747 research outputs found
12th IEEE International On-Line Testing Symposium
No full textIssues related to on-line testing are increasingly important in modern electronics systems. In particular, the huge complexity of electronic systems has seen reliability needs growing up in various application domains as well as pressure for low cost products. There is a corresponding increasing demand for cost-effective on-line testing techniques. These needs have increased dramatically with the introduction of very deep submicron and nanometer technologies. Nanometer technologies impact adversely noise margins and make mandatory integrating on-line test in modern ICs. The Symposium is also emphasizing on on-line testing in the continuous operation of large applications such as wired, cellular and satellite telecommunication, as well as in cryptographic chips.
The Symposium is sponsored by the IEEE Computer Society and Test Technology Technical Council (TTTC).
General Chairs:
Cecilia Metra (University of Bologna)
Michael Nicolaidis (TIMA Laboratory)
Program Chairs:
Regis Leveugle (TIMA Laboratory)
Rob Aitken (ARM, USA
Paracypris eniotmetos Nicolaidis & Piovesan 2013
No full textParacypris eniotmetos Nicolaidis & Piovesan, 2013 Fig. 6C Paracypris eniotmetos Nicolaidis & Piovesan, 2013: 244, fig. 3.10a–e. Paracypris aff. mdaouerensis Bassoullet & Damotte, 1969 – Viviers et al. 2000: 418, figs 10.16, 10.21– 10.22. Paracypris sp. P3 – Viviers et al. 2000: 418, figs 10.10–10.11. New material examined BRAZIL: 1-US-1 well, Laranjeiras Municipality, Sergipe State (depths of 300, 390, 804 and 831 m); Estre outcrop, Rosário do Catete Municipality, Sergipe State (sample MP-1423), approximate coordinates 10°41' S, 37°02'W; Fazenda Santa Bárbara outcrop, Rosário do Catete Municipality, Sergipe State (sample MP-1420), approximate coordinates 10°39' S, 37°01' W; Massapê outcrop, Riachuelo Municipality, Sergipe State (samples MP-1514, MP-1515, MP-1517 to MP-1521, MP-1531 and MP- 1545 to MP-1547), approximate coordinates 10°06' S, 37°10' W; P384 outcrop, Riachuelo Municipality, Sergipe State (samples MP-1497, MP-1506 and MP-1511 to MP-1513), approximate coordinates 10°43' S, 37°12' W; Penha outcrop, Riachuelo Municipality, Sergipe State (samples MP-1449 to MP- 1453, MP-1456, MP-1457 and MP-1459), approximate coordinates 10°42' S, 37°13' W; Porto dos Barcos 3 outcrop, Riachuelo Municipality, Sergipe State (samples MP-1460 to MP-1466 and MP-1468 to MP-1472), approximate coordinates 10°43' S, 37°10' W; São José 1 outcrop, Riachuelo Municipality, Sergipe State (samples MP-1550 to MP-1555, MP-1557 to MP-1568, MP-1570 to MP-1577, MP-1680 and MP-1695 to MP-1697), approximate coordinates 10°44' S, 37°13' W. Type locality and stratum PAB-15 well at a depth of 1029 m, Espírito Santo Basin, Espírito Santo State, Brazil; São Mateus Formation, Albian. Measurements Homeotype (CP-679): carapace: length = 0.67 mm, height = 0.30 mm, width = 0.20 mm. Homeotype (CP-680): right valve: length = 0.58 mm, height = 0.24 mm. Remarks The diagnosis follows Piovesan et al. (2013), although no striate forms were observed in the present samples. Paleoecology and distribution Paracypris eniotmetos Nicolaidis & Piovesan, 2013 is a transitional to marine (shelf) species occurring in the following localities and stages: Potiguar Basin, Jandaíra Formation, Coniacian–Santonian (Viviers et al. 2000); Santos Basin, Florianópolis, Juréia and Itanhaém Formations, Albian–lower Santonian; Espírito Santo Basin, São Mateus Formation, Albian (Piovesan et al. 2013); Sergipe-Alagoas Basin, Angico and Taquari Members, Riachuelo Formation, upper Aptian–Albian, Aracajuia benderi zone (MSA-0), Harbinia sinuata ? (MSA-0.1), Praebythoceratina amsittenensis (MSA-0.3) and Reticulocosta edrianae (MSA-0.4) subzones (Viviers et al. 2000); and in the present work, also in the Taquari and Maruim Members, Sergipella viviersae subzone (MSA-0.2) and Aracajuia antiqua zone (MSA-1), Brazil.Published as part of Antonietto, Lucas Silveira, Carmo, Dermeval Aparecido do, Viviers, Marta Claudia, Neto, João Villar Queiroz & Hunt, Gene, 2016, Ostracoda (Arthropoda, Crustacea) from the Riachuelo Formation, Sergipe-Alagoas Basin, Brazil, Upper Aptian-Albian, pp. 1-57 in European Journal of Taxonomy 244 on pages 19-20, DOI: 10.5852/ejt.2016.244, http://zenodo.org/record/385062
10th IEEE International On-Line Testing Symposium
