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Silicon Optical Trap Detector Standard
No full textThe trap detector has five internal reflections for the incident optical radiation (beam) on three light-trapping silicon photodiodes. Since most of the incident light is absorbed by the underfilled photodiodes, the reflectance loss is negligibly small. The trap detector with its spatially uniform response can measure radiant power (a beam spot of smaller than 5 mm) with low uncertainty. Its power responsivity (the total power in the incident beam) is directly calibrated against the NIST primary standard cryogenic radiometer. It holds the NIST spectral power and irradiance responsivity scales with relative standard uncertainties of less than 0.05% between 400 nm and 960 nm. The area of its input aperture was measured with a relative standard uncertainty of 0.004 % using video microscope and edge detection. The product of the aperture-area and the power-responsivity produces the irradiance responsivity which is the reference scale for NIST (and many field level) detector-based calibrations including radiance temperature, photometric (illuminance responsivity), colorimetric (color temperature of light sources), synchrotron radiation (using filtered detectors), and solar irradiance calibrations, measurements, and scale validations. In irradiance measurement mode the input aperture is overfilled by the incident radiation. The Si trap detector is the highest accuracy transfer standard of NIST. It can substitute traditional source-based standards (such as blackbody radiators) in many applications.[H] 16.0037 cm __[W] __[D] __[Diam] 10.9537 c
Richard K. Cook
No full textRichard K. Cook
Inducted: 2006
Citation: For research in physical acoustics, reverberant acoustic fields, and infrasonics, and for derivation and demonstration of the absolute calibration of microphones.
Tenure: 1935-1966 and 1971-1976
Birth: 1910, Chicago, Illinois
Death: 2006
Education:
University of Illinois, BS (Physics), 1931
University of Illinois, MS (Physics), 1932
University of Illinois, PhD (Physics), 1935
Positions held:
Physicist, 1935-1942
Chief of the Sound Section, 1942-1966
Special Assistant to the Director, 1971-1976
Honors:
U.S. Department of Commerce Gold Medal (1964)
Washington Academy of Sciences and Engineering Award: Distinguished scientific achievement by a researcher under 40 (1949)
Acoustical Society of America Gold Medal (1988)
Memberships:
Fellow, Acoustical Society of America, President (1957-58)
Fellow, Washington Academy of Sciences, President (1972-73)
Fellow, American Physical Society
Fellow, American Association for the Advancement of Science
Fellow, American Geophysical Union
Publications:
More than 60 publications in the Journal of the Acoustical Society of America including:
Cook, R. K., �Absolute Pressure Calibration of Microphones,� The Journal of the Acoustical Society of America, 12, 415 (1941); republished in abridged form from Journal of Research National Bureau of Standards 25, 489 (1940).
Cook, R. K. and Edelman, S., �Correlation Coefficients as Criteria for Randomness of Reverberant Sound Fields,� The Journal of the Acoustical Society of America, 22, 678 (1950).
Cook, R. K., Greenspan, M., and Thompson, M. C. Jr., �Free-Molecule Propagation of Sound Through Gases,� The Journal of the Acoustical Society of America, 25, 192 (1953).
Cook, R. K. and Young, J. M., �Radiation from Subsonic Surface Waves,� The Journal of the Acoustical Society of America, 35, 1894 (1963).
Cook, R. K., �Infrasound from the Epicenter of the 1964 Alaskan Earthquake,� The Journal of the Acoustical Society of America, 39, 1261 (1966).
