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Introduction To The Specular Reflection And Reflection-absorption Techniques In The Infrared: (1) Reflection-absorption [às Técnicas De Reflexão Especular E De Reflexão-absorção No Infravermelho: (2) Reflexão-absorção]
No full textThis paper is the second part of an article aimed to present theoretical basis as well as some applications of two infrared reflection techniques: specular reflection and reflection-absorption. It is emphasyzcd how much spectral simulation can aid spectral analysis. The usefulness of reflection-absorption spectroscopy as a thin film caracterization technique is stressed. Optical effects such as LO-TO splittings and their observation as Berreman effect are also addressed.24199104Trasferetti, B.C., Davanzo, C.U., (2001) Quim. Nova, 24, p. 99Swalen, J.D., Allara, D.L., Andrade, J.D., Chandross, E.A., Garoff, S., Israelachvilli, J., McCarthy, T.J., Yu, H., (1987) Langmuir, 3, p. 932Parikh, A.N., Allara, D.L., (1992) J. Chem. Phys., 96, p. 927Golden, W.G., (1985) Fourier Transform Infrared Spectroscopy, 4, p. 315. , Ferraro, J. R., Ed.Academic PressSwalen, J.D., Rabolt, J.F., (1985) Fourier Transform Infrared Spectroscopy, 4, p. 283. , Ferraro, J. R., Ed.Academic PressGrosse, P., (1991) Mikrochim. Acta, 11, p. 309Yamamoto, K., Ishida, H., (1997) Vib. Spectrosc., 15, p. 27Yamamoto, K., Ishida, H., (1994) Vib. Spectrosc., 8, p. 1Wendlandt, W.W., Hecht, H.G., (1966) Reflectance Spectroscopy, , Interscience Publishers, New York, cap. 1Born, M., Wolf, E., (1980) Principles of Optics, Sixth (Corrected) Edition, , Cambridge University Press, CambridgeHuang, K., (1951) Proc. Roy. Soc. A, 208, p. 352Durman, R., Fauvre, P., Jayasooriya, U.A., Kettle, F.A., (1987) J. Cryst. and Spectrosc. Research, 17, p. 431Harbecke, B., Heinz, B., Grosse, P., (1985) Appl. Phys. A, 38, p. 263Berreman, D.W., (1963) Phys. Rev., 132, p. 2193Smith, D.Y., Shiles, E., Inokuti, M., (1985) Handbook of Optical Constants of Solids, p. 369. , Palik, E. D., Ed.Academic Press, Inc.OrlandoAllara, D.L., Swalen, J.D., (1982) J. Phys. Chem., 86, p. 2700Allara, D.L., Swalen, J.D., (1985) Langmuir, 1, p. 52Nuzzo, R.G., Dubois, L.H., Allara, D.L., (1990) J. Am. Chem. Soc., 112, p. 558Touwslager, F.J., Sondag, H.M., (1994) Langmuir, 10, p. 1028Tao, Y.-T., Lin, W.-L., Hietpas, G.D., Allara, D.L., (1997) J. Phys. Chem. B, 101, p. 9732Chollet, P.-A., Messier, J., Rosilio, C., (1976) J. Chem. Phys., 64, p. 1042Rabolt, J.F., Burns, F.C., Schlotter, N.E., Swalen, J.D., (1983) J. Chem. Phys., 78, p. 946Ishino, Y., Ishida, H., (1988) Langmuir, 4, p. 1341Chesters, M.A., Cook, M.J., Gallivan, S.L., Simmons, J.M., Slater, D.A., (1992) Thin Solid Films, 210, p. 538Poynter, R.H., Cook, M.J., Chesters, M.A., Slater, D.A., McMurdo, J., Welford, K., (1994) Thin Solid Films, 243, p. 346Suga, K., Rusling, J.F., (1993) Langmuir, 9, p. 3549Sakata, Y., Domen, K., Onishi, T., (1994) Langmuir, 10, p. 2847Lefez, B., Souchet, R., Kartouni, K., Lenglet, M., (1995) Thin Solid Films, 268, p. 45Guillamet, R., Lenglet, M., Adam, F., (1992) Sol. State. Comm., 81, p. 633Tayeb Anki, M.M., Lefez, B., (1996) Appl. Opt., 35, p. 1399Scherübl, Th., Thomas, L.K., (1997) Appl. Spectrosc., 51, p. 844Scherübl, Th., Thomas, L.K., (1994) Fresenius J. Anal. Chem., 349, p. 216Trasferetti, B.C., Davanzo, C.U., Da Cruz, N.C., De Moraes, M.A.B., (2000) Appl. Spectrosc., 54, p. 687Trasferetti, B.C., Davanzo, C.U., Zoppi, R.A., Dados