397 research outputs found
Morphology And Microchemistry Of Colloidal Polymers
No full textColloidal polymers are highly versatile due to the variety of properties and functions that can be created by changing monomer composition, surfactant, initiator and reaction protocol. Microchemical and morphological observation of the particles and particle aggregates as well as films and monoliths made with them is allowing us to understand the connections between nanosized structural features and macroscopic properties and this is essential for the creation of valuable new polymer materials. Electron spectroscopy imaging (ESI) in the transmission electron microscope (TEM) uses electron energy loss spectroscopy (EELS) to provide a wealth of information on particle constituents and their topological distribution, allowing a number of correlations with the polymer mechanical, thermal, optical and electrical properties. On the other hand, scanning probe microscopy (SPM) techniques allow direct measurement of particle and film properties such as adhesion, stiffness, electrostatic potential as well as rheology information with high spatial resolution, down to 10-20 nm and under many different experimental conditions. Information from the joint use of these techniques is revealing a wealth of nanostructures within colloidal polymers requiring a revision of many preconceived ideas on these materials. Copyright © 2006 WILEY-VCH Verlag GmbH & Co. KGaA.245-246307314(1986) Principles of Analytical Electron Microscopy, , D. C. Joy, A. D. Romig, Jr, J. l. Goldstein, Eds, Plenum, New YorkEggerton, R.F., (1986) Electron Energy-Loss Spectroscopy in the Electron Microscope, , Plenum, New YorkCrazier, P.A., (1995) Ultramicroscopy, 58, p. 157F. Galembeck, Latex Dispersions and Emulsions in:Encyclopedia of Surface and Colloid Science, Second Edition, Taylor and Francis, New York 2006, p.5/3261-3277Schaffer, B., Grogger, W., Hofer, F., (2003) Micron, 34, p. 1Horiuchi, S., Hamanaka, T., Aoki, T., Miyakawa, T., Narita, R., Wakabayashi, H., (2003) J. Electron Microscopy, 52, p. 255F. Galembeck and Carlos Alberto R. Costa, Electric Scanning Probe Techniques: Kelvin Force Microscopy and Electric Force Microscopy in: Encyclopedia of Surface and Colloid Science, Second Edition, Taylor and Francis, New York 2006, p. 3/1874-1883Galembeck, F., Costa, C.A.R., Galembeck, A., da Silva, M.C.V.M., (2001) Anais da Academia Brasileira de Ciências, 73, p. 495Teixeira-Neto, E., Kaupp, G., Galembeck, F., (2003) J. Phys. Chem. B, 107, p. 14255Teixeira-Neto, E., Kaupp, G., Galembeck, F., (2004) Colloids Surfaces A, 243, p. 79Braga, M., Costa, C.A.R., Leite, C.A.P., Galembeck, F., (2001) J. Phys. Chem. B, 105, p. 3005Amalvy, J.I., Asua, J.M., Leite, C.A.P., Galembeck, F., (2001) Polymer, 42, p. 2479Keslarek, A.J., Leite, C.A.P., Galembeck, F., (2004) J. Braz. Chem. Soc, 15, p. 66Valadares, L.R., Leite, C.A.P., Galembeck, F., (2006) Polymer, 47, p. 672Cardoso, A.C., Leite, C.A.P., Galembeck, F., (1998) Langmuir, 14, p. 3187Santos, J.P., Corpart, P., Wong, K., Galembeck, F., (2004) Langmuir, 20, p. 10576Rippel, M.M., Leite, C.A.P., Lee, L.T., Galembeck, F., (2005) Colloid and Polymer Sci, 283, p. 570Rippel, M.M., Costa, C.A.R., Galembeck, F., (2004) J. Braz. Chem. Soc, 15, p. 66Rippel, M.M., Lee, L.T., Leite, C.A.P., Galembeck, F., (2003) J. Coloid. Interf. Sci, 268, p. 330Galembeck, A., Costa, C.A.R., da Silva, M.C.V.M., Galembeck, F., (2001) J. Coloid. Interf. Sci, 234, p. 39
Hydrous Non-crystalline Phosphates: Structure, Function And A New White Pigment
No full textHydrated non-crystalline inorganic solids are often neglected due to the limited comprehension of their complex physico-chemical and structural properties. However, these non-crystalline materials exhibit a rich and varied chemistry, interesting for scientific and technological reasons. This work reviews general aspects of formation of hydrated non-crystalline solids, with special emphasis on aluminum (poly)phosphate materials. Precursors and concentration variations, temperature, ageing and reaction pH are trivial synthetic variables, but they promote the formation of a myriad of compounds adequate for many functions. Amorphous aluminum phosphates are widely employed in different industrial applications, providing good examples of the potential of hydrous amorphous solids. © 2006 Sociedade Brasileira de Química.17814651472Wagner, C.N.J., (1978) J. Non-cryst. Solids, 31, p. 1Burrell, L.S., Johnston, C.T., Schulze, D., Klein, J., White, J.L., Hem, S.L., (2001) Vaccine, 19, p. 275Klein, J., Ushio, M., Burrel, L.S., Wenslow, B., Hem, S.L., (2000) J. Pharm. Sci., 89, p. 311Okada, S., Yamamoto, T., Okazaki, Y., Yamaki, J., Tokunaga, M., Nishida, T., (2005) J. Power Sources, 146, p. 570Sales, B.C., Boatner, L.A., Ramey, J.O., (2000) J. Non-cryst. Solids, 263-264, p. 155Wicks, J.D., McGreevy, R.L., (1995) J. Non-cryst. Solids, 193, p. 23Dalba, G., Fornasini, P., Grisenti, R., Rocca, F., (2004) J. Non-cryst. Solids, 345, p. 7Raberg, W., Ostadrahimi, A.H., Kayser, K., Wandelt, K., (2005) J. Non-cryst. Solids, 351, p. 1089Zallen, R., (1983) The Physics of Amorphous Solids, , Wiley: New YorkKolthoff, I.M., (1982) Treatise on Analytical Chemistry, 2nd Ed., , John Wiley & Sons Inc: New YorkMcBride, M.B., (1994) Environmental Chemistry of Soils, , Oxford University Press: New YorkMoolenaar, R.J., Evans, J.C., McKeever, L.D., (1970) J. Phys. Chem., 74, p. 3629Akitt, J.W., Greenwood, N.N., Khandelwal, B.L., Lester, G.D., (1972) J. Chem. Soc. Dalton Trans., p. 604Lima, E.C.O., Neto, J.M.M., Fujiwara, F.Y., Galembeck, F., (1995) J. Colloid Interface Sci., 176, p. 388Cheung, T.T.P., Willcox, K.W., McDaniel, M.P., Johnson, M.M., Bronnimann, C., Frye, J., (1986) J. Catalysis, 102, p. 