1,721,012 research outputs found
A unified calibration algorithm for scattering and load pull measurement
No full textA simple algorithm which unifies the calibration procedures for scattering and load pull measurements is proposed. The new technique is particularly useful when measuring non-insertable devices and for on-wafer characterizations. The algorithm was compared with other well established calibration techniques with very good results in terms of accuracy
Caratterizzazione sperimentale di dispositivi attivi alle microonde in regime non lineare
No full textAn improved calibration technique for on-wafer large signal device chracterization suitable up to millimeter waves
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A computer aided procedure for experimental characterization and small signal modeling of MESFETs
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TRL calibration kit for characterizing waveguide-embedded microstrip circuits at millimeter-wave frequencies
No full textThe calibration and measurement problem at millimeter-wave frequencies of planar devices and MMICs inserted in waveguides is investigated in this paper. A planar structure that operate inside of a waveguide presents characterization problems, in terms of scattering parameters, due to the field geometry dependence. A new TRL calibration kit including a high performance waveguide to microstrip transition included and calibration elements for a complete TRL calibration are proposed. A unique fixture that reproduces the original field geometry for an optimum device characterization is presented. Advantageous features of the proposed calibration kit and fixture suggest its practical usefulness and high accuracy in the design and the optimization of monolithic microwave integrated circuits (MMIC's) and hybrid microwave integrated circuits (HMIC's). Appropriate calibration and measurement strategies with mounting details are also shown
Progetto di strutture di taratura e fixture in guida d'onda utilizzate per misurare dispositivi planari alle onde millimetriche
No full textThree-port device S-parameter characterization by means of an original three-port test set
Full text linkA three-port network analyzer, implemented using commercial available hardware is presented, Test set calibration is accomplished through a particular calibration procedure which requires only conventional standards, used for two-port applications, and minimizes the number of their connections. Experimental verification was carried out through measurement of a directional coupler and several devices with one and two ports
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