ainda não publicadosGreenler, R.G., (1966) J. Chem. Phys., 44, p. 310Wong, J.S., Yen, Y.S., (1988) Appl. Spectrosc., 42, p. 598Urai, Y., Ohe, C., Itoh, K., (1998) Langmuir, 14, p. 4559Phillip, H.R., (1979) J. Appl. Phys., 50, p. 1053Porter, M.D., Bright, T.B., Allara, D.L., (1986) Anal. Chem., 58, p. 2461Grosse, P., Harbecke, B., Heinz, B., Meyer, R., (1986) Appl. Phys. A, 39, p. 257Udagawa, A., Matsui, T., Tanaka, S., (1986) Appl. Spectrosc., 40, p. 794Yamamoto, K., Masui, A., (1996) Appl. Spectrosc., 50, p. 759Yen, Y.-S., Wong, J.S., (1989) J. Chem. Phys., 93, p. 720
Effects Of Helium Ion Irradiation On Fluorinated Plasma Polymers
No full textThe effects of ion irradiation on fluorinated plasma polymer films are investigated using profilometry, surface contact-angle measurements, infrared reflection absorption spectroscopy (IRRAS) and X-ray photoelectron spectroscopy (XPS). Remarkably, helium plasma immersion ion implantation (PIII) of several amorphous hydrogenated fluorinated plasma polymers deposited from C2H2-SF6, C6H6-SF6 or C6F6 produces film compactions of up to 40%, and modifies the surface energy in the 35 to 65dyn cm-1 range. As revealed by IRRAS and XPS, the films contain C-H, C-C, C=C, C=O, O-H and C-F groups. XPS spectra confirm the presence of N (typically ~5%). The films produced from SF6-containing plasmas also contain S. For irradiation times of 80min, the film carbon content is increased, and the fluorine content is greatly reduced, by factors of about 3 to 15, depending on the initial film composition. © 2010 Elsevier B.V.20418-1930593063Inagaki, N., Tasaka, S., Imai, M., (1993) J. Appl. Polym. Sci., 48, p. 1963Inagaki, N., Tasaka, S., Suzuki, Y., (1994) J. Appl. Polym. Sci., 51, p. 2131Csernica, J., Rhodes, D.B., (1999) J. Polym. Eng., 19, p. 1Durrant, S.F., Mota, R.P., de Moraes, M.A.B., (1992) J. Appl. Phys., 71, p. 448Silverstein, M.S., Chen, R., Kesler, O., (1996) Polym. Eng. Sci., 36, p. 2542Durrant, S.F., Mota, R.P., de Moraes, M.A.B., (1992) Thin Solid Films, 220, p. 295D'Agostino, R., Cramarossa, F., Caloprico, V., d'Ettole, R., (1983) J. Appl. Phys., 54, p. 1284d'Agostino, R., Cramarossa, F., Iluzzi, F., (1987) J. Appl. Phys., 61, p. 2754Mogab, C.J., Adams, A.C., Flamm, D.L., (1978) J. Appl. Phys., 49, p. 3796Lopes, B.B., Davanzo, C.U., Schreiner, W., Durrant, S.F., (2008) Surf. Coat. Technol., 203, p. 526d'Agostino, R., Cramarossa, F., Fracassi, F., Desimoni, E., Sabbatini, L., Zamboni, R.G., Caporiccio, G., (1986) Thin Solid Films, 143, p. 163Rubio-Roy, M., Bertran, E., Pascual, E., Polo, M.C., Andujar, J.L., (2008) Diamond Relat. Mater., 17, p. 1728Schvarzman, M., Mathur, A., Hone, J., Jahnes, C., Wind, S.J., (2008) Appl. Phys. Lett., 93, p. 153105Guerrouani, N., Baldo, A., Maarouf, T., Belu, A.M., Kassis, C.M., Mas, A., (2007) J. Fluorine Chem., 18, p. 925Torrisi, L., Percolla, R., (1996) Nucl. Instrum. Methods B, 117, p. 387da Cruz, N.C., Lopes, B.B., Rangel, E.C., Bica de Moraes, M.A., Durrant, S.F., (2008) Surf. Coat. Technol., 203, p. 534da Cruz, N.C., Rangel, E.C., Tabacknics, M.H., Trasferetti, B.C., Davanzo, C.U., (2001) Nucl. Instrum. Methods Phys. Res., 175, p. 721Gelamo, R.V., Landers, R., Rouxinol, F.P.M., Trasferetti, B.C., Bica de Moraes, M.A., Davanzo, C.U., Durrant, S.F., (2007) Plasma Process. Polym., 4, p. 482Gelamo, R.V., Durrant, S.F., Trasferetti, B.C., Davanzo, C.U., Rouxinol, F.P.M., Bica de Moraes, M.A., (2007) Plasma Process. Polym., 4, p. 