1,720,954 research outputs found
Analysis and detection of wear-out failures in nanometer technologies
Get PDFIn this work an analysis and detection of wear-out failures in nanometer tech-
nologies has been presented. Wear-out failure mechanisms depends on stress
conditions and workload during circuit operation.
Electromigration and self heating are the major interconnect wear-out failure
mechanisms.
On the other hand, the probability of an open defect at vias and interconnects
increases as technology scales. Weak resistive opens producing small delays are an
issue in nanometer technologies. The number of vias, that is in order of billions,
exceeds signi¯cantly the number of interconnects in a chip. Therefore resistive
vias are the most common cause of test escapes in nanometer technologies causing
reliability issues in circuits. Defective vias and interconnects are more prone to
su®er electromigration which can lead to a chip failure.
Negative Bias Temperature Instability and Hot Carrier Injection (HCI) are the
major sources of transistor aging causing a slow response of circuits. Transistor
aging phenomena is also considered a reliability issue according to International
Technology Roadmap for Semiconductors.
On-line testing techniques are employed to detect wear-out failures in order to
improve reliability. The testing is done by collecting information, during normal
operation, about the evolution of some system parameters, for instance, circuit
delay, over time and hence be able to determine when the system fails the design
speci¯cations.En este trabajo se realiza el análisis y la detección de fallas debidas a desgaste
en tecnologías nanométricas. Las fallas por desgaste dependen de las condiciones
de estrés y carga de trabajo durante la operación del circuito. Electromigración y
auto-calentamiento son los mecanismos de falla de desgaste más importantes en
interconexiones. Electromigración y auto-calentamiento son los mecanismos de
falla de desgaste más importantes en interconexiones.
Por otro lado, la probabilidad de existencia de un defecto en vías e interconexiones
aumenta a medida que la tecnología se escala. Defectos resistivos débiles
producen pequeños retardos y son un gran problema en tecnologías nanométricas.
El número de vías (en el orden de los billones) excede considerablemente al
número de interconexiones en un circuito integrado. Es por esta razón que un
gran número de vías defectuosas escapan de las pruebas de test y constituyen
serios problemas de confiabilidad en tecnologías actuales.
Vías con defecto, son más suceptibles de sufrir electromigración, lo cual puede
llevar a una falla total del circuito.
Negative Bias Temperature Instability y Hot Carrier Injection (electrones
calientes) son as fuentes de envejecimiento más importantes en transistores PMOS.
El fenómeno de envejecimiento es también considerado un serio problema de confiabilidad
de acuerdo a la International Technology Roadmap for Semiconductors.
Técnicas de test on-line, son empleadas para detectar fallas debidas a desgastes,
con el objetivo de mejorar la confiabilidad
Reliability enhancement of nanometer-scale digital circuits
Get PDFThe aggressive scaling of CMOS process technology poses serious challenges on
the lifetime reliability of ICs due to the stringent operating conditions and the
increase of process parameter variations. Reliability has become an important
concern of semiconductor industry and should be improved with each scaled
technological node in order to enhance yield. From semiconductor perspective,
reliability is the ability of a device to perform its required function under stated
conditions for a specified period of time. A semiconductor device fails when the
response parameters from the device can no longer perform its intended function.
Device failure may occur at any moment of device's lifetime.
As technology scales down, the likelihood of manufacturing defects such as
open and bridge defects increases due to the growth rate of interconnections.
Some of these defects are hard to be detected by traditional test methods and
could result in test escapes posing reliability issues. In addition, soft errors have
emerged as an important reliability concerns in SRAM memories due to lower
node capacitance and more stringent operating conditions
Going Beyond Counting First Authors in Author Co-citation Analysis
Get PDFThe present study examines one of the fundamental aspects of author co-citation analysis (ACA) - the way co-citation
counts are defined. Co-citation counting provides the data on which all subsequent statistical analyses and mappings
are based, and we compare ACA results based on two different types of co-citation counting - the traditional type that
only counts the first one among a cited work's authors on the one hand and a non-traditional type that takes into
account the first 5 authors of a cited work on the other hand. Results indicate that the picture produced through this non-traditional author co-citation counting contains more coherent author groups and is therefore considerably clearer. However, this picture represents fewer specialties in the research field being studied than that produced through the traditional first-author co-citation counting when the same number of top-ranked authors is selected and analyzed. Reasons for these effects are discussed
Variations on the Author
Get PDF“Variations on the Author” discusses two of Eduardo Coutinho’s recent films (Um Dia na Vida, from 2010, and Últimas Conversas, posthumously released in 2015) and their contribution to the general question of documentary authorship. The director’s filmography is characterized by a consistent yet self-effacing form of authorial self-inscription: Coutinho often features as an interviewer that rather than express opinions propels discourses; an interviewer that is good at listening. This mode of self-inscription characterizes him as an author who is not expressive but who is nonetheless markedly present on the screen. In Um Dia na Vida, however, Coutinho is completely absent form the image, while Últimas Conversas, on the contrary, includes a confessional prologue that moves the director from the margins to the center of his films. This article examines the ways in which these works stand out in the filmography of a director who offers new insights into the notion of cinematic authorship
Appropriate Similarity Measures for Author Cocitation Analysis
Get PDFWe provide a number of new insights into the methodological discussion about author cocitation analysis. We first argue that the use of the Pearson correlation for measuring the similarity between authors’ cocitation profiles is not very satisfactory. We then discuss what kind of similarity measures may be used as an alternative to the Pearson correlation. We consider three similarity measures in particular. One is the well-known cosine. The other two similarity measures have not been used before in the bibliometric literature. Finally, we show by means of an example that our findings have a high practical relevance.information science;Pearson correlation;cosine;similarity measure;author cocitation analysis
Dispelling the Myths Behind First-author Citation Counts
Get PDFWe conducted a full-scale evaluative citation analysis study of scholars in the XML research field to explore just how different from each other author rankings resulting from different citation counting methods actually are, and to demonstrate the capability of emerging data and tools on the Web in supporting more realistic citation counting methods. Our results contest some common arguments for the continued
use of first-author citation counts in the evaluation of scholars, such as high correlations between author rankings by first-author citation counts and other citation
counting methods, and high costs of using more realistic citation counting methods that are not well-supported by the ISI databases. It is argued that increasingly available digital full text research papers make it possible for citation analysis studies to go beyond what the ISI databases have directly supported and to employ more
sophisticated methods
koamabayili/VECTRON-author-checklist: VECTRON author checklist
No full textWe have done our best to complete the author checklist relating to the use of animals in the hut study. Note that the objective for the hut study was to evaluate the IRS treatment applications for residual efficacy against Anopheles mosquitoes, including the local An. coluzzii mosquito population. Cows were only used to attract mosquitoes into the huts and no tests were carried out directly on the cows. The author checklist is intended for use with studies where experiments are carried out on animals, which is why we have had such difficulty in completing this for the hut study, as many of the questions do not relate to how the cows were used
Author-wise bibliometric analysis based on entropy.
No full textAuthor-wise bibliometric analysis based on entropy.</p
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