1,720,972 research outputs found

    New Applications of Cross-Talk-Based Capacitance Measurements

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    Charge-based capacitance measurements (CBCMs) are widely used to estimate on-chip wiring capacitances because of their accuracy and simplicity. Enhanced CMOS transducers for CBCM have been recently proposed that exploit cross-talk to selectively measure cross-coupling capacitances. In this paper we propose two new applications of cross-talk-based capacitance measurements: mismatch measurement of stacked metal-metal capacitor pairs, and localization of wire interruptions. We present the measurement techniques, we discuss their implementation and we report preliminary experimental results

    Measurements and Extractions of Parasitic Capacitances in ULSI Layouts

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    This paper deals with the extraction of parasitic capacitances of interconnects in submicron layouts. It is well known that, in integrated circuits, the signal delay due to interconnects is comparable to that of gates. This aspect becomes particularly important, for example, during the design of clock trees in high-speed applications. In general, capacitance extraction is carried out with software tools but they should be validated on a set of geometrical structures, which have been accurately characterized and that are representative of the circuit layouts. Experimental characterization of these structures and their set up in a golden set of measures is still a challenging task. In this paper, we first describe some experimental approaches to measure capacitances of structures from the golden set and in particular we identify a high accuracy transducer based on pass-gate transistors. We then propose a software implementation of the floating random walk algorithm that solves the drawbacks in the extraction of capacitances of interconnects in a nonhomogeneous medium as an industrial layout. Finally, experimental and simulation results are presented, validating the adopted approach

    Characterization and modeling methodology for the evaluation of statistical variation of MOSFETs

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    A methodology for the investigation of CMOS variability using statistical measurements (spot, IV and CV) on single CMOS devices and matched pairs has been presented. Results on 180 nm and 90 nm technologies have been discussed. An extension of the available variability models has been proposed to account for the experimental spread of the absolute threshold voltage values. Variability of carrier mobility and its dependence on halo doping has been pointed ou

    Time domain approach for the evaluation of RC delays effects in ULSI interconnect lines

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    The evaluation of RC effects in ULSI technology is important both for process development and for accuracy verification of back-end modeling and cad-tools. The paper proposes a new methodology with one possible implementation for the measurement of RC delays in ULSI interconnect lines (DUT). The proposed implementation has been developed at wafer level by means of a mid-complexity test circuit whose working principle is based on the comparison between the RC delay of the DUT and a well-known reference delay generated on-chip

    Going Beyond Counting First Authors in Author Co-citation Analysis

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    The present study examines one of the fundamental aspects of author co-citation analysis (ACA) - the way co-citation counts are defined. Co-citation counting provides the data on which all subsequent statistical analyses and mappings are based, and we compare ACA results based on two different types of co-citation counting - the traditional type that only counts the first one among a cited work's authors on the one hand and a non-traditional type that takes into account the first 5 authors of a cited work on the other hand. Results indicate that the picture produced through this non-traditional author co-citation counting contains more coherent author groups and is therefore considerably clearer. However, this picture represents fewer specialties in the research field being studied than that produced through the traditional first-author co-citation counting when the same number of top-ranked authors is selected and analyzed. Reasons for these effects are discussed

    Variations on the Author

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    “Variations on the Author” discusses two of Eduardo Coutinho’s recent films (Um Dia na Vida, from 2010, and Últimas Conversas, posthumously released in 2015) and their contribution to the general question of documentary authorship. The director’s filmography is characterized by a consistent yet self-effacing form of authorial self-inscription: Coutinho often features as an interviewer that rather than express opinions propels discourses; an interviewer that is good at listening. This mode of self-inscription characterizes him as an author who is not expressive but who is nonetheless markedly present on the screen. In Um Dia na Vida, however, Coutinho is completely absent form the image, while Últimas Conversas, on the contrary, includes a confessional prologue that moves the director from the margins to the center of his films. This article examines the ways in which these works stand out in the filmography of a director who offers new insights into the notion of cinematic authorship

    Appropriate Similarity Measures for Author Cocitation Analysis

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    We provide a number of new insights into the methodological discussion about author cocitation analysis. We first argue that the use of the Pearson correlation for measuring the similarity between authors’ cocitation profiles is not very satisfactory. We then discuss what kind of similarity measures may be used as an alternative to the Pearson correlation. We consider three similarity measures in particular. One is the well-known cosine. The other two similarity measures have not been used before in the bibliometric literature. Finally, we show by means of an example that our findings have a high practical relevance.information science;Pearson correlation;cosine;similarity measure;author cocitation analysis
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