10Galembeck, F., Lima, E.C.O., Beppu, M.M., Sassaki, R.M., Marson, N.C., Monteiro, V.A.R., Sousa, E.F., (1996) Fine Particles Science and Technology, p. 267. , Pelizetti, E., ed.Kluwer Academic Publishers: DordrechtOliver, S., Kuperman, A., Ozin, G.A., (1998) Angew. Chem. Int. Ed., 37, p. 46Otaigbe, J.U., Beau, G.H., (1997) Trends Polymer Sci., 5, p. 369Hill, R.W., Kehl, W.L., Lynch, T.J., (1981), US pat. 4,289,863Kehl, W.L., (1978), U.S. pat. 4,080,311Climent, M.J., Corma, A., Fornes, V., Guil-Lopez, R., Iborra, S., (2002) Adv. Synth. Catal., 344, p. 1090Pecoraro, T.A., Chan, I.Y., (2000), US pat. 6,022,513Rieser, K., Weber, C., Welsh, W.A., (1997), US pat. 5,698,758Kumar, V.S., Padmasri, A.M., Satyanarayana, C.V.V., Ajit Kumar Reddy, I., David Raju, B., Rama Rao, K.S., (2006) Catal. Commun, 7, p. 745Bautista, F.M., Campelo, J.M., Garcia, A., Leon, R.M., Luna, D., Marinas, J.M., Romero, A.A., (1999) Catal. Lett., 60, p. 145Parida, K., Mishra, T., (1996) J. Colloid Interface Sci., 179, p. 233Bautista, F.M., Campelo, J.M., Garcia, A., Luna, D., Marinas, J.M., Quirós, R.A., Romero, A.A., (2003) Appl. Catal., A, 243, p. 93Gupta, R.K., (1998) Adv. Drug Delivery Rev., 32, p. 155Baylor, N.W., Egan, W., Richman, P., (2002) Vaccine, 20, pp. S18Burrell, L.S., Johnston, C.T., Schulze, D., Klein, J., White, J.L., Hem, S.L., (2001) Vaccine, 19, p. 282Al-Shakhshir, R.H., Regnier, F.E., White, J.L., Hem, S.L., (1995) Vaccine, 13, p. 41Sambasivan, S., Steiner, K.A., (2005), WO 2,005,061,218Sambasivan, S., Steiner, K.A., (2002), US pat 6,461,415Galembeck, F., De Brito, J., (2004), Br PI 0.403.713-8Galembeck, F., De Brito, J., (2006), U.S. Pat. Appl. Publ. 20060045831Giannelis, E.P., (1996) Adv. Mater., 8, p. 29Beppu, M.M., Lima, E.C.O., Galembeck, F., (1996) J. Colloid Interface Sci., 178, p. 93Mendes, L.G., Galembeck, A., Engelsberg, M., Diniz, F.B., (2006) Colloids Surf., A, 281, p. 99Castro, E.G., Zarbin, A.J.G., Galembeck, A., (2005) J. Non-cryst. Solids, 351, p. 3704De Castro, E.G., Zarbin, A.J.G., De Oliveira, H.P., Galembeck, A., (2004) Synth. Met., 146, p. 57Galembeck, A., Silva, S.B.C., Silva, J.A.P., Del Nero, J., (2004) Optical Materials, 24, pp. 637-641Del Nero, J., Silva, J.A.P., Silva, S.B.C., Galembeck, A., (2003) Synth. Met., p. 135De Souza, E.F., Bezerra, C.C., Galembeck, F., (1997) Polymer, 38, p. 6285De Souza, E.F., Da Silva, M.C.V.M., Galembeck, F., (1999) J. Adhes. Sci. Technol., 13, p. 357Zaffe, D., (2005) Micron, 36, p. 583Bohner, M., (2005), WO 2,005,084,726Nagano, M., Nakamura, T., Kokubo, T., Tanahashi, M., Ogawa, M., (1996) Biomaterials, 17, p. 1771Costa, C.A.R., Leite, C.A.P., Souza, E.F., Galembeck, F., (2001) Langmuir, 17, p. 189Costa, C.A.R., Leite, C.A.P., Galembeck, F., (2003) J. Phys. Chem. B, 107, p. 4747Leite, C.A.P., Souza, E.F., Galembeck, F., (2001) J. Braz. Chem. Soc., 12, p. 519Costa, C.A.R., Leite, C.A.P., Galembeck, F., (2006) Langmuir, 22, p. 7159Afeworki, M., Dorset, D.L., Kennedy, G.J., Strohmaier, K.G., (2006) Chem. Mater., 18, p. 1697Kimura, T., (2005) Microporous Mesoporous Mat., 77, p. 97Auerbach, S.M., Ford, M.H., Monson, P.A., (2005) Curr. Opin. Colloid Interface Sci., 10, p. 220De Azevedo, M.M.M., Bueno, M.I.M.S., Davanzo, C.U., Galembeck, F., (2002) J. Colloid Interface Sci., 248, p. 185Lima, E.C.O., Neto, J.M.M., Fujiwara, F.Y., Galembeck, F., (1995) J. Colloid Interface Sci., 176, p. 388Lima, E.C.O., Galembeck, F., (1996) J. Colloid Interface Sci., 166, p. 309Horn, D., Rieger, J., (2001) Angew. Chem. Int. Ed., 40, p. 4330Ratke, L., Voorhees, P.W., (2002) Growth and Coarsening: Ostwald Ripening in Material Processing, , Springer-Verlag Telos: New YorkBabu, G.P., Ganguli, P., Metcalfe, K., Rockliffe, J., Smith, E.G., (1994) J. Mater. Chem., 4, p. 33
Particle And Polymer Microchemistry And Electric Domain Mapping
No full textNew microscopy techniques are increasing accessible, yielding hitherto unavailable information on the spatial distribution of chemical constituents in sub-micron and nanosized particles, as well as in polymer films and other materials; this work describes four relevant examples. First, elemental distribution maps of a polystyrene latex obtained by electron spectroscopy coupled to transmission microscopy (ESI-TEM) show that particle C/S ratio is highly variable, evidencing the large differences in polymer Mw's, in different particles. Second, electric potential maps of latex macrocrystals obtained by scanning electron potential microscopy (SEPM) show negative large islands dispersed in a positive continuum, with large electric potential gradients. Backscattered electron imaging (BEI) evidences a core-and-shell structure of silica particles: the particles are made out of smaller domains with variable average atomic number, concentrated at the particle outer layers. The fourth example is a complex columnar structure of electric domains, in crystalline alumina, obtained by SEPM.374159166Galembeck, F., Souza, E.F., (1999) Polymers Interfaces and Emulsions, , K. Esumi, M. Dekker: New YorkCardoso, A.H., Leite, C.A.P., Galembeck, F., (1998) Langmuir., 14, p. 3187Terris, B.D., Sterm, J.E., Rugar, D., Mamin, H.J., (1990) J. Vac. Sci. Technol., A, 8, p. 374Goldstein, J.I., Newbury, D.E., Echlin, P., Rimig Jr., D.C., Lyman, C.E., Fiori, C., Lifshin, E., (1992) Scanning Electron Microscopy and X-ray Microanalysis, , New York: PlenumBraga, M., Costa, C.A.R., Leite, C.A.P., Galembeck, F., (2001) J. Phys. Chem. B, 15, p. 3005Galembeck, A., Costa, C.A.R., Da Suva, M.C.V.M., Souza, E.F., Galembeck, F., (2001) Polymer, 11, p. 4845Leite, C.A.P., De Souza, E.F., Galembeck, F., (2001) Jornal of the Brazilian Chemical Society, 12, p. 519Costa, C.A.R., Leite, C.A.P., De Souza, E.F., Galembeck, F., (2001) Langmuir, 17, p. 18
Elemental Mapping In Natural Rubber Latex Films By Electron Energy Loss Spectroscopy Associated With Transmission Electron Microscopy
