1,720,963 research outputs found
Going Beyond Counting First Authors in Author Co-citation Analysis
Get PDFThe present study examines one of the fundamental aspects of author co-citation analysis (ACA) - the way co-citation
counts are defined. Co-citation counting provides the data on which all subsequent statistical analyses and mappings
are based, and we compare ACA results based on two different types of co-citation counting - the traditional type that
only counts the first one among a cited work's authors on the one hand and a non-traditional type that takes into
account the first 5 authors of a cited work on the other hand. Results indicate that the picture produced through this non-traditional author co-citation counting contains more coherent author groups and is therefore considerably clearer. However, this picture represents fewer specialties in the research field being studied than that produced through the traditional first-author co-citation counting when the same number of top-ranked authors is selected and analyzed. Reasons for these effects are discussed
Variations on the Author
Get PDF“Variations on the Author” discusses two of Eduardo Coutinho’s recent films (Um Dia na Vida, from 2010, and Últimas Conversas, posthumously released in 2015) and their contribution to the general question of documentary authorship. The director’s filmography is characterized by a consistent yet self-effacing form of authorial self-inscription: Coutinho often features as an interviewer that rather than express opinions propels discourses; an interviewer that is good at listening. This mode of self-inscription characterizes him as an author who is not expressive but who is nonetheless markedly present on the screen. In Um Dia na Vida, however, Coutinho is completely absent form the image, while Últimas Conversas, on the contrary, includes a confessional prologue that moves the director from the margins to the center of his films. This article examines the ways in which these works stand out in the filmography of a director who offers new insights into the notion of cinematic authorship
Appropriate Similarity Measures for Author Cocitation Analysis
Get PDFWe provide a number of new insights into the methodological discussion about author cocitation analysis. We first argue that the use of the Pearson correlation for measuring the similarity between authors’ cocitation profiles is not very satisfactory. We then discuss what kind of similarity measures may be used as an alternative to the Pearson correlation. We consider three similarity measures in particular. One is the well-known cosine. The other two similarity measures have not been used before in the bibliometric literature. Finally, we show by means of an example that our findings have a high practical relevance.information science;Pearson correlation;cosine;similarity measure;author cocitation analysis
Testing RRAM and Computation-in-Memory Devices: Defects, Fault Models, and Test Solutions
No full textResistive random access memory (RRAM) is a promising emerging memory technology that offers dense, non-volatile memories that do not consume any static power. Furthermore, RRAMdevices can be written and read out in nanoseconds, and it is possible to use them to performcomputation-in-memory (CIM). These benefits make this technology a potential replacement for Flash or even dynamic random access memory (DRAM). This is also clearly seen by the community; both universities and companies are prototyping RRAMs, and there are already some commercial RRAMs available. In order to deliver high-quality products, the RRAMs need to be tested properly so that a manufacturer can guarantee the quality. This dissertation focuses on test development for RRAMs. Traditionally, production defects in memories, such as DRAM, are modeled as linear resistors in or between two nodes of the circuit. In literature, many researchers have applied a similar approach for RRAMs. However, we demonstrate that this method of modeling defects is inappropriate, because the models fail to describe the defective behavior of the RRAM device. Instead, those models describe defects in the interconnections that surround the RRAM device. To overcome this, we propose the Device-Aware Test (DAT) approach that consists of three steps. First, the approach models the actual physics of defective devices and thus leads to realistic defectmodels. Second, the defect models are used to performaccurate faultmodeling and analysis. Third, the results from this step are used to develop high-quality RRAM tests. We do this by first characterizing the defect. We analyze the complete production process of a RRAM. During this analysis, we identify what can go wrong in every step, and in what kind of defects this may result. All identified defects need to be properly modeled, so that a high-quality test can be developed.Next,we analyze howit affects the performance of a defect-free device, and incorporate the resulting defective behavior in a compact defect model. This model is calibrated and accurately describes the effects of the defect. Second, we apply this defect model in a RRAM circuit to perform fault modeling and analysis. We systematically define the complete space of all faults that could occur, and then apply an analysis