No full textIssues related to on-line testing are increasingly important in modern electronics systems In particular, the huge complexity of electronic systems has seen reliability needs growing up in various application domains as well as pressure for low cost products. There is a corresponding increasing demand for cost-effective on-line testing techniques. These needs have increased dramatically with the introduction of very deep submicron and nanometer technologies. These technologies impact adversely noise margins and make mandatory integrating on-line test in modern ICs. The Symposium is also emphasizing on on-line testing in the continuous operation of large applications such as wired, cellular and satellite telecommunication, as well as in cryptographic chips. The Symposium is sponsored by the IEEE Computer Society Test Technology Technical Council (TTTC), co-organized by the TTTC On-line Testing TAC and the European Group of TTTC, in collaboration with IST (Instituto Superior Técnico), INESC-ID Lisboa, CoreWorks, TIMA Laboratory, IRoC Technologies and University of Bologna.
General Chairs:
M. Nicolaidis (iRoC Technologies)
J.P. Teixeira (IST/INESC-ID)
Program Chairs:
R. Leveugle (TIMA Laboratory)
C. Metra (U. Bologna
Improving the theory of truth table verification of iterative logic arrays
No full textISBN: 0780306236The author shows that, if the number of the states of the reduced flow table of an iterative logic array (ILA) is not a power of 2, then, the truth table verification of the ILA requires to test it exhaustively. Thus, in this case the theory presented by F.J.O. Dias (1976) and allowing the truth table verification of ILAs by means of C-tests, is not valid. Then the author extends this theory to the case where the ILA cells have some inputs in common (such ILAs are for instance ALUs, and the rows of multiply and divide arrays)
On Line-Testing for VLSI
No full textInternational audienceReprinted from THE JOURNAL OF ELECTRONIC TESTING, 12:1-2Test functions (fault detection, diagnosis, error correction, repair, etc.) that are applied concurrently while the system continues its intended function are defined as on-line testing. In its expanded scope, on-line testing includes the design of concurrent error checking subsystems that can be themselves self-checking, fail-safe systems that continue to function correctly even after an error occurs, reliability monitoring, and self-test and fault-tolerant designs. On-Line Testing for VLSI contains a selected set of articles that discuss many of the modern aspects of on-line testing as faced today. The contributions are largely derived from recent IEEE International On-Line Testing Workshops. Guest editors Michael Nicolaidis, Yervant Zorian and Dhiraj Pradhan organized the articles into six chapters. In the first chapter the editors introduce a large number of approaches with an expanded bibliography in which some references date back to the sixties. On-Line Testing for VLSI is an edited volume of original research comprising invited contributions by leading researchers
11th IEEE International On-Line Testing Symposium
No full textIssues related to on-line testing are increasingly important in modern electronics systems. In particular, the huge complexity of electronic systems has seen reliability needs growing up in various application domains as well as pressure for low cost products. There is a corresponding increasing demand for cost-effective on-line testing techniques. These needs have increased dramatically with the introduction of very deep submicron and nanometer technologies. Nanometer technologies impact adversely noise margins and make mandatory integrating on-line test in modern ICs. The Symposium is also emphasizing on on-line testing in the continuous operation of large applications such as wired, cellular and satellite telecommunication, as well as in cryptographic chips.
The Symposium is sponsored by the IEEE Computer Society, Test Technology Technical Council (TTTC), co-organized by the TTTC On-line Testing TAC and the European Group of TTTC, in collaboration with TIMA Laboratory, University of Bologna, Purdue University and IRoC Technologies.
General Chairs:
Michael Nicolaidis (iRoC Technologies)
Lorena Anghel (TIMA Laboratory)
Program Chairs:
Cecilia Metra (Bologna University)
Kaushik Roy (Purdue University
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