489Bellamy, L.J., (1975) The Infrared Spectra of Complex Molecules, 1. , Chapman and Hall, LondonBuijnsters, J.G., Gago, R., Jiménez, I., Camero, M., Agulló-Rueda, F., Gómez-Aleixandre, C., (2009) J. Appl. Phys., 105, p. 093510Ghimire, D.C., Adhikari, S., Aryal, H.R., Kalita, G., Umeno, M., (2009) Diamond Relat. Mater., 18, p. 465Yao, Z.Q., Yang, P., Huang, N., Sun, H., Wang, J., (2004) Surf. Coat. Technol., 186, p. 131Hakovirta, M., Lee, D.H., He, X.M., Nastasi, M., (2001) J. Vac. Sci. Technol. A, 19, p. 782Yasuda, H., Bumgarner, M.O., Marsh, H.C., Morosoff, N., (1976) J. Polym. Sci., Polym. Chem. Ed., 14, p. 195Nelea, V., Holvoet, S., Turgeon, S., Mantovani, D., (2009) J. Appl. Phys. D, 42, p. 22520
Infrared Spectroscopy Investigation Of Various Plasma-deposited Polymer Films Irradiated With 170 Kev He+ Ions
No full textThis work illustrates the advantages of using p-polarized radiation at an incidence angle of 70° in contrast to the conventional unpolarized beam at normal (or near-normal) incidence for the infrared spectroscopic study of polycarbosilane, polysilazane and polysiloxane thin films synthesized by plasma enhanced chemical vapor deposition (PECVD) and subsequently irradiated with 170 keV He+ ions at fluences from 1 × 1014 to 1 × 1016 cm-2. Several bands not seen using the conventional mode could be observed in the polarized mode. © 2006 Elsevier B.V. All rights reserved.2491-2 SPEC. ISS.162166Jones, B.J., Barklie, R.C., Khan, R.U.A., Carey, J.D., Silva, S.R.P., (2001) Diamond Relat. Mater., 10, p. 993Li, D.J., Cui, F.Z., Gu, H.Q., Zhao, J., (1998) Appl. Surf. Sci., 126, p. 1Rangel, E.C., da Cruz, N.C., Bica de Moraes, M.A., Kretly, L.C., (1998) Nucl. Instr. and Meth. B, 141, p. 211Pearce, H.A., Sheppard, N., (1976) Surf. Sci., 59, p. 205Berreman, D.W., (1963) Phys. Rev., 132, p. 2193Trasferetti, B.C., Davanzo, C.U., Bica de Moraes, M.A., (2003) J. Phys. Chem. B, 107, p. 10699Pliskin, W.A., (1977) J. Vac. Sci. Technol., 14, p. 1064Anderson, D.R., (1974) Analysis of Silicones, , Smith A.L. (Ed), John Wiley and Sons, New YorkSmith, L., Anderson, D.R., (1984) Appl. Spectrosc., 38, p. 822Lucovsky, G., (1998) J. Non-Cryst. Solids, 227, p. 1Bellamy, L.J., (1975) The Infra-Red Spectra of Complex Molecules, , Chapman and Hall, LondonRau, C., Kulisch, W., (1994) Thin Solid Films, 249, p. 28Sugahara, S., Kadoya, T., Usami, K., Hattori, T., Matsumura, M., (2001) J. Electrochem. Soc., 148, pp. F120Fleischer, H., McKean, D.C., (1999) J. Phys. Chem. A, 103, p. 727Trasferetti, B.C., Davanzo, C.U., Bica de Moraes, M.A., (2004) Macromolecules, 37, p. 459Yasuda, H., (1985) Plasma Polymerization, , Academic Press, New YorkVenkatesan, T., Wolf, T., Allara, D., Wilkens, B.J., Taylor, G.N., (1983) Appl. Phys. Lett., 43, p. 934Pivin, J.C., Colombo, P., (1997) J. Mater. Sci., 32, p. 6163Kirk, C.T., (1988) Phys. Rev. B, 38, p. 1255Srivastava, S., Avasthi, D.K., Pivin, J.C., (2002) Nucl. Instr. and Meth. B, 191, p. 718Rangel, E.C., da Cruz, N.C., Bica de Moraes, M.A., Lepienski, C.M., (2000) Surf. Coat. Technol., 127, p. 93Wolfe, D.M., Hinds, B.J., Wang, F., Lucovsky, G., Ward, B.L., Xu, M., Nemanich, R.J., (1999) J. Vac. Sci. Technol. A, 17, p. 2170van Orden, A., Saykally, R.J., (1998) Chem. Rev., 98, p. 2313Fuente, E., Menendez, J.A., Diez, M.A., Suarez, D., Montes-Moran, M.A., (2003) J. Phys. Chem. B, 107, p. 6350Mani, K.K., Ramani, R., (1974) Phys. Stat. Sol., 61, p. 659Nemanich, R.J., Lucovsky, G., Solin, S.A., (1977) Solid State Commun., 23, p. 11