methodology to validate which faults actually occur in the circuit. Third, we develop a test for the validated faults. This test only needs to detect faults that are actually sensitized, and thus is shorter than generic tests, while it also has a better fault coverage. We apply the DAT approach to RRAM forming defects and RRAM intermittent undefined state faults. The results show that these two defect models sensitize different faults than the traditional defect models do. Since the DAT defect models describe the actual physics of the defects, we can conclude that the traditional approach will lead to lowquality tests that generate test escapes and reduce the production yield. Furthermore, we demonstrate that the faults cannot easily be detected by existing test algorithms, and that special tests need to be developed to detect them. We also apply the DAT approach to a RRAM-based computation-in-memory (CIM) architecture to develop a test for it. We shows that a CIM device needs to be tested both in its memory and computation configuration, as there are unique faults in both configurations. We define the complete fault space for CIM faults and validate it using the DAT approach. Subsequently, we develop a test that detects the faults in both configurations. Furthermore, we study how process, voltage and temperature variations affect the performance of the CIM architecture. We demonstrate that certain operations are more susceptible to these variations than other ones.Computer Engineerin
Dispelling the Myths Behind First-author Citation Counts
Get PDFWe conducted a full-scale evaluative citation analysis study of scholars in the XML research field to explore just how different from each other author rankings resulting from different citation counting methods actually are, and to demonstrate the capability of emerging data and tools on the Web in supporting more realistic citation counting methods. Our results contest some common arguments for the continued
use of first-author citation counts in the evaluation of scholars, such as high correlations between author rankings by first-author citation counts and other citation
counting methods, and high costs of using more realistic citation counting methods that are not well-supported by the ISI databases. It is argued that increasingly available digital full text research papers make it possible for citation analysis studies to go beyond what the ISI databases have directly supported and to employ more
sophisticated methods
Structured Test Development Approach for Computation-in-Memory Architectures
No full textTesting of Computation-in-Memory (CIM) designs based on emerging non-volatile memory technologies, such as resistive RAM (RRAM), is fundamentally different from testing traditional memories. Such designs allow not only for data storage (i.e., memory configuration) but also for the execution of logical and arithmetic operations (i.e., computing configuration). Therefore, not only significant design changes are needed in the memory array and/or in the peripheral circuits, but also new fault models and test approaches are needed. Moreover, RRAM-based CIM makes use of non-linear non-volatile devices making the defect modeling with traditional linear resistor inappropriate for such device defects. Hence, even the way of doing defect modeling has to change. This paper discusses a structured test development approach for RRAM-based CIM and highlights the test challenges and how testing CIM dies is different from the traditional way of testing logic and memory. Methods for defect modeling, fault modeling, and test development will be discussed. The paper demonstrates that unique faults can occur in the CIM die while in the computation configuration and that these faults cannot be detected by just testing the CIM die in the memory configuration. Moreover, it shows that testing the CIM die in the computation configuration reduces the overall test time while improving the outgoing product quality. Finally, the paper presents an outlook on the future of structured CIM test development.Green Open Access added to TU Delft Institutional Repository 'You share, we take care!' - Taverne project https://www.openaccess.nl/en/you-share-we-take-care Otherwise as indicated in the copyright section: the publisher is the copyright holder of this work and the author uses the Dutch legislation to make this work public.Quantum & Computer EngineeringComputer Engineerin
koamabayili/VECTRON-author-checklist: VECTRON author checklist
No full textWe have done our best to complete the author checklist relating to the use of animals in the hut study. Note that the objective for the hut study was to evaluate the IRS treatment applications for residual efficacy against Anopheles mosquitoes, including the local An. coluzzii mosquito population. Cows were only used to attract mosquitoes into the huts and no tests were carried out directly on the cows. The author checklist is intended for use with studies where experiments are carried out on animals, which is why we have had such difficulty in completing this for the hut study, as many of the questions do not relate to how the cows were used
Author-wise bibliometric analysis based on entropy.
No full textAuthor-wise bibliometric analysis based on entropy.</p
- …
