1,721,718 research outputs found
Knight, K, NX2868
No full textThis record was harvested from a previous catalogue system and will be withdrawn in 2025. Information in this record may be superseded or incomplete. Visit this record in UMA's new catalogue at: https://archives.library.unimelb.edu.au/nodes/view/397610Surname: KNIGHT. Given Name(s) or Initials: K. Military Service Number or Last Known Location: NX2868. Missing, Wounded and Prisoner of War Enquiry Card Index Number: 36838.235930
Item: [2016.0049.29903] "Knight, K, NX2868
Deposition and characterization of copper indium gallium sulphide thin films fabricated by chemical vapour deposition with metal chloride precursors
No full textChemical vapour deposition (CVD) is a widely used method in the optoelectronics and semiconductor industries, producing high purity thin films, in crystalline, amorphous and epitaxial phases. A variety of materials can be produced in this way although for the most part use of the technique has focussed on polysilicon, silicon dioxide, silicon nitride and metallic materials. The advantages of CVD processing, which offers offer superior quality compared to conventional methods such as sputtering or co-evaporation, include conformality, coverage, and stoichiometry control. The process should also be more economical and scalable to large substrates as it can take place at atmospheric pressure rather than under vacuum conditions
Novel methods for the preparation of high purity chalcogenide glass for optical fiber applications
No full textChalcogenide glass is traditionally made by melt quenching of purified elements in a sealed system. Raw materials are weighed and inserted into an ampoule, which is evacuated, sealed and heated to the melting temperature while rocking to ensure homogenization. With this technique, high purity chalcogenides suitable for drawing into low loss fibers can be achieved. In this presentation we describe our work with two alternative methods for chalcogenide glass preparation; open atmosphere melting and chemical vapour deposition. These techniques have the potential to provide higher purity glass and easy scaling of the process. In both methods, a flowing reactive atmosphere allows in situ purification of the melt, something not possible with sealed ampoule methods. We describe these processes, their advantages and disadvantages and provide experimental data on their effectiveness in producing high quality chalcogenide glass
Going Beyond Counting First Authors in Author Co-citation Analysis
Full text linkThe present study examines one of the fundamental aspects of author co-citation analysis (ACA) - the way co-citation
counts are defined. Co-citation counting provides the data on which all subsequent statistical analyses and mappings
are based, and we compare ACA results based on two different types of co-citation counting - the traditional type that
only counts the first one among a cited work's authors on the one hand and a non-traditional type that takes into
account the first 5 authors of a cited work on the other hand. Results indicate that the picture produced through this non-traditional author co-citation counting contains more coherent author groups and is therefore considerably clearer. However, this picture represents fewer specialties in the research field being studied than that produced through the traditional first-author co-citation counting when the same number of top-ranked authors is selected and analyzed. Reasons for these effects are discussed
Thermoelastic and Structural Response of CoMgSiO4 Olivine to High Temperature Treatment by in situ Neutron Powder Diffraction.
No full texthttp://neutron.neutron-eu.net/n_nmi3/n_networking_activities/n_nes
Towards deposition of copper indium gallium sulphide/selenide materials by chemical vapour deposition
No full textCopper indium gallium sulphide thin films have been fabricated by chemical vapour deposition with metal halide precursors and S2Cl2 and H2 reactive gases. The CVD-grown CIGS thin films have been characterized by scanning electron microscopy, energy dispersive X-ray analysis, X-ray diffraction analysis, and UV-VIS-NIR spectroscopy
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