Going Beyond Counting First Authors in Author Co-citation Analysis
Get PDFThe present study examines one of the fundamental aspects of author co-citation analysis (ACA) - the way co-citation
counts are defined. Co-citation counting provides the data on which all subsequent statistical analyses and mappings
are based, and we compare ACA results based on two different types of co-citation counting - the traditional type that
only counts the first one among a cited work's authors on the one hand and a non-traditional type that takes into
account the first 5 authors of a cited work on the other hand. Results indicate that the picture produced through this non-traditional author co-citation counting contains more coherent author groups and is therefore considerably clearer. However, this picture represents fewer specialties in the research field being studied than that produced through the traditional first-author co-citation counting when the same number of top-ranked authors is selected and analyzed. Reasons for these effects are discussed
Variations on the Author
Get PDF“Variations on the Author” discusses two of Eduardo Coutinho’s recent films (Um Dia na Vida, from 2010, and Últimas Conversas, posthumously released in 2015) and their contribution to the general question of documentary authorship. The director’s filmography is characterized by a consistent yet self-effacing form of authorial self-inscription: Coutinho often features as an interviewer that rather than express opinions propels discourses; an interviewer that is good at listening. This mode of self-inscription characterizes him as an author who is not expressive but who is nonetheless markedly present on the screen. In Um Dia na Vida, however, Coutinho is completely absent form the image, while Últimas Conversas, on the contrary, includes a confessional prologue that moves the director from the margins to the center of his films. This article examines the ways in which these works stand out in the filmography of a director who offers new insights into the notion of cinematic authorship
Appropriate Similarity Measures for Author Cocitation Analysis
Get PDFWe provide a number of new insights into the methodological discussion about author cocitation analysis. We first argue that the use of the Pearson correlation for measuring the similarity between authors’ cocitation profiles is not very satisfactory. We then discuss what kind of similarity measures may be used as an alternative to the Pearson correlation. We consider three similarity measures in particular. One is the well-known cosine. The other two similarity measures have not been used before in the bibliometric literature. Finally, we show by means of an example that our findings have a high practical relevance.information science;Pearson correlation;cosine;similarity measure;author cocitation analysis
Dispelling the Myths Behind First-author Citation Counts
Get PDFWe conducted a full-scale evaluative citation analysis study of scholars in the XML research field to explore just how different from each other author rankings resulting from different citation counting methods actually are, and to demonstrate the capability of emerging data and tools on the Web in supporting more realistic citation counting methods. Our results contest some common arguments for the continued
use of first-author citation counts in the evaluation of scholars, such as high correlations between author rankings by first-author citation counts and other citation
