1,721,003 research outputs found
RELIABILITY ESTIMATION TECHNIQUES FOR NANOSCALE MOSFETS AND FINFETS CIRCUITS IN THE PRESENCE OF NOISE, VARIABILITY AND AGING
No full textHigh yield, reliability, and increasing number of functions in single Integrated Circuit (IC) have been the continuing demand of the market for IC fabrication. However, the uninterrupted scaling of CMOS and FinFET technologies to nano-scale level leads to fallouts in reliability due to the variability of process parameters and the aging caused by Bias Temperature Instability (BTI). Such issues ultimately become responsible for a weakening of noise immunity in digital circuits which translate in higher logic error probability and higher average power consumption. Various types of failures take part in the degradation of circuit reliability when CMOS and FinFET technologies are scaling to nano meter regime. Failures such as input voltage signal fluctuations in presence of additive noise or crosstalk noise within the circuit topology, variations in process parameters of device itself and different aging mechanisms over the lifetime of circuit, can hugely detoriate the reliability of circuit.
In this thesis work, several novel modeling techniques such as analytical, semi-analytical and approximation, are introduced in order to quantify failure-probability for both combinational and sequential circuits, in the presence of input voltage noise in conjunction with process variations and aging. Furthermore, an analysis on the impact of noise-induced voltage pulses on the static power consumption of nano-CMOS circuits is implemented by using an approximation model scheme. Estimating the failure probability of nano-scale generic logic cells is a key point for the evaluation of digital system reliability. Noise-induced input variations with process-induced threshold voltage variations affect the probability of correct operation of logic cells. This part of research work quantitatively analyses the probability of invalid output of a cell by introducing novel analytical and approximation approaches in comparison with SPICE Monte-Carlo verification approach.
Technology parameter variations combined with voltage noise can become a major cause of logic errors in digital circuits. The prproposed semi-analytical scheme brings in the idea of “safe operation region” to permit a robust analytical Monte Carlo evaluation of the reliability of logic circuits in a given technology, avoiding time-consuming SPICE-level or device-level Monte Carlo simulations. The application of the approach is demonstrated for the case of a 22 nm bulk CMOS process.
Furthermore, the assessment of noise margins and the related probability of failure in digital cells has growingly become essential, as nano-scale MOSFET and FinFET technologies are confronting reliability issues caused by aging mechanisms, such as NBTI and PBTI, and variability in process parameters. The effect of such phenomena on system level operation is particularly related to the Static Noise Margins (in idle and read mode) and the Write Noise Margins of memory elements. While Static Noise Margins have been studied in the past, in this work we calculated and compared the effect of process variations and NBTI/PBTI aging on the Write Noise Margins of various MOSFET- and FinFET-based flip-flop cells. The massive transistor-level Monte Carlo simulations produced both nominal (i.e. mean) values and associated standard deviations of the WNMs of the flip-flops. This allowed calculating the consequent write failure probability as a function of an input voltage shift, and assessing a comparison for robustness among different circuit topologies and technologies. Temperature and voltage dependence is also included in the analysis.
Last but not least research devoted to the occurrence of noise pulses on the input signals of idle digital cells has been typically associated to reliability issues, such as transient or permanent logic errors. The wide range of possible noise sources in nano-scale circuits, associated to the variability of process parameters, makes it interesting to explore the impact of random voltage pulses on the static power of idle logic cells, even if the logic operation is not compromised by the noise. This part of the thesis proposes a simple yet effective model to characterize the shift in static energy consumption associated to input voltage pulses in logic cells. The characterization scheme allows a fast calculation of the statistical distribution of the energy shift in multi-cell circuits affected by random noise pulses and considering the impact of device statistical variability. The accuracy and effectiveness of the approach have been tested against SPICE simulation, reaching a four orders of magnitude speedup in run time. All of the above proposed techniques were verified against state of the art SPICE Monte Carlo Simulations and results in over 10E4 faster run time with respect to SPICE evaluation
"Near-infrared camera in polycrystalline germanium integrated on complementary-metal-oxide semiconductor electronics"
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Going Beyond Counting First Authors in Author Co-citation Analysis
Full text linkThe present study examines one of the fundamental aspects of author co-citation analysis (ACA) - the way co-citation
counts are defined. Co-citation counting provides the data on which all subsequent statistical analyses and mappings
are based, and we compare ACA results based on two different types of co-citation counting - the traditional type that
only counts the first one among a cited work's authors on the one hand and a non-traditional type that takes into
account the first 5 authors of a cited work on the other hand. Results indicate that the picture produced through this non-traditional author co-citation counting contains more coherent author groups and is therefore considerably clearer. However, this picture represents fewer specialties in the research field being studied than that produced through the traditional first-author co-citation counting when the same number of top-ranked authors is selected and analyzed. Reasons for these effects are discussed
Variations on the Author
Full text link“Variations on the Author” discusses two of Eduardo Coutinho’s recent films (Um Dia na Vida, from 2010, and Últimas Conversas, posthumously released in 2015) and their contribution to the general question of documentary authorship. The director’s filmography is characterized by a consistent yet self-effacing form of authorial self-inscription: Coutinho often features as an interviewer that rather than express opinions propels discourses; an interviewer that is good at listening. This mode of self-inscription characterizes him as an author who is not expressive but who is nonetheless markedly present on the screen. In Um Dia na Vida, however, Coutinho is completely absent form the image, while Últimas Conversas, on the contrary, includes a confessional prologue that moves the director from the margins to the center of his films. This article examines the ways in which these works stand out in the filmography of a director who offers new insights into the notion of cinematic authorship
Appropriate Similarity Measures for Author Cocitation Analysis
Full text linkWe provide a number of new insights into the methodological discussion about author cocitation analysis. We first argue that the use of the Pearson correlation for measuring the similarity between authors’ cocitation profiles is not very satisfactory. We then discuss what kind of similarity measures may be used as an alternative to the Pearson correlation. We consider three similarity measures in particular. One is the well-known cosine. The other two similarity measures have not been used before in the bibliometric literature. Finally, we show by means of an example that our findings have a high practical relevance.information science;Pearson correlation;cosine;similarity measure;author cocitation analysis
Dispelling the Myths Behind First-author Citation Counts
Full text linkWe conducted a full-scale evaluative citation analysis study of scholars in the XML research field to explore just how different from each other author rankings resulting from different citation counting methods actually are, and to demonstrate the capability of emerging data and tools on the Web in supporting more realistic citation counting methods. Our results contest some common arguments for the continued
use of first-author citation counts in the evaluation of scholars, such as high correlations between author rankings by first-author citation counts and other citation
counting methods, and high costs of using more realistic citation counting methods that are not well-supported by the ISI databases. It is argued that increasingly available digital full text research papers make it possible for citation analysis studies to go beyond what the ISI databases have directly supported and to employ more
sophisticated methods
koamabayili/VECTRON-author-checklist: VECTRON author checklist
No full textWe have done our best to complete the author checklist relating to the use of animals in the hut study. Note that the objective for the hut study was to evaluate the IRS treatment applications for residual efficacy against Anopheles mosquitoes, including the local An. coluzzii mosquito population. Cows were only used to attract mosquitoes into the huts and no tests were carried out directly on the cows. The author checklist is intended for use with studies where experiments are carried out on animals, which is why we have had such difficulty in completing this for the hut study, as many of the questions do not relate to how the cows were used
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