Cook, R. K. and Proctor, T. M., �A Standing-wave Tube as an Absolutely Known Source of Sound Power,� The Journal of the Acoustical Society of America, 65, 1542 (1979)
Requirements for the Development of Bacillus Anthracis Spore Reference Materials Used to Test Detection Systems
No full textBacillus anthracis spores have been used as biological weapons and the possibility of their further use requires surveillance systems that can accurately and reliably detect their presence in the environment. These systems must collect samples from a variety of matrices, process the samples, and detect the spores. The processing of the sample may include removal of inhibitors, concentration of the target, and extraction of the target in a form suitable for detection. Suitable reference materials will allow the testing of each of these steps to determine the sensitivity and specificity of the detection systems. The development of uniform and well-characterized reference materials will allow the comparison of different devices and technologies as well as assure the continued performance of detection systems. This paper discusses the special requirements of reference materials for Bacillus anthracis spores that could be used for testing detection systems. The detection of Bacillus anthracis spores is based on recognition of specific characteristics (markers) on either the spore surface or in the nucleic acids (DNA). We have reviewed the specific markers and their relevance to characterization of reference materials. We have also included the approach for the characterization of candidate reference materials that we are developing at the NIST laboratories. Additional applications of spore reference materials would include testing sporicidal treatments, techniques for sampling the environment, and remediation of spore-contaminated environments
Form-Profiling of Optics Using the Geometry Measuring Machine and the M-48 CMM at NIST
No full textWe are developing an instrument, the Geometry Measuring Machine (GEMM), to measure the profile errors of aspheric and free form optical surfaces, with measurement uncertainties near 1 nm. Using GEMM, an optical profile is reconstructed from local curvatures of a surface, which are measured at points on the optic's surface. We will describe a prototype version of GEMM, its repeatability with time, a measurements registry practice, and the calibration practice needed to make nanometer resolution comparisons with other instruments. Over three months, the repeatability of GEMM is 3 nm rms, and is based on the constancy of the measured profile of an elliptical mirror with a radius of curvature of about 83 m. As a demonstration of GEMM's capabilities for curvature measurement, profiles of that same mirror were measured with GEMM and the NIST Moore M-48 coordinate measuring machine. Although the methods are far different, two reconstructed profiles differ by 22 nm peak-to-valley, or 6 nm rms. This comparability clearly demonstrates that with appropriate calibration, our prototype of the GEMM can measure complex-shaped optics
J. Michael Rowe
No full textJ. Michael Rowe
Inducted: 2006
Citation:
For outstanding research accomplishments and for visionary leadership transforming the NIST Center for Neutron Research into the foremost neutron research facility in the United States.
Tenure: 1973-2004
Birth: 1939, Ontario, Canada
Education:
Queen’s University, Kingston, Ontario, Canada, BS (Engineering Physics), 1962
McMaster University, Hamilton, Ontario, Canada, PhD (Physics), 1966
McMaster University, Hamilton, Ontario, Canada, DSc (Physics), 2005
Positions held:
Research Physicist, 1973-1985
Manager, Cold Neutron Research Project, 1985-1989
Chief, Reactor Radiation Division, 1989-1996
Director, NIST Center for Neutron Research, 1996-2004
Honors:
US Department of Commerce Silver Medal (1978), Gold Medal (1983)
Distinguished Federal Executive (1992)
National Institute of Standards and Technology Samuel Wesley Stratton Award (1994)
Presidential Rank Award for Meritorious Federal Executive (2003)
Clifford G. Shull Prize of the Neutron Scattering Society of America, (2004) (First recipient)
Memberships:
Fellow, American Association for the Advancement of Science
Fellow, American Physical Society, Condensed Matter Physics
Sigma Xi
Advisory Committee to Bragg Institute, ANSTO, Australia, 2003-2007
Solid State Sciences Committee, National Research Council, 1998-2000
Visiting Committee for Nuclear Engineering, MIT, 1996-2008
Publications:
More than 100 publications including:
Rowe, J. M., Rush, J. J., Hinks, D. G., and Susman, S., “Neutron Scattering Study of the Dynamics of (KCN)0.5(KBR)0.5,” Phys. Rev. Lett. 43 1158 (1979).
J. M. Rowe, J. J. Rush, J. E. Schirber and J. M. Mintz, “Isotope effects in the PdH system - Lattice dynamics of PdT0.7,"" Phys. Rev. Lett. 57, No. 23, 2955 (1986).
Rowe, J. M., Rush, J. J., Chesser, N. J., Michel, K. H., and Naudts, J., “Nature of Phase Transition in KCN at 168 K,” Phys. Rev. Lett. 40, 455 (1978).
Rowe, J. M., Rush, J. J., Vagelatos, N., Price, D. L., Hinks, D. G., and Susman, S., “Crystal Dynamics of KCN and NaCN in Disordered Cubic Phase,” J. Chem. Phys. 62, 4551 (1975).
K. Skold, J. M. Rowe, G. Ostrowski, P. D. Randolph, Coherent and Incoherent-Scattering Laws of Liquid Argon"", Phys. Rev. A6, 1107 (1972)
Carol A. Handwerker
No full textCarol A. Handwerker
Inducted: 2006
Citation: For technical leadership in the Metallurgy Division and in the world-wide microelectronics community for transitioning to lead-free solders.