counting methods, and high costs of using more realistic citation counting methods that are not well-supported by the ISI databases. It is argued that increasingly available digital full text research papers make it possible for citation analysis studies to go beyond what the ISI databases have directly supported and to employ more
sophisticated methods
An Infrared Spectroscopy Study Of Metal-support Interaction On Pt/tio 2. The Influence Of Hydrogen Adsorption [estudo Por Espectroscopia No Infravermelho Da Interação Metal-suporte Em Pt/tio 2. A Influência Da Adsorção De Hidrogênio]
No full textThe influence of the presence of hydrogen on Pt/TiO 2 catalysts submitted to reduction treatment has been studied by FT-IR at room temperature. After submitting to LTR treatment, the hydrogen spillover has been detected and the presence of hydrogen at the bulk is shown to produce a strong absorption in the infrared spectral region. After HTR treatment, the hydrogen is strongly chemissorbed.225674676Tauster, S.J., Fung, S.C., Garten, R.L., (1978) J. Am. Chem. Soc., 100, p. 170Vannice, M.A., Wang, S., Moon, S.H., (1981) J. Catal., 71, p. 152Bonneviot, L., Haller, G.L., (1991) J. Catal., 130, p. 359Krishna, K.R., Bell, A.T., (1997) J. Catal., 130, p. 597Ebitani, K., Salama, T.M., Hattori, H., (1992) J. Catal., 134, p. 751Vaarkamp, M., Miller, J.T., Modica, F.S., Koningsberger, D.C., (1996) J. Catal., 163, p. 294Van De Loosdrecht, J., Van Der Kraan, A.M., Van Dillen, A.J., Geus, J.W., (1997) J. Catal., 170, p. 217Vannice, M.A., Twu, C.C., (1983) J. Catal., 82, p. 213Waghray, A., Wang, J., Oukaci, R., Blackmond, D.G., (1992) J. Phys.Chem., 96, p. 5954Englisch, M., Jentys, A., Lercher, J.A., (1997) J. Catal., 166, p. 25Blackmond, D.G., Ko, I., (1985) J. Catal., 94, p. 343Tauster, S.J., (1987) Acc. Chem. Res., 20, p. 389Baydal, J.P.S., Lambert, R.M., Harrison, K., Riley, C.C.A., Frost, J.C., (1991) J. Catal., 129, p. 486Benneviot, L., Haller, L., (1988) J. Catal., 113, p. 96Binet, C., Jadi, A., Lavalley, J.C., Kiziling, M.B., (1992) J. Chem. Soc. Faraday Trans., 88, p. 2079Haller, G.L., Resasco, D.E., (1989) Advances in Catalysis, p. 173. , D. D. Eley, H. Pires and P. B. Weisz, Eds., Metal-Support Interaction: Group VIII Metals and Reducible Oxides, Academic Press, San DiegoChen, K., Fan, Y., Yan, Q., (1997) J. Catal., 167, p. 573Yoshitake, H., Iwasawa, Y., (1992) J. Phys. Chem., 96, p. 1329Belton, D.N., White, J.M., (1984) J. Phys. Chem., 88, p. 1690Spencer, M.S., (1985) J. Catal., 93, p. 216Santos, J., Phillips, J., Dumesic, J.A., (1983) J. Catal., 81, p. 147Resasco, D.E., Haller, G.L., (1983) J. Catal., 82, p. 279Clewley, J.D., Lynch, J.F., Flanagan, T.B., (1975) J. Catal., 36, p. 291Vannice, M.A., Odier, P., Bujor, M., Fripiat, F.F., Catalyst Characterization Science: Surface and Solid State Chemistry (1985) ACS Symposium Series 288, p. 98. , (Deviney and Gland, Eds) Titanium Dioxide Single-Crystal and Power Surface in the Presence and Absence of Platinum. Washington, D.CElipe, A.R.G., Fernandez, A., Espinos, J.P., Munuera, G., (1991) J. Catal., 132, p. 51Boccuzi, F., Morterra, C., Scala, R., Zecchina, A., (1981) J. Chem. Soc. Faraday Trans. II, 77, p. 2059Ioannides, T., Verykios, X.E., (1996) J. Catal., 167, p. 560Tauster, S.J., Fung, S.C., Baker, T.K., Horsley, J.A., (1981) Science, 211, p. 112
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