1,886 research outputs found
A model for the DC characteristics of a laser diode
No full textLooking for a self-consistent formula for the DC P(I) characteristics of a laser diode (LD), able also to predict the threshold current, a model has been developed for the general electric and optical DC characteristics of a forward-biased LD
Failure Analysis of Failure Analyses: The rules of the Rue Morgue, ten years later
No full textWhen device customers delegate the failure analysis (FA) of field returns to a third party or, sometimes, to the manufacturer of the device, the resultant final FA reports are frequently unsatisfactory. In this paper, we investigate the reasons for this unsatisfactory outcome using three real case studies as examples. A paper of a decade ago, which proposed equivalent rules for a crime investigation and a tricky FA, is recalled. In that paper, some cardinal logical violations to those rules were identified as the most recurrent flaws in FA reports
Application of Photometric Stereo in the optical field and Scanning Electron Microscopy. Physical sculptures from Archaeology to Microelectronics
No full textReliability issues in Optical Emitters
No full textFour examples from real life illustrate some general reliability issues that become more severe when special technologies, as Optical Emitters, and special application, as Aerospace, meet. The examples include reliability predictions, acceleration rules, logics of failure analysis and photonics-specific failure mechanisms
The interpretation of the DC characteristics of LED and laser diodes to address their failure analysis
No full textThe interpretation of the forward DC characteristics of LEDS and laser diodes is shown as a valuable tool to infer the internal structure of real devices and to address their analysis after failures. To this purpose, the self-consistent I(V) DC transfer function for the ideal laser diode is introduced. © 2010 Elsevier Ltd. All rights reserved
Reliability prediction and real world for LED lamps
No full textThe paper focuses on Reliability of Reliability Predictions by comparison with available Reliability Data Sheet and Accelerated Stress Test results on commercially available devices. The striking difference in the predicted MTTFs (Mean Time To Failure) is discussed
Logics of Failure Analysis: 20 Years of rules of the Rue Morgue
No full textThe logical rules of Failure Analysis, and their frequent violations are discussed. The joke of comparing Failure Analysis with a crime story, that prompted the seminal paper on 1995 and its follower in 2006, is here more directly explained in terms of good and bad practice
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