55 research outputs found

    RAPS: an innovative active pixel for particle detection integrated in CMOS technology

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    In this paper we discuss some design, implementation and test issues, with respect to the development of the RAPS01 chip in the framework of the Radiation Active Pixel Sensors (RAPS) INFN project. The project aimed at verifying feasibility of smart, high-resolution pixel arrays with a fully standard, submicron CMOS technology for particle detection purposes. Layout optimization of the pixel, including sensitive element and local read and amplification circuits has been carried out. Different basic pixel schemes and read-out options have been proposed and devised. Chip fabrication has been completed and test phase is now under way:to this purpose a suitable test environment has been devised and test strategies have been planned

    RAPS: an Innovative Active Pixel for Particle Detection Integrated in CMOS Technology

    No full text
    Abstract: In this paper we discuss some design, implementation and test issues, with respect to the development of the RAPS01 chip in the framework of the Radiation Active Pixel Sensors (RAPS) INFN project. The project aimed at verifying feasibility of smart, high-resolution pixel arrays with a fully standard, submicron CMOS technology for particle detection purposes. Layout optimization of the pixel, including sensitive element and local read and amplification circuits has been carried out. Different basic pixel schemes and read-out options have been proposed and devised. Chip fabrication has been completed and test phase is now under way: to this purpose a suitable test environment has been devised and test strategies have been planned. (C) 2003 Elsevier B.V. All rights reserved

    Test of a MAPS realized in standard non-epitaxial CMOS 0.18um technology

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    An active pixel sensor has been developed using standard CMOS technology, UMC 0:18 mm with no epitaxial layer, with pixel size 4:4 4:4 mm, in the framework of the INFN RAPS project. In this work we will report on the results obtained using several types of ionizing radiation sources (laser, X-ray tubes, b and g) to test extensively the device. Some of the main results obtained are: a signal/noise value for minimum ionizing particles of about 20, a very good linearity of the response, a good spatial confinement of the signal (cluster size of the order of few pixels)

    High-resolution CMOS Particle Detectors: Design and Test Issues

    No full text
    In this paper, we discuss some issues related to the design, implementation and test of a CMOS active pixel sensor chip (RAPS01), developed in the framework of RAPS (Radiation Active Pixel Sensors) INFN project. Two different basic pixel schemes have been proposed The first one is based on a standard Active Pixel Sensor (APS) architecture, while a second architecture, named Weak Inversion Pixel Sensor (WIPS) exploits a different circuitry which allows for "sparse" access mode and thus for speeding-up the read-out phase. Device simulation has been extensively used to estimate the photodiode response for different technologies (thus addressing selection of the silicon foundry). Chip fabrication has been completed and a preliminary test phase has been performed. A suitable test environment has been devised and test strategies have been planned Future work is also outlined, aimed at the fabrication of a second version of the chip, more effectively integrating smart circuitry

    Test of a MAPS realized in standard non-epitaxial CMOS technology

    No full text
    An active pixel sensor has been developed using standard CMOS technology, UMC 0 :18 mm with no epitaxial layer, with pixel size 4:4 4 :4 m m, in the framework of the INFN RAPS project. In this work we will report on the results obtained using several types of ionizing radiation sources (laser, X-ray tubes, b and g) to test extensively the device. Some of the main results obtained are: a signal/noise value for minimum ionizing particles of about 20, a very good linearity of the response, a good spatial confinement of the signal (cluster size of the order of few pixels)

    Design, Fabrication and Test of CMOS Active-Pixel Radiation Sensors

    No full text
    In this paper, we discuss some issues related to the design, implementation, and test of a CMOS active pixel sensor chip (RAPS01), developed in the framework of the radiation active pixel sensors (RAPS) INFN project. Two different basic pixel schemes have been proposed. The first one is based on a standard active pixel sensor (APS) architecture, while a second architecture, named weak inversion pixel sensor (WIPS) exploits a different circuitry which allows for “sparse” access mode and thus for speeding-up the readout phase. Chip fabrication has been completed and a preliminary test phase has been performed. A suitable test environment has been devised and test strategies have been planned. Preliminary test results, featuring a static and dynamic characterization of the basic sensitive elements are outlined. Future works are also outlined, aimed at the optimization of a second version of the chip, more effectively integrating smart circuitry

    Design, Fabrication, and Test of CMOS Active-Pixel Radiation Sensors

    No full text
    In this paper, we discuss some issues related to the design, implementation, and test of a CMOS active pixel sensor chip (RAPS01), developed in the framework of the radiation active pixel sensors (RAPS) INFN project. Two different basic pixel schemes have been proposed. The first one is based on a standard active pixel sensor (APS) architecture, while a second architecture, named weak inversion pixel sensor (WIPS) exploits a different circuitry which allows for "sparse" access mode and thus for speeding-up the readout phase. Chip fabrication has been completed and a preliminary test phase has been performed. A suitable test environment has been devised and test strategies have been planned. Preliminary test results, featuring a static and dynamic characterization of the basic sensitive elements are outlined. Future works are also outlined, aimed at the optimization of a second version of the chip, more effectively integrating smart circuitry

    Raccolta di grafici relativi ai parametri di Adone

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    <p> Raccolta di grafici relativi ai parametri di Adone.</p&gt

    Appunto sulle correnti circolanti in Adone nel periodo 30 maggio - 2 luglio 1968

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    <p>È stato riscontrato un errore sul valore della corrente circolante nella macchina durante i turni assegnati agli sperimentali. Viene di seguito indicata la valutazione dell'errore ac canto ai giorni di turno.</p&gt
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