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(Audio Part 3 of 4) Oral history interview of Curt Reimann , April 9, 2007 / with David Lide, Harry Hertz, and Hans Oser
No full textCurt Reimann recalls his career at NBS/NIST from October 1, 1962 until his retirement in 1995. The Malcolm Baldrige Award was initiated under the Directorship of Ernest Ambler, National Bureau of Standards Director, through the efforts of Curt Reimann
Low cost digital vibration meter
No full textThis report describes the development of a low cost, digital Micro Electro Mechanical System ( MEMS) vibration meter that reports an approximation to the RMS acceleration of the vibration to which the vibration meter is subjected. The major mechanical element of this vibration meter is a cantilever beam, which is on the order of 500 micro-m in length, with a piezoresistor deposited at its base. Vibration of the device in the plane perpendicular to the cantilever beam causes it to bend, which produces a measurable change in the resistance of a piezoresistor. These changes in resistance along with a unique signal-processing scheme are used to determine an approximation to the RMS acceleration sensed by the device
List of Names Mentioned in Oral history interview of Curt Reimann , April 9, 2007
No full textCurt Reimann recalls his career at NBS/NIST from October 1, 1962 until his retirement in 1995. The Malcolm Baldrige Award was initiated under the Directorship of Ernest Ambler, National Bureau of Standards Director, through the efforts of Curt Reimann
(Audio Part 2 of 4) Oral history interview of Curt Reimann , April 9, 2007 / with David Lide, Harry Hertz, and Hans Oser
No full textCurt Reimann recalls his career at NBS/NIST from October 1, 1962 until his retirement in 1995. The Malcolm Baldrige Award was initiated under the Directorship of Ernest Ambler, National Bureau of Standards Director, through the efforts of Curt Reimann
20 degrees C - A short history of the standard reference temperature for industrial dimensional measurements
No full textOne of the basic principles of dimensional metrology is that a part dimension changes with temperature because of thermal expansion. Since 1931 industrial lengths have been defined as the size at 20 degrees C. This paper discusses the variety of standard temperatures that were in use before that date, the efforts of C. E. Johansson to meet these variations, and the effort by the National Bureau of Standards to bring the United States to the eventual world standard
Electro-physical technique for post-fabrication measurements of CMOS process layer thicknesses
No full textThis paper(1) presents a combined physical and electrical post- fabrication method for determining the thicknesses of the various layers in a commercial 1.5 micro-m complementary-metal-oxide- semiconductor (CMOS) foundry process available through MOSIS. Forty- two thickness values are obtained from physical step- height measurements performed on thickness test structures and from electrical measurements of capacitances, sheet resistances, and resistivities. Appropriate expressions, numeric values, and uncertainties for each layer of thickness are presented, along with a systematic nomenclature for interconnect and dielectric thicknesses. However, apparent inconsistencies between several of the physical and electrical results for film thickness suggest that further uncertainty analysis is required and the effects of several assumptions need to be quantified
(Audio Part 4 of 4) Oral history interview of Curt Reimann , April 9, 2007 / with David Lide, Harry Hertz, and Hans Oser
No full textCurt Reimann recalls his career at NBS/NIST from October 1, 1962 until his retirement in 1995. The Malcolm Baldrige Award was initiated under the Directorship of Ernest Ambler, National Bureau of Standards Director, through the efforts of Curt Reimann
(Audio Part 2 of 2) Oral history interview of James E. Hill , July 27, 2007 / with David Lide, Noel Raufaste, Gregory Tassey, and Richard Wright.
No full textJames Hill recalls his career at NIST from 1972-2007. He served as the acting Deputy Director of NIST from the summer of 2006 until his retirement in April 2007
Cosmic coincidences: Investigations for neutron background suppression
No full textTwo experimental investigations were made in order to reduce background counts in neutron detectors. Each investigation relied upon the fact that neutron background is largely due to cosmic ray interactions with the air and ground. The first attempt was to look at neutron arrival times. Neutron events close in time were taken to have been of a common origin due to cosmic rays. The second investigation was similar, but based on coincident neutron/muon events. The investigations showed only a small effect, not practical for the suppression of neutron background