1,721,246 research outputs found
SEL-UP: A CAD tool for the sensitivity analysis of radiation-induced Single Event Latch-Up
No full textSpace missions require extremely high reliable components that must guarantee correct functionality without incurring in catastrophic effects. When electronic devices are adopted in space applications, radiation hardened technology should be mandatorily adopted. In this paper we propose a novel method for analyzing the sensitivity with respect to Single Event Latch-up (SEL) in radiation hardened technology. Experimental results obtained comparing heavy-ion beam campaign demonstrated the feasibility of the proposed solutio
Electronics system design techniques for safety critical applications
No full textAddresses the development of techniques for the evaluation and the hardening of designs implemented on SRAM-based Field Programmable Gate Arrays. This title presents a design methodology solving industrial designer''s needs for implementing electronic systems using SRAM-based FPGAs in critical environments, like the space or avionic ones
Timing driven placement for fault tolerant circuits implemented on SRAM-based FPGAs
No full textElectronic systems for safety critical applications such as space and avionics need the maximum level of dependability for guarantee the success of their missions. Contrariwise the computation capabilities required in these fields are constantly increasing for afford the implementation of different kind of applications ranging from the signal processing to the networking. SRAM-based FPGA is the candidate device for achieve this goal thanks to their high versatility of implementing complex circuits with a very short development time. However, in critical environments, the presence of Single Event Upsets (SEUs) affecting the FPGA's functionalities, requires the adoption of specific fault tolerant techniques, like Triple Modular Redundancy (TMR), able to increase the protection capability against radiation effects, but on the other side, introducing a dramatic penalty in terms of performances. In this paper, it is proposed a new timing-driven placement algorithm for implementing soft-errors resilient circuits on SRAM-based FPGAs with a negligible degradation of performance. The algorithm is based on a placement heuristic able to remove the crossing error domains while decreasing the routing congestions and delay inserted by the TMR routing and voting scheme. Experimental analysis performed by timing analysis and SEU static analysis point out a performance improvement of 29% on the average with respect to standard TMR approach and an increased robustness against SEU affecting the FPGA's configuration memor
A new Timing Driven Placement Algorithm for Dependable Circuits on SRAM-based FPGAs
No full textElectronic systems for safety critical applications such as space and avionics need the maximum level of dependability for guarantee the success of their missions. Simultaneously the computation capabilities required in these fields are constantly increasing for afford the implementation of different kind of applications ranging from signal processing to networking. SRAM-based FPGAs are the candidate devices to achieve this goal thanks to their high versatility of implementing complex circuits with a very short development time. However, in critical environments, the presence of Single Event Upsets (SEUs) affecting the FPGA’s functionalities, requires the adoption of specific fault tolerant techniques, like Triple Modular Redundancy (TMR), able to increase the protection capability against radiation effects, but on the other side, introducing a dramatic penalty in terms of performances. In this paper, it is proposed a new timing-driven placement algorithm for implementing soft-errors resilient circuits on SRAM-based FPGAs with a negligible degradation of performance. The algorithm is based on a placement heuristic able to remove the crossing error domains while decreasing the routing congestions and delay inserted by the TMR routing and voting scheme. Experimental analysis performed by timing analysis and SEU static analysis point out a performance improvement of 29% on the average with respect to standard TMR approach and an increased robustness against SEU affecting the FPGA’s configuration memory. Accurate analyses of SEUs sensitivity and performance optimization have been performed on a real microprocessor core demonstrating an improvement of performances of more than 62%.</jats:p
An Experimental Analysis of a New Mixed Grain-Based Dynamically Reconfigurable Architecture
No full textA new reliability-oriented place and route algorithm for SRAM-based FPGAs
No full textThe very high integration levels reached by VLSI technologies for SRAM-based Field Programmable Gate Arrays (FPGAs) lead to high occurrence-rate of transient faults induced by Single Event Upsets (SEUs) in FPGAs' configuration memory. Since the configuration memory defines which circuit an SRAM-based FPGA implements, any modification induced by SEUs may dramatically change the implemented circuit. When such devices are used in safety-critical applications, fault-tolerant techniques are needed to mitigate the effects of SEUs in FPGAs' configuration memory. In this paper, we analyze the effects induced by the SEUs in the configuration memory of SRAM-based FPGAs. The reported analysis outlines that SEUs in the FPGA's configuration memory are particularly critical since they are able to escape well-known fault masking techniques such as Triple Modular Redundancy (TMR). We then present a reliability-oriented place and route algorithm that, coupled with TMR, is able to effectively mitigate the effects of the considered faults. The effectiveness of the new reliability-oriented place and route algorithm is demonstrated by extensive fault injection experiments showing that the capability of tolerating SEU effects in the FPGA's configuration memory increases up to 85 times with respect to a standard TMR design techniqu
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