No full textElement distribution maps from Hevea brasiliensis natural rubber latex thin films were obtained, by electron energy-loss spectroscopic imaging in a low-energy (80 kV) transmission electron microscope. C, N, O, P, Na, Ca, Mg, Al, Si, and S maps are presented for latex fractionated by centrifugation, either followed by dialysis or not. Most elements forming non-carbon compounds are concentrated in small, electron-dense spots surrounded by a carbon-rich matrix of polymer, thus showing that the rubber is filled with small particles compatible with the polyisoprene matrix. Ca distribution is unique, since it closely parallels the C distribution, evidencing an important role for -COO--Ca2+-COO- ionic bridges in the structure of natural rubber.741125412546Cyr, D.R., Natural rubber (1984) Encyclopedia of Chemical Technology, 20, p. 468. , Kirk-Othmer: New York(1999) Rubber Stat. Bull., 53Cornish, K., Siler, D.J., (1996) Chemtech, 26, pp. 38-44Sethuraj, M.R., Mathew, N.M., (1992) Natural Rubber: Biology, Cultivation and Technology, , Elsevier Science: AmsterdamTanaka, Y., Tangpakdee, J., (1997) Rubber Chem. Technol., 70, pp. 707-713Gazeley, K.F., Gorton, A.D.T., Pendle, T.D., Latex concentrates: Properties and composition (1988) Natural Rubber Science and Technology, , Roberts, A.D., Ed.Oxford University: New YorkBurfield, D.R., Gan, S.N., (1977) Polymer, 18, pp. 607-611Burfield, D.R., Gan, S.N., (1977) J. Polym. Sci. Polym. Chem., 15, pp. 2721-2730Kawahara, S., Kakubo, T., Sakdapipanich, J.T., Isono, Y., Tanaka, Y., (2000) Polymer, 41, pp. 7483-7488Gan, S.N., Ting, K.F., (1993) Polymer, 34, pp. 2142-2147Cooper, W., (1958) J. Polym. Sci., 28, pp. 195-206Xu, Z.S., Lu, G.H., Cheng, S.Y., (1995) J. Appl. Polym. Sci., 56, pp. 575-580Kim, J.H., Park, Y.J., (1999) Colloids Surf. A, 153, pp. 583-590Chen, G.-N., Chen, K.-N., (1999) J. Appl. Polym. Sci., 71, pp. 903-913Matsuda, H., Minoura, Y., (1979) J. Appl. Polym. Sci., 24, pp. 811-826Sato, K., (1983) Rubber Chem. Technol., 56, pp. 942-958Wiese, H., Rupaner, R., (1999) Colloid Polym. Sci., 217, pp. 372-375Huang, R.Y.M., Wei, Y., (1994) J. Appl. Polym. Sci., 53, pp. 179-185Ben Jar, P.-Y., Wu, Y.S., (1997) Polymer, 38, pp. 2557-2560De, S.K., Antony, P., Bandyopadhyay, S., (2000) Polymer, 41, pp. 787-793Jérôme, R., Moussaf, N., (1999) Polymer, 40, pp. 6831-6839D'Auzac, J., Jacob, J.-L., Chrestin, H., (1989) Physiology of Rubber Tree Latex, , CRC Press: Boca Raton, FLSouthorn, S.A., Yip, E., (1968) J. Rubber Res. Inst. Malaya, 20, pp. 201-215Webster, C.C., Baulkwill, W., (1989) J. Rubber, , Longman: New YorkVerhaar, G., (1973) Processing of Natural Rubber, , Agricultural Services Bulletin: AmsterdamJapan Patent 11,315,165-A, 1999Japan Patent 11,349,731-A, 2000Japan Patent 2,000,001,570-A, 2000Cardoso, A.H., Leite, C.A.P., Galembeck, F., (1998) Langmuir, 14, pp. 3187-3194Cardoso, A.H., Leite, C.A.P., Galembeck, F., (1999) Langmuir, 15, pp. 4447-4453Teixeira-Neto, E., Leite, C.A.P., Cardoso, A.H., Silva, M.C.V., Braga, M., Galembeck, F., (2000) J. Colloid Interface Sci., 231, pp. 182-189Amalvy, J.I., Asua, J.M., Leite, C.A.P., Galembeck, F., (2001) Polymer, 42, pp. 2479-2489Galembeck, A., Costa, C.A.R., Da Silva, M.C.V.M., Souza, E.F., Galembeck, F., (2001) Polymer, 42, pp. 4845-4851Cardoso, A.H., Leite, C.A.P., Galembeck, F., (2001) Colloids Surf. A, 181, pp. 49-55Braga, M., Costa, C.A.R., Leite, C.A.P., Galembeck, F., (2001) J. Phys. Chem. B, 105, pp. 3005-3011Cooke, P.M., (2000) Anal. Chem., 72, pp. 169R-188RPeng, W., Zhou, Z., China Patent 1,230,565-A, 2000Japan Patent 1,1349,731-A, 2000Gu, W., Guo, G., Taiwan Patent 354,797-A, 199
Biphor - Nanotechnology For Waterborne Paint Improvement
No full text[No abstract available]2215662Beppu, M.M., Lima, E.C.D., Sassaki, R.M., Galembeck, F., Self-opacifying aluminum phosphate particles for paint film pigmentation (1997) J. Ctys. Technol., 69 (867), pp. 81-88Lima, E.C.D., Beppu, M.M., Galembeck, F., Valente, J.F., Soares, D.M., Non-crystalline aluminum polyphosphates: Preparation and properties (1996) J. Brazilian Chem. Soc., 7 (3), pp. 209-215Beppu, M.M., Lima, E.C.D., Galembeck, F., Aluminum phosphate particles containing closed pores. Preparation, characterization, and use as a white pigment (1996) J. Colloid Interface Sci., 178 (1), pp. 93-103Monteiro, V.A.D., De Souza, E.F., De Azevedo, M.M.M., Galembeck, F., Aluminum polyphosphate nanoparticles: Preparation, particle size determination and microchemistry (1999) J. Colloid Interface Sci., 217 (2), pp. 237-248De Souza, E.F., Da Silva, M.D.C.V.M., Galembeck, F., Improved latex film-glass adhesion under wet environments by using an aluminum polyphosphate filler (1999) J. Adhes. Sci. Technol., 13 (3), pp. 357-378De Souza, E.F., Bezerra, C.C., Galembeck, F., Bicontinuous networks made of polyphosphates and of thermoplastic polymers (1997) Polymer, 38 (26), pp. 6285-6293Lima, E.C.D., Beppu, M.M., Galembeck, F., Nanosized particles of aluminum polyphosphate (1996) Langmuir, 12 (7), pp. 1701-1703Galembeck, F., (2004) Produto e Processo de Fabricação de Um Pigmento Branco Baseado Na Síntese de Partículas Ocas de Ortofosfato Ou Polifosfato de Alumínio, , Brasil, PI0403713-8Giannelis, E.P., Polymer layered nanocomposites (1996) Adv. Mater., 8 (1), pp. 29-3
Electrostatic Charging Of Dielectrics: New Approaches To Solve Persisting Problems [eletrização De Dielétricos: Novas Propostas Para Resolver Velhos Problemas]
