(W)/delta(Si) originates from the different phenomena of interdiffusion and mixing at the tungsten/silicon interfaces. The possible formation of bcc tungsten as a first stage of crystallization of tungsten-silicon amorphous phase, rich in tungsten, is discussed
Effect of ion beam polishing on the interface quality in a Ti/C multilayer mirror for 'water window'
No full textJergel M, Holy V, Majkova E, et al. Effect of ion beam polishing on the interface quality in a Ti/C multilayer mirror for 'water window'. In: Delhez R, ed. Proceedings of the Sixth European Powder Diffraction Conference. Mat.Sci.Forum. Vol 321-324. Uetikon-Zürich: Trans Tech Publ.; 2000: 184-184
Going Beyond Counting First Authors in Author Co-citation Analysis
Full text linkThe present study examines one of the fundamental aspects of author co-citation analysis (ACA) - the way co-citation
counts are defined. Co-citation counting provides the data on which all subsequent statistical analyses and mappings
are based, and we compare ACA results based on two different types of co-citation counting - the traditional type that
only counts the first one among a cited work's authors on the one hand and a non-traditional type that takes into
account the first 5 authors of a cited work on the other hand. Results indicate that the picture produced through this non-traditional author co-citation counting contains more coherent author groups and is therefore considerably clearer. However, this picture represents fewer specialties in the research field being studied than that produced through the traditional first-author co-citation counting when the same number of top-ranked authors is selected and analyzed. Reasons for these effects are discussed
Variations on the Author
Full text link“Variations on the Author” discusses two of Eduardo Coutinho’s recent films (Um Dia na Vida, from 2010, and Últimas Conversas, posthumously released in 2015) and their contribution to the general question of documentary authorship. The director’s filmography is characterized by a consistent yet self-effacing form of authorial self-inscription: Coutinho often features as an interviewer that rather than express opinions propels discourses; an interviewer that is good at listening. This mode of self-inscription characterizes him as an author who is not expressive but who is nonetheless markedly present on the screen. In Um Dia na Vida, however, Coutinho is completely absent form the image, while Últimas Conversas, on the contrary, includes a confessional prologue that moves the director from the margins to the center of his films. This article examines the ways in which these works stand out in the filmography of a director who offers new insights into the notion of cinematic authorship
Intermixing in Immiscible Molybdenum/Copper Multilayered Metallization under Excimer Laser Irradiation.
No full textAppropriate Similarity Measures for Author Cocitation Analysis
Full text linkWe provide a number of new insights into the methodological discussion about author cocitation analysis. We first argue that the use of the Pearson correlation for measuring the similarity between authors’ cocitation profiles is not very satisfactory. We then discuss what kind of similarity measures may be used as an alternative to the Pearson correlation. We consider three similarity measures in particular. One is the well-known cosine. The other two similarity measures have not been used before in the bibliometric literature. Finally, we show by means of an example that our findings have a high practical relevance.information science;Pearson correlation;cosine;similarity measure;author cocitation analysis
Effects of cobalt thin films on the a-Si crystallisation induced by excimer laser irradiation.
No full textIn the present work, we report the results obtained by laser irradiation of a-Si/Co/SiO(2) and a-Si/SiO(2) samples in order to study the influence of the Co film on the a-Si crystallisation process. Both Co and a-Si layers were deposited by electron beam evaporation. Cobalt films of 0.5, 1 and 3 nm were deposited upon a 300 nm thick SiO(2) layer. The thickness of the a-Si layer was fixed at 200 nm. Samples were irradiated by a XeCl excimer laser under fluences of 0.40, 0.45 and 0.50 J cm(-2) and 1 or 10 number of pulses. Grazing incidence XRD and cross-sectional TEM were used for sample characterisation. Results showed the formation of CoSi(2) that, in general, considerably improves the crystallinity of the a-Si layer. In some cases, the presence of the CoSi(2) underlayer allowed the complete crystallisation of the a-Si layer even after the first laser pulse. Without CoSi(2), the same results were obtained only with a higher number of pulses
Interfacial Reactions of Thin Iron Films on Silicon under Amorphous Silicon and SiOx Capping
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