1,721,027 research outputs found
A New Test Structure for Recombination Measurements in Thin Silicon Layers for VLSI Structures
Detection of Recombination Centers in Epitaxial Layers by Temperature Scanning and Depth Lifetime Profiling
Experimental Analysis of the Temperature Dependence of the S.H.R. Lifetime and of the Apparent Bandgap Narrowing in n-type Silicon
Electrical Characterization of Minority Carrier Recombination at the Polysilicon/Silicon Interface
Prevalence, prevention and treatment of infective endocarditis in hypertrophic cardiomyopathy
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