No full textElectrostatic phenomena were discovered long ago but their interpretation according to well-established atomic-molecular theory is still lacking. As a result, electrostatic phenomena are often irreproducible and uncontrolled, causing serious practical problems. Highly reproducible recent experimental results on electrostatic charging from this and other laboratories are reviewed in this work, together with a description of the relevant but not so usual Kelvin probe and Faraday cup techniques. These results support a new model for electrostatic charging of dielectrics and insulated metals, based on the role of moist atmosphere as a charge reservoir.331021032107Maxwell, J.C., (1892) A Treatise on Electricity and Magnetism, 1. , 3rd ed., Dover: New YorkCrowley, J.M., (1999) Fundamentals of Applied Electrostatics, , Laplacian Press: Morgan HillGerhard-Mulhaupt, R., Joseph, M.C., (1999) Electrets, , 3rd ed., Laplacian Press: Morgan HillLungu, M., (2004) Miner. Eng., 17, p. 69Frenot, A., Chronakis, I.S., (2003) Curr. Opin. Colloid Interface Sci., 8, p. 64Moshkin, A.A., Moshkina, S.A., (1997) J. Electrostat, 40-41, p. 681Pähtz, T., Herrmann, H.J., Shinbrot, T., (2010) Nat. Phys., 6, p. 364Schein, L.B., (2007) Science, 316, p. 1572Bailey, A.G., (2001) J. Electrostat, 51-52, p. 82Castle, G.S.P., (1997) J. Electrostat, 40-41, p. 13Németh, E., Albrecht, V., Schubert, G., Simon, F., (2003) J. Electrostat, 58, p. 3Davidson, J.L., Williams, T.J., Bailey, A.G., Hearn, G.L., (2001) J. Electrostat, 51-52, p. 374Chen, G., Tanaka, Y., Takada, T., Zhong, L., (2004) IEEE Trans. Dielectr. Electr. Insul, 11, p. 113Chen, G., Tay, T.Y.G., Davies, A.E., Tanaka, Y., Takada, T., (2001) IEEE Trans. Dielectr. Electr. Insul, 8, p. 867Hogue, M.D., Buhler, C.R., Calle, C.I., Matsuyama, T., Luo, W., Groop, E.E., (2004) J. Electrostat, 61, p. 259Duff, N., Lacks, D.J., (2008) J. Electrostat, 66, p. 51Choi, K.S., Yamaguma, M., Ohsawa, A., (2007) Jpn. J. Appl. Phys., 46, p. 7861Park, A.A., Fan, L.S., (2007) Chem. Eng. Sci., 62, p. 371Vonnegut, B., (1994) Bull. Am. Meteorol. Soc., 75, p. 53Helsdon Jr., J.H., Gattaleeradapan, S., Farley, R.D., Waits, C.C., (2002) J. Geophys. Res., 107, p. 4630Murtomaa, M., Savolainen, M., Christiansen, L., Rantanen, J., Laine, E., Yliruusi, J., (2004) J. Electrostat, 62, p. 63. , http://www.ppoz.pl/wwwold/current.htm, acessada em Outubro 2010http://www.esdjournal.com, acessada em Outubro 2010Giles, M.R., (2003) Org. Process Res. Dev., 7, p. 1048Nonnenmacher, M., Boyle, O.M.P., Wickramasinghe, H.K., (1991) Appl. Phys. Lett., 58, p. 2921Jacobs, H.O., Knapp, H.F., Stemmer, A., (1997) Ultramicroscopy, 69, p. 39Rezende, C.A., Gouveia, R.F., Da Silva, M.A., Galembeck, F., (2009) J. Phys. Condens. Matter., 21, p. 263002Galembeck, A., Costa, C.A.R., Silva, M.C.V.M., Souza, E.F., Galembeck, F., (2001) Polymer., 42, p. 4845Braga, M., Costa, C.A.R., Leite, C.A.P., Galembeck, F., (2001) J. Phys. Chem. B., 105, p. 3005Galembeck, F., Costa, C.A.R., Galembeck, A., Silva, M.C.V.M., (2001) Anais da Academia Brasileira de Ciências, 73, p. 495McCarty, L.S., Winkleman, A., Whitesides, G.M., (2007) J. Am. Chem. Soc., 129, p. 4075McCarty, L.S., Winkleman, A., Whitesides, G.M., (2007) Angew. Chem., Int. Ed., 46, p. 206Jacobs, H.O., Whitesides, G.M., (2001) Science, 291, p. 1763McCarty, L.S., Whitesides, G.M., (2008) Angew. Chem., Int. Ed., 47, p. 2188Gray-Weale, A., Beattie, J.K., (2009) Phys. Chem. Chem. Phys., 11, p. 10994Healy, T.W., Fuerstenau, D.W., (2007) J. Colloid Interface Sci., 309, p. 181Beattie, J.K., Djerdjev, A.M., Warr, G.G., (2009) Faraday Discuss, 141, p. 31Beattie, J.K., (2006) Lab. Chip, 6, p. 1409Liu, C., Bard, A.J., (2009) Chem. Phys. Lett., 480, p. 145Liu, C., Bard, A.J., (2010) Chem. Phys. Lett., 485, p. 231Liu, C., Bard, A.J., (2008) Nat. Mater., 7, p. 505Liu, C., Bard, A.J., (2009) J. Am. Chem. Soc., 131, p. 6397Schrödinger, E., (1910) Tese de Doutorado, , University of Vienna, ÁustriaSeaver, E., (2005) J. Electrostat, 63, p. 203Huertas, M.L., Fontan, J., (1975) Atmos. Environ., 9, p. 1018Adamson, A.W., Gast, A.P., (1997) Physical Chemistry of Surfaces, , 6th ed., Wiley: New Yorkhttp://goldbook.iupac.org/E01992.html, acessada em Outubro 2010Amin, M.S., Peterson, T.F., Zahn, M., (2006) J. Electrostat, 64, p. 424Ovchinnikova, K., Pollack, G.H., (2009) Langmuir, 25, p. 542Corti, H.R., Colussi, A.J., (2009) Langmuir, 25, p. 6587Ovchinnikova, K., Pollack, G.H., (2009) Langmuir, 25, p. 11202Corti, H.R., Colussi, A.J., (2009) Langmuir, 25, p. 11203Grzybowski, B.A., Winkleman, A., Wiles, J.A., Brumer, Y., Whitesides, G.M., (2003) Nat. Mater., 4, p. 241Binning, G., Quate, C.F., Gerber, C., (1986) Phys. Rev. Lett., 56, p. 930Jacobs, H.O., Knapp, H.F., Stemmer, A., (1999) Rev. Sci. Instrum., 70, p. 1756Galembeck, F., Costa, C.A.R., (2006) Em Encyclopedia of Surface and Colloid Science, , Somasundaran, P., ed.Dekker Encyclopedias: New YorkPatrício, P.S.O., Cury, L.A., Silva, G.G., Neves, B.R.A., (2008) Ultramicroscopy, 108, p. 302Braga, M., (2003) Dissertação de Mestrado, , Universidade Estadual de Campinas, BrasilCardoso, A.L.H., (1994) Dissertação de Mestrado, , Universidade Estadual de Campinas, BrasilCardoso, A.H., Leite, C.A.P., Zaniquelli, M.E.D., Galembeck, F., (1998) Colloids Surf. A, 144, p. 207Cardoso, A.H., Leite, C.A.P., Galembeck, F., (1999) Langmuir, 15, p. 4447Teixeira-Neto, E., Galembeck, F., (2002) Colloids Surf. A, 207, p. 147Burgo, T.A.L., (2009) Dissertação de Mestrado, , Universidade Estadual de Campinas, BrasilSoares, L.C., Bertazzo, S., Burgo, T.A.L., Baldim, V., Galembeck, F., (2008) J. Braz. Chem. Soc., 19, p. 277Gouveia, R.F., Costa, C.A.R., Galembeck, F., (2005) J. Phys. Chem. B., 109, p. 4631Gouveia, R.F., Costa, C.A.R., Galembeck, F., (2008) J. Phys. Chem. C, 112, p. 17193Gouveia, R.F., Galembeck, F., (2009) J. Am. Chem. Soc., 131, p. 11381Bernardes, J.S., Rezende, C.A., Galembeck, F., J. Phys. Chem. C, , DOI: 10.1021/jp107291jBernardes, J.S., Rezende, C.A., Galembeck, F., (2010) Abstracts of the 9th International Conference on Electrokinetic Phenomena, , Turku, FinlândiaDucati, T.R.D., Simões, L.H., Galembeck, F., (2010) Langmuir, 26, p. 13763Galembeck, F., Ducati, T.R.D., Gouveia, R.F., Burgo, T.A.L., (2010), Br PI 0905342-5Ducati, T.R.D., Santos, L.P., Simões, L.H., Galembeck, F., (2010) Abstracts of the 9th International Conference on Electrokinetic Phenomena, , Turku, Finlândiahttp://www.kelvinprobe.info/technique-theory.htm, acessada em Junho 2010Noras, M.A., (2002) Trek Application Note 3001, , Trek, Inc.: MedinaZisman, W.A., (1932) Rev. Sci. Instrum., 3, p. 367Murphy, E.L., Good, R.H., (1956) Phys. Rev., 102, p. 1464Galembeck, F., Robilotta, P.R., Pinheiro, E.A., Joekes, I., Bernardes, N., (1980) J. Phys. Chem., 84, p. 11