Tenure: 1984-2005
Birth: 1951, Memphis, Tennessee
Education:
Wellesley College, BA, (Art History), 1973
Massachusetts Institute of Technology, SB & SM, (Materials Science and Engineering), 1978
Massachusetts Institute of Technology, ScD, (Materials Science and Engineering), 1983
Positions held:
NRC Postdoctoral Research Associate, 1984-1986
Metallurgist, Metallurgy Division, 1986-1994
Group Leader, Materials Structure and Characterization Group, Metallurgy Division, 1994-1996
Metallurgy Division Chief, 1996-2005
Honors:
National Institute of Standards and Technology Bronze Medal (1989)
U.S. Department of Commerce Silver Medal (1994), Gold Medal (2003)
American Ceramic Society Richard Fulrath Award (1996)
Best Technical Paper, IPC WORKS '99
Federal Laboratory Consortium Award for Excellence in Technology Transfer, 1999
Member, NRC National Materials Advisory Board
Board of Trustees of the Gordon Research Conferences
Visiting Committee for the MIT Department of Materials Science and Engineering
Memberships:
Fellow, ASM International
Fellow, the American Ceramic Society
Publications:
A book, 8 book chapters, and more than 85 publications including:
Kaysser, W. A., Sprissler, M., Handwerker, C. A., and Blendell, J. E., ‘Influence of a Liquid Phase on the Morphology of Grain Growth in Alumina,’ Journal of American Ceramic Society 70, 339 (1987).
Handwerker, C. A., Morris, P. A., and Coble, R., ‘Effects of Chemical Inhomogeneities on Grain Growth and Microstructure in Al2O3,’ Journal of American Ceramic Society 72, 130 (1989).
Taylor, J. E., Cahn, J. W., and Handwerker, C. A., ‘Geometric Models of Crystal Growth,’ Acta Metallurgica et Materialia 40, 1443 (1992).
Moon, K., Boettinger, W., Kattner, U., Biancaniello, F., and Handwerker, C. A., J., ‘Experimental and Thermodynamic Assessment of Sn-Ag-Cu Solder Alloys,’ Journal of Electronic Materials 29, 1122 (2000)
Portrait of William Boettinger
No full textWilliam J. Boettinger is a NIST Fellow (Emeritus) in the Materials Science and Engineering Division of the Material Measurement Laboratory. Before joining the permanent staff at NBS/NIST, he was a National Research Council/National Academy of Engineering postdoctoral research associate at NBS from 1972-1974. From 1977 until 1995 he held a concurrent position as a professorial lecturer at the George Washington University where he taught a graduate course in phase transformations.
His expertise includes the thermodynamics and kinetics of metallurgical systems especially the relationship of alloy microstructure to processing conditions. Alloy microstructure is the spatial distribution of grains, phase and their concentration gradients. He has over 170 publications on topics including dendritic, eutectic and peritectic solidification, rapid solidification, phase diagrams, diffusion, intermetallic compounds, measurement of crystal perfection using x-rays, soldering and Sn whisker growth.
Dr. Boettinger was awarded the Department of Commerce Bronze Medal in 1980, Silver Medals in 1983 and 1994, and Gold Medals in 1999 and 2003. He received the Materials Science Division Award of the American Society for Materials (ASM) in 1989 and was made a fellow of that society in 1994. He co-chaired the 1994 Physical Metallurgy Gordon Research Conference with J. H. Perepezko. He has received several honors from The Minerals, Metals and Materials Society (TMS): the 1999 Champion Mathewson Best Paper Award, the 2001 TMS Bruce Chalmers Award for research in solidification and a Fellow in 2006. He was named a NIST Fellow in 2001, elected a member of the National Academy of Engineering in 2006 and received the federal government's Presidential Rank Award in 2007.
EMPLOYMENT
1974 - 2012: Metallurgy Division, NIST
1972 - 1974: NRC/NAE Postdoctoral Research Associate, NIST
1977 - 1995: Professorial lecturer at the George Washington University
EDUCATION
B.E.S. - 1968 - The Johns Hopkins University - Mechanics
Ph.D. - 1972 - The Johns Hopkins University – Metallurg
Oral history interview of Emanuel Horowitz , May 25, 2006 / with David Lide, Jerome Kruger, Curt Reimann, and Harry Hertz.
No full textOral history interview of Emanuel Horowitz, May 25, 2006. Emanuel Horowitz first came to NBS on December 26, 1951
Portrait of James E. Hill
No full textDr. James E. Hill, Mechanical Engineer, was at NIST from 1972-2007. He was Director of Building and Fire Research Laboratory. He served as the acting Deputy Director of NIST from the summer of 2006 until his retirement in April 2007