Hochschule Bonn-Rhein-Sieg

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    7939 research outputs found

    HyenaPixel: Global Image Context with Convolutions

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    In vision tasks, a larger effective receptive field (ERF) is associated with better performance. While attention natively supports global context, convolution requires multiple stacked layers and a hierarchical structure for large context. In this work, we extend Hyena, a convolution-based attention replacement, from causal sequences to the non-causal two-dimensional image space. We scale the Hyena convolution kernels beyond the feature map size up to 191×\times191 to maximize the ERF while maintaining sub-quadratic complexity in the number of pixels. We integrate our two-dimensional Hyena, HyenaPixel, and bidirectional Hyena into the MetaFormer framework. For image categorization, HyenaPixel and bidirectional Hyena achieve a competitive ImageNet-1k top-1 accuracy of 83.0% and 83.5%, respectively, while outperforming other large-kernel networks. Combining HyenaPixel with attention further increases accuracy to 83.6%. We attribute the success of attention to the lack of spatial bias in later stages and support this finding with bidirectional Hyena

    Online-Lebensmittelhandel in Deutschland: Status quo – Zukunftsperspektiven – Expertenmeinungen

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    Dieses Buch beleuchtet den Online-Lebensmittelhandel in Deutschland aus Anbieter- und Kundenperspektive, leitet Zukunftsprognosen ab und zeigt Konsequenzen für Handel und Hersteller. Trotz des Aufwinds während der Corona-Pandemie bewegen sich die Umsätze im Online-Handel mit Lebensmitteln noch auf relativ niedrigem Niveau; die Entwicklung verläuft jedoch turbulent und wird kontrovers diskutiert. Dieses Buch beschreibt den Status quo und regt zu Diskussionen an. Es bietet eine systematische Analyse einschlägiger Studien sowie aktuelle Erkenntnisse auf Basis qualitativer Interviews mit Experten aus Handel, Industrie und Wissenschaft. (Verlagsangaben

    Die DIN-Norm, die alle kennen sollten

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    Dieses Video aus der Videoreihe „Normen-ABC“ erklärt die DIN-Norm, die alle kennen sollten: DIN 5008 „Schreib- und Gestaltungsregeln für die Text- und Informationsbearbeitung“ Beuth-Verlag, Berlin: 2020. Es werden nützliche Hinweise, wie z. B. für Abschlussarbeiten, Bewerbungsschreiben oder Geschäftsbriefe gegeben

    Datasets for "Irradiance and cloud optical properties from solar photovoltaic systems" (final version)

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    This dataset contains all the relevant data for the algorithms described in the paper "Irradiance and cloud optical properties from solar photovoltaic systems", which were developed within the framework of the MetPVNet project

    Fourier scatterometry for compensation of tilt and curvature deviations of two photon polymerization 3d printers

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    A Fourier scatterometry setup is evaluated to recover the key parameters of optical phase gratings. Based on these parameters, systematic errors in the printing process of two photon polymerization (TPP) gray-scale lithography 3d printers can be compensated, namely tilt and curvature deviations. The proposed setup is significantly cheaper than a confocal microscope, which is usually used to determine calibrations parameters for compensation of the TPP printing process. The grating parameters recovered this way are compared to those obtained with a confocal microscope. A clear correlation between confocal and scatterometric measurements is first shown for structures containing either tilt or curvature. The correlation is also shown for structures containing a mixture of tilt and curvature errors (squared Pearson coefficient r2r^2 = 0.92). This new compensation method is demonstrated on a TPP printer: A diffractive optical element (DOE) printed with correction parameters obtained from Fourier scatterometry shows a significant reduction in noise as compared to the uncompensated system. This verifies the successful reduction of tilt and curvature errors. Further improvements of the method are proposed, which may enable the measurements to become more precise than confocal measurements in the future, since scatterometry is not affected by the diffraction limit

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