Acid-basic Site Detection And Mapping On Solid Surfaces At The Nanoscale, By Kelvin Force Microscopy (kfm)
No full textNanoscale electric potential patterns of acid and basic solid surfaces is modified under variable relative humidity, as determined by using Kelvin force microscopy (KFM). The electrostatic potential on acid surfaces becomes more negative as the water vapor pressure increases, while it becomes more positive on basic solids. These results verify the following hypothesis: OH- or H+ ions associated with atmospheric water ion clusters are selectively adsorbed on solid surfaces, depending on the respective Bronsted acid or base character. KFM under variable humidity is thus a rigorous but convenient alternative to determine acid-base character of solid surfaces at the nanoscale, thus contributing to detailed knowledge of particulate matter, which is currently inaccessible to any other method.1912BASF - The Chemical Company,Boeing,K and L Gates,Thermo Scientific,Intellectual Property Insurance Services Corporation (IPISC),ChiNanoTanabe, K., Misono, M., Ono, Y., Hattori, H., (1989) New Solid Acids and Bases: Their Catalytic Properties, Studies in Surface Science and Catalysis, 51. , Elsevier Science Publishing Company Inc, New YorkTanabe, K., Hölderich, W.F., (1999) Appl. Catal. A: Gen., 181, p. 399Hattori, H., (1995) Chem. Rev., 95, p. 537Gouveia, R.F., Bernardes, J.S., Ducati, T.R.D., Galembeck, F., (2012) Anal. Chem., 84, p. 10191J. De Brito, F. Galembeck, R. Rosseto, A. C. M. A. Dos Santos, PCT Int. Appl. WO 2008/017135, 2008Stöber, W., Fink, A., Bohn, E., (1968) J. Colloid Interface Sci., 26, p. 62Nonnenmacher, M., O'Boyle, M.P., Wickramasinghe, H.K., (1991) Appl. Phys. Lett., 58, p. 2921Gouveia, R.F., Galembeck, F., (2009) J. Am. Chem. Soc., 131, p. 1138
Polymer Electrostatics: Detection And Speciation Of Trapped Electric Charges By Electric Probe And Analytical Electron Microscopy
No full textThis work reviews new probe and electron microscopy approaches for the detection of charged domains in insulating polymers, as well as for the identification of the charge-bearing species: scanning electric potential microscopy (SEPM), electric force microscopy (EFM) and energy-loss spectroscopy imaging in the transmission electron microscope (ESI-TEM). The SEPM and EFM micrographs show patterned domains bearing excess electric charges and extending for tens of nanometers, in polymer latex particles and films. The charged species are identified by ESI-TEM as emulsion polymerization initiator and surfactant residues, as well as the associated counter-ions. Charged domains are also observed in common thermoplastic polymers, producing unexpectedly large electric potential gradients.1891526Galembeck, A., Costa, C.A.R., Silva, M.C.V.M., Souza, E.F., Galembeck, F., (2001) Polymer, 42, p. 4845Wu, K., Iedema, M.J., Cowin, J.P., (1999) Science, 286, p. 2482Bauer-Gogonea, S., Gerhard-Multhaupt, R., (1996) IEEE Trans Dielectr Electr Insul, 3, p. 677Malecki, J.A., (1999) Phys Rev B, 59, p. 9954Lacabanne, C., Goyaud, P., Boyer, R.F., (1980) Polym Sci J, 18, p. 277Shrivastava, K., Ranade, J.D., Srivastava, A.P., (1980) Thin Solid Films, 67, p. 201Mudarra, M., Belana, J., Cañadas, J.C., Diego, J.A., (1999) Polymer, 40, p. 2569Skinner, S.M., Svage, R.L., Rutzler J.E., Jr., (1953) Appl Phys J, 24, p. 438Skinner, S.M., (1955) Appl Phys J, 26, p. 509Ribeiro, J.C., (1950) An Acad Bras Cienc, 22, p. 325Eyerer, P., (1972) Adv Colloid Interface Sc, 3, p. 223Rollik, D., Bauer, S., Gerhard-Multhaupt, R., (1999) J Appl Phys, 85, p. 3282Terris, B.D., Stern, J.E., Rugar, D., Mamin, H.J., (1980) J Vac Sci Technol A-Vac Surf Films, 8, p. 374Nonnenmacher, M., O'Boyle, M.P., Wickramasinghe, H.K., (1991) Appl Phys Lett, 58, p. 2921Saurenbach, F., Terris, B.D., (1990) Appl Phys Lett, 56, p. 1703Schmidt, W.F., (1997) Liquid State Electronics of Insulating Liquids, , CRC Press, Boca Raton N.YGalembeck, F., Costa, C.A.R., Galembeck, A., Silva, M.C.V.M., (2001) An AcadBras Cienc, 73, p. 495Moita-Neto, J.M., Monteiro, V.A.R., Galembeck, F., (1996) Colloids Surf A, 108, p. 83Braga, M., Costa, C.A.R., Leite, C.A.P., Galembeck, F., (2001) J Phys Chem B, 105, p. 3005Keslarek, A.J., Costa, C.A.R., Galembeck, F., (2001) Langmuir, 17, p. 7886Cardoso, A.H., Leite, C.A.P., Galembeck, F., (1998) Langmuir, 14, p. 3187Nunes, S.P., Galembeck, F., (1983) J Polym Sci Part C - Polym Lett, 21, p. 49Heinicke, G., (1984) Tribochemistry, , Hanser, Berli
Detection Of Charge Distributions In Insulator Surfaces
No full textCharge distribution in insulators has received considerable attention but still poses great scientific challenges, largely due to a current lack of firm knowledge about the nature and speciation of charges. Recent studies using analytical microscopies have shown that insulators contain domains with excess fixed ions forming various kinds of potential distribution patterns, which are also imaged by potential mapping using scanning electric probe microscopy. Results from the authors' laboratory show that solid insulators are seldom electroneutral, as opposed to a widespread current assumption. Excess charges can derive from a host of charging mechanisms: excess local ion concentration, radiochemical and tribochemical reactions added to the partition of hydroxonium and hydronium ions derived from atmospheric water. The last factor has been largely overlooked in the literature, but recent experimental evidence suggests that it plays a decisive role in insulator charging. Progress along this line is expected to help solve problems related to unwanted electrostatic discharges, while creating new possibilities for energy storage and handling as well as new electrostatic devices. © IOP Publishing Ltd.2126Maxwell, J.C., (1892) A Treatise on Electricity and Magnetism, 1Schein, L.B., (1992) Electrophotography and Development PhysicsGerhard-Mulhaupt, R., Joseph, M.C., (1999) ElectretsSessler, G.M., (2001) J. Electrostat., 51-52, p. 137Kressmann, R., Sessler, G.M., Günther, P., (1996) IEEE Trans. Dielectr. Electr. Insul., 3 (5), p. 607Taylor, M.D., Seeker, P.E., (1994) Industrial Electrostatics: Fundamentals and MeasurementsFrenot, A., Chronakis, I.S., (2003) Curr. Opin. Colloid Interface Sci., 8 (1), pp. 64-75Moshkin, A.A., Moshkina, S.A., (1997) J. Electrostat., 40-41, p. 681Lowell, J., Rose-Innes, A.C., (1980) Adv. Phys., 29 (6), p. 947Schein, L.B., (2007) Science, 316 (5831), p. 1572Bailey, A.G., (2001) J. Electrostat., 51-52, p. 82Giles, M.R., (2003) Org. Process Res. Dev., 7 (6), p. 1048http://www.esdjournal.comTaillet, J., (2003) Powder Technol., 135-136, p. 201Rowley, G., (2001) Int. J. Pharm., 227 (1-2), p. 47http://www.esda.orgSchein, L.B., La Ha, M., Marshall, G., (1991) J. Appl. Phys., 69 (10), p. 6817Castle, G.S.P., (1997) J. Electrostat., 40-41, p. 13Teyssedre, G., Laurent, C., (2005) IEEE Trans. Dielectr. Electr. Insul., 12 (5), p. 857Montanari, G.C., Morshuis, P.H.F., (2005) IEEE Trans. Dielectr. Electr. Insul., 12 (4), p. 754Castle, G.S.P., Schein, L.B., (1995) J. Electrostat., 36 (2), p. 165Chen, G., Tanaka, Y., Takada, T., Zhong, L., (2004) IEEE Trans. Dielectr. Electr. Insul., 11 (1), p. 113McCarty, L.S., Whitesides, G.M., (2008) Angew. Chem. Int. Edn, 47 (12), p. 2188Liu, C., Bard, A.J., (2008) Nat. Mater., 7 (6), p. 505Perrin, C., Griseri, V., Inguimbert, C., Laurent, C., (2008) J. Phys. D: Appl. Phys., 41 (20), p. 205417Griffiths, D.J., (1999) Introduction to ElectrodynamicsSoares, L.C., Bertazzo, S., Burgo, T.A.L., Baldim, V., Galembeck, F., (2008) J. Braz. Chem. Soc., 19, p. 277Yovcheva, T.A., Mekishev, G.A., Marinov, A.T., (2004) J. Phys.: Condens. Matter, 16 (3), p. 455Hogue, M.D., Buhler, C.R., Calle, C.I., Matsuyama, T., Luo, W., Groop, E.E., (2004) J. Electrostat., 61 (3-4), p. 259Folan, L.M., Arnold, S., O'Keeffe, T.R., Spock, D.E., Schein, L.B., Diaz, A.F., (1990) J. Electrostat., 25 (2), p. 155Németh, E., Albrecht, V., Schubert, G., Simon, F., (2003) J. Electrostat., 58 (1-2), p. 3Reichardt, C., (1994) Chem. Rev., 94 (8), p. 2319El Seoud, O.A., Fidale, L.C., Ruiz, N., D'Almeida, M.L., Frollini, E., (2008) Cellulose, 15 (3), p. 371Spange, S., Reuter, A., Ludba, D., (1999) Langmuir, 15 (6), p. 2103Bauer, S., Bauer-Gogonea, S., (2003) IEEE Trans. Dielectr. Electr. Insul., 10 (5), p. 883Collins, R.E., (1980) J. Appl. Phys., 51 (6), p. 2973Cernomorcenco, A., Notingher, P., (2008) Appl. Phys. Lett., 93 (19), p. 192903Palowski, T., Fleming, R.J., Lang, S.B., (2006) IEEE Trans. Dielectr. Electr. Insul., 13 (5), p. 1023Afanasjev, V.P., Petrov, A.A., Pronin, I.P., Tarakanov, E.A., Ju Kaptelov, E., Graul, J., (2001) J. Phys.: Condens. Matter, 13 (39), p. 8755Takada, T., (1999) IEEE Trans. Dielectr. Electr. Insul., 6 (5), p. 519Holé, S., Sylvestre, A., Gallot-Lavallée, O., Guillermin, C., Rain, P., Rowe, S., (2006) J. Phys. D: Appl. Phys., 39 (5), p. 950Paris, O., Lewiner, J., Ditchi, T., Holé, S., Alquié, C., (2000) IEEE Trans. Dielectr. Electr. Insul., 7 (4), p. 556Mizutani, T., (1994) IEEE Trans. Dielectr. Electr. Insul., 1 (5), p. 923Maeno, T., Futami, T., Kushibe, H., Takada, T., Cooke, C.M., (1998) IEEE Trans. Electr. Insul., 23 (3), p. 433Migliori, A., Thompson, J.D., (1980) J. Appl. Phys., 51 (1), p. 479Rozno, A.G., Gromov, V.V., (1986) IEEE Trans. Electr. Insul., 21, p. 417Gégot, F., Callegari, T.H., Aillerie, M., Boeuf, J.P., (2008) J. Phys. D: Appl. Phys., 41 (13), p. 135204Okubo, H., Wakamatsu, M., Inoue, N., Kato, K., Koide, H., (2003) IEEE Trans. Dielectr. Electr. Insul., 10 (6), p. 956Martin, B., Kliem, H., (2008) IEEE Trans. Dielectr. Electr. Insul., 15 (2), p. 560Nonnenmacher, M., O'Boyle, M.P., Wickramasinghe, H.K., (1991) Appl. Phys. Lett., 58 (25), p. 2921Jacobs, H.O., Knapp, H.F., Stemmer, A., (1999) Rev. Sci. Instrum., 70 (3), p. 1756Liscio, A., Palermo, V., Müllen, K., Samor, P., (2008) J. Phys. Chem., 112 (44), p. 17368Cunningham, S., (1996) Appl. Phys. Lett., 69 (23), p. 3605Lambert, J., Guthmann, C., Saint-Jean, M., (2003) J. Appl. Phys., 93 (9), p. 5369Marchi, F., Dianoux, R., Smilde, H.J.H., Mur, P., Comin, F., Chevrier, J., (2008) J. Electrostat., 66 (9-10), p. 538Gong, H., Ong, C.K., (1997) J. Phys.: Condens. Matter, 9 (7), p. 1631Bigarré, J., Attard, C., Hourquebie, P., Matallana, J., (2001) IEEE Trans. Dielectr. Electr. Insul., 8 (6), p. 942Gerhard-Mulhaupt, R., Künstler, W., Eberle, G., Eisenmenger, W., Yang, G., (1998) Space Charge in Solid Dielectric, p. 123Bloss, P., Dereggi, A.S., Yang, G.M., Sessler, G.M., Schafer, H., (2000) J. Phys. D: Appl. Phys., 33 (4), p. 430Bloss, P., Steffen, M., Schaffer, H., Yang, G.M., Sessler, G.M., (1997) J. Phys. D: Appl. Phys., 30 (11), p. 1668Alquié, C., Dreyfus, G., Lewiner, J., (1981) Phys. Rev. Lett., 47 (20), p. 1483Takada, T., Miyake, H., Tanaka, Y., (2006) IEEE Trans. Plasma Sci., 34 (5), p. 2176Mellinger, A., Flores-Surez, R., Singh, R., Wegener, M., Wirges, W., Gerhard, R., Lang, S.B., (2008) Int. J. Thermophys., 29 (6), p. 2046Lang, S.B., Das-Gupta, D.K., (1986) J. Appl. Phys., 59 (6), p. 2151Wubbenhorst, M., Hornsby, J., Stachen, M., Das-Gupta, D.K., Bulinski, A., Bamji, S., (1998) IEEE Trans. Dielectr. Electr. Insul., 5 (1), p. 9Marin-Franch, P., Tunnicliffe, D.L., Das-Gupta, D.K., (2001) Mater. Res. Innov., 4 (5-6), p. 334Fleming, R.J., Pawlowski, T., Ammala, A., Casey, P.S., Lawrence, K.A., (2005) IEEE Trans. Dielectr. Electr. Insul., 12 (4), p. 745Fleming, R.J., Ammala, A., Casey, P.S., Lang, S.B., (2008) IEEE Trans. Dielectr. Electr. Insul., 15 (1), p. 118Cecelja, F., Bordovsky, M., Balachandran, W., (2002) IEEE Trans. Instrum. Meas., 51 (2), p. 282Zahn, M., Hikita, M., Wirght, K.A., Cooke, C.M., Brennan, J., (1987) IEEE Trans. Electr. Insul., 22, p. 181Ahmed, N.H., Srinivas, N.N., (1997) IEEE Trans. Dielectr. Electr. Insul., 4 (5), p. 644Cardoso, A.H., Leite, C.A.P., Galembeck, F., (1998) Langmuir, 14 (12), p. 3187Cardoso, A.H., Leite, C.A.P., Galembeck, F., (1999) Langmuir, 15 (13), p. 4447Egerton, R.F., (1986) Electron Energy-Loss Spectroscopy in the Electron MicroscopeBotton, G., Analytical electron microscopy (2007) Science of Microscopy, p. 273Amalvy, J.I., Percy, M.J., Armes, S.P., Leite, C.A.P., Galembeck, F., (2005) Langmuir, 21 (4), p. 1175Ottensmeyer, F.P., (1984) J. Ultrastruct. Res., 88 (2), p. 121Shuman, H., Chang, C.F., Somlyo, A.P., (1986) Ultramicroscopy, 19 (2), p. 121Linares, E.M., Leite, C.A.P., Valadares, L.F., Silva, C.A., Rezende, C.A., Galembeck, F., (2009) Anal. Chem., 81 (6), p. 2317Bulliard, C., Allan, M., Leach, S., (1993) Chem. Phys. Lett., 209 (5-6), p. 434Leapman, R.D., (2003) J. Microsc., 210 (1), p. 5Leite, C.A.P., Galembeck, F., (2001) J. Colloid Interface Sci., 235 (1), p. 4Valadares, L.F., Bragança, F.D.C., Silva, C.A., Leite, C.A.P., Galembeck, F., (2007) J. Colloid Interface Sci., 309 (1), p. 140Galembeck, F., Costa, C.A.R., Galembeck, A., Silva, M.C.V.M., (2001) An. Acad. Bras. Cienc., 73 (4), p. 495Thomson, W., (1898) Phil. Mag., 46, p. 82Zisman, W.A., (1932) Rev. Sci. Instrum., 3 (7), p. 367Galembeck, F., Costa, C.A.R., (2006) Encyclopedia of Surface and Colloid Science, p. 1874Cheran, L.E., Thompson, M., (2004) Analyst, 129 (5), p. 406Yee, S., Oriani, R.A., Stratmann, M., (1991) J. Electrochem. Soc., 138 (1), p. 55Thompson, M., Cheran, L.E., Zhang, M., Chacko, M., Huo, H., Sadeghi, S., (2005) Biosens. Bioelectron., 20 (8), p. 1471Jacobs, H.O., Knapp, H.F., Müller, S., Stemmer, A., (1997) Ultramicroscopy, 69 (1), p. 39Mizsei, J., (2002) Solid-State Electron., 46 (2), p. 235Jankov, I.R., Szente, R.N., Goldman, I.D., Carreno, M.N.P., Valle, M.A., Behar, M., Costa, C.A.R., Landers, R., (2005) Surf. Coat. Technol., 200 (1-4), p. 254Li, W., Li, D.Y., (2005) J. Chem. Phys., 122 (6), p. 064708Jacobs, H.O., Leuchtmann, P., Homan, O.J., Stemmer, A., (1998) J. Appl. Phys., 84 (3), p. 1168Mizsei, J., (1998) Sensors Actuators, 48 (1-3), p. 300Cheran, L.E., McGovern, M.E., Thompson, M., (2000) Faraday Discuss., 116, p. 23McCarty, L.S., Winkleman, A., Whitesides, G.M., (2007) Angew. Chem. Int. Edn, 46 (1-2), p. 206Jacobs, H.O., Whitesides, G.M., (2001) Science, 291 (5509), p. 1763McCarty, L.S., Winkleman, A., Whitesides, G.M., (2007) J. Am. Chem. Soc., 129 (13), p. 4075Barry, C.R., Gu, J., Jacobs, H.O., (2005) Nano Lett., 5 (10), p. 2078Stemmer, A., Ziegler, D., Seemann, L., Rychen, J., Naujoks, N., (2008) J. Phys.: Conf. Ser., 142, p. 012048He, T., Ding, H., Peor, N., Naama, P., Lu, M., Corley, D.A., Chen, B., Tour, J.M., (2008) J. Am. Chem. Soc., 130 (5), p. 1699Taylor, D.M., Morris, D., Cambridge, J.A., (2004) Appl. Phys. Lett., 85 (22), p. 5266Keslarek, A.J., Costa, C.A.R., Galembeck, F., (2001) Langmuir, 17 (25), p. 7886Galembeck, A., Costa, C.A.R., Silva, M.C.V.M., Souza, E.F., Galembeck, F., (2001) Polymer, 42 (11), p. 4845Sahli, S., Bellel, A., Ziari, Z., Kahlouche, A., Segui, Y., (2003) J. Electrostat., 57 (2), p. 169Braga, M., Costa, C.A.R., Leite, C.A.P., Galembeck, F., (2001) J. Phys. Chem., 105 (15), p. 3005Gouveia, R.F., Costa, C.A.R., Galembeck, F., (2005) J. Phys. Chem., 109 (10), p. 4631Gouveia, R.F., Costa, C.A.R., Galembeck, F., (2008) J. Phys. Chem., 112 (44), p. 17193Dongmo, H., Carlotti, J.F., Bruguier, G., Guasch, C., Bonnet, J., Gasiot, J., (2003) Appl. Surf. Sci., 212-213, p. 607Ben Nasr, T., Kamoun, N., Guasch, C., (2006) Mater. Chem. Phys., 96 (1), p. 84Prasse, T., Ivankov, A., Sandler, J., Schulter, K., Baughofer, W., (2001) J. Appl. Polym. Sci., 82 (13), p. 3381Cheran, L.E., Cheung, S., Wang, X., Thompson, M., (2008) Electrochim. Acta, 53 (23), p. 6690Kikukawa, A., Hosaka, S., Imura, R., (1995) Appl. Phys. Lett., 66 (25), p. 3510Weaver, J.M.R., Abraham, D.W., (1991) J. Vac. Sci. Technol., 9 (3), p. 1559Gouveia, R.F., Galembeck, F., (2009)Rigden, J.S., (1996) Macmillan Encyclopedia of PhysicsDerjaguin, B.V., Smilga, V.P., (1967) J. Appl. Phys., 38 (12), p. 4609Derjaguin, B.V., Krotova, N.A., Smilga, V.P., (1978) Adhesion of SolidsWu, S., (1982) Polymer Interface and AdhesionValadares, L.F., Leite, C.A.P., Galembeck, F., (2006) Polymer, 47 (2), p. 672Boss, S.L.B., Caluzi, J.J., (2007) Rev. Bras. Ens. Fis., 29 (4), p. 635Diaz, A.F., Felix-Navarro, R.M., (2004) J. Electrostat., 62 (4), p. 277Heinicke, G., (1984) TribochemistryCamara, C.G., Escobar, J.V., Hird, J.R., Putterman, S.J., (2008) Nature, 455 (7216), p. 1089Dole, M., (1973) The Radiation Chemistry of MacromoleculesDe Barros, R.A., Azevedo, W.M., (2008) Synth. Met., 158 (21-24), p. 922Rocha, R.M., Moura, E.A.B., Bressiani, A.H.A., Bressiani, J.C., (2008) J. Mater. Sci., 43 (13), p. 4466Son, C., Ziaie, B., (2006) IEEE Electron Device Lett., 27 (11), p. 884Parada, M.A., Minamisawa, R.A., Moreira, M.V., De Almeida, A., Muntele, I., Ila, D., (2007) Surf. Coat. Technol., 201 (19-20), p. 8246Das-Gupta, D.K., Schmidt, W.F., (1995) IEEE Trans. Compon. Packag. Manufact. Technol., 18 (2), p. 266Das-Gupta, D.K., (1992) IEEE Trans. Electr. Insul., 27 (5), p. 909Kotrappa, P., (2005) Health Phys., 89 (2), p. 164Giacometti, J.A., Oliveira, O.N., (1992) IEEE Trans. Electr. Insul., 27 (5), p. 924Bakhoum, S.F.W., Agnes, G.R., (2005) Anal. Chem., 77 (10), p. 3189Eberlin, L.S., Xia, Y., Chen, H., Cooks, R.G., (2008) J. Am. Soc. Mass Spectrom., 19 (12), p. 1897Waltman, M.J., Dwivedi, P., Hill, H.H., Blanchard, W.C., Ewing, R.G., (2008) Talanta, 77 (1), p. 249Reagan, M.A., Kashyn, D., Juhl, S., Vaia, R.A., Lyuksyutov, S.F., (2008) Appl. Phys. Lett., 93 (3), p. 033109Ressier, L., Le Nader, V., (2008) Nanotechnology, 19 (13), p. 135301Diaz, A.F., Fenzel-Alexander, D., (1993) Langmuir, 9 (4), p. 1009Diaz, A.F., (1998) J. Adhes., 67 (1), p. 111Law, K.Y., Tarnawskyj, I.W., Salamida, D., (1998) J. Imaging Sci. Technol., 42, p. 465Medley, J.A., (1953) Nature, 171 (4363), p. 1077Diaz, A.F., Wollmann, D., Dreblow, D., (1991) Chem. Mater., 3 (6), p. 997Mizes, H.A., Conwell, E.M., Salamida, D.P., (1990) Appl. Phys. Lett., 56 (16), p. 1597Law, K.Y., Tarnawskyj, I.W., Salamida, D., Debies, T., (1995) Chem. Mater., 7 (11), p. 2090Schröndiger, E., (1910) PhD ThesisSeaver, E., (2005) J. Electrostat., 63 (3-4), pp. 203-222Turov, V.V., Mironyuk, I.F., (1998) Colloids Surf., 134 (3), p. 257Patton, S.T., Cowan, W.D., Eapen, K.C., Zabinski, J.S., (2000) Tribol. Lett., 9, p. 199Healy, T.W., Fuerstenau, D.W., (2007) J. Colloid Interface Sci., 309 (1), p. 183Huertas, M.L., Fontan, J., (1975) Atmos. Environ., 9 (11), p. 1018Vonnegut, B., (1994) Bull. Am. Meteorol. Soc., 75 (1), p. 53Hunter, R.J., (1981) Zeta Potential in Colloid Science Principles and ApplicationsBanic, C.M., Iribarne, J.V., (1985) J. Chem. Phys., 83 (12), p. 6432Ovchinnikova, K., Pollack, G.H., (2009) Langmuir, 25 (1), p. 542Lee, L.T., Silva, M.C.V., Galembeck, F., (2003) Langmuir, 19 (17), p. 6717Lee, L.T., Leite, C.A.P., Galembeck, F., (2004) Langmuir, 20 (11), p. 4430Cardoso, A.H., Leite, C.A.P., Zaniquelli, M.E.D., Galembeck, F., (1998) Colloids Surf., 144 (1-3), p. 207Braga, M., Costa, C.A.R., Leite, C.A.P., Galembeck, F., (2001) J. Phys. Chem., 105 (15), p. 3005Teixeira-Neto, E., Galembeck, F., (2002) Colloids Surf., 207 (1-3), p. 147Santos, J.P., Pascale, C., Wong, K., Galembeck, F., (2004) Langmuir, 20 (24), p. 10576Stöber, W., Fink, A., Bohn, E., (1968) J. Colloid Interface Sci., 26 (1), p. 62Costa, C.A.R., Leite, C.A.P., Souza, E.F., Galembeck, F., (2001) Langmuir, 17 (1), p. 189Wu, K., Iedema, M.J., Cowin, J.P., (1999) Science, 286 (5449), p. 248
Esi-tem Imaging Of Surfactants And Ions Sorbed In Stöber Silica Nanoparticles
No full textThe sorption of surfactants and NaCl in silica nanosized particles creates unexpected spatial distributions of solutes that were evidenced by electron spectroscopy imaging in the transmission electron microscope (ESI/TEM). The spectral images show that simple ions (Na+, Cl-, Br -) are actually absorbed within the particles irrespective of their charges, while surfactant chains are adsorbed at the particle surfaces. The expected effect of the surfactants on particle aggregation is also observed in the micrographs. In the case of salt, close-packed silica particle arrays are formed at low ionic strength, but only coarse aggregates form at higher salt concentrations. The particles absorb both Na+ and Cl- ions in similar amounts, from 0.5 mol L-1 NaCl, but Na+ ions are depleted from the particles' immediate outer vicinity, where Cl- ions are in turn accumulated. These results confirm that Stöber silica nanoparticles are highly porous and reveal their potential usefulness as carriers of small molecules and ions, due to the small particle size, exceptional colloidal stability, and this newly found sorption behavior. © 2006 American Chemical Society.221771597166Bjelopavlic, M., Singh, P.K., El-Shall, H., Moudgil, B.M., (2000) J. Colloid Interface Sci., 226, pp. 159-165Pasquato, L., Pengo, P., Scrimin, P., (2005) Supramol. Chem., 17, pp. 163-171Phadtare, S., Vinod, V.P., Wadgaonkar, P.P., Rao, M., Sastry, M., (2004) Langmuir, 20, pp. 3717-3723Piech, M., Walz, J.Y., (2004) J. Phys. Chem. B, 108, pp. 9177-9188Bailey, R.E., Nie, S.M., (2003) J. Am. Chem. Soc., 125, pp. 7100-7106Manciu, F.S., Tallman, R.E., McCombe, B.D., Weinstein, B.A., Lucey, D.W., Sahoo, Y., Prasad, P.N., (2005) Phys. E, 26, pp. 14-18Lu, S.W., Sohling, U., Mennig, M., Schmidt, H., (2002) Nanotechnology, 13, pp. 669-673Caruso, F., Lichtenfelf, H., Giersig, M., Möhwald, H., (1998) J. Am. Chem. Soc., 120, pp. 8523-8524Galembeck, F., Lima, E.C.O., Massen, N.C., Monteiro, V.A.R., Souza, E.F., (1996) Fine Particles Science and Technology: from Micro- to Nanoparticles, pp. 267-279. , Pelizzetti, E., Ed.Kluwer: Dordrecht, The NetherlandsChen, Y., Ford, W.T., Materer, N.F., Teeters, D., (2000) J. Am. Chem. Soc., 122, pp. 10472-10473Pan, G.S., Tse, A.S., Kesavamoorthy, R., Asher, S.A., (1998) J. Am. Chem. Soc., 120, pp. 6518-6524Mori, H., Müller, A.H.E., Klee, J.E., (2003) J. Am. Chem. Soc., 125, pp. 3712-3713Stöber, W., Fink, A., Bohn, E., (1968) J. Colloid Interface Sci., 26, pp. 62-69Hardikar, V.V., Matrjevic, E., (2000) J. Colloid Interface Sci., 227, pp. 133-136Chabanov, A.A., Jun, Y., Norris, D.J., (2004) Appl. Phys. Lett., 84, pp. 3573-3575Pontoni, D., Narayanan, T., Rennie, A.R., (2002) Langmuir, 18, pp. 56-59Green, D.L., Lin, J.S., Lam, Y.F., Hu, M.Z.C., Schaefer, D.W., Harris, M.T., (2003) J. Colloid Interface Sci., 255, pp. 346-358Tolnai, G., Csempesz, F., Kabai-Faix, M., Kalman, E., Keresztes, Z., Kovacs, A.L., Rambsden, J.J., Horvolgyi, Z., (2001) Langmuir, 17, pp. 2683-2687Liu, J., Pelton, R., Hrymak, A.N., (2000) J. Colloid Interface Sci., 227, pp. 408-411Kobayashi, Y., Katakami, H., Mine, E., Nagao, D., Konno, M., Liz-Marzan, L.M., (2005) J. Colloid Interface Sci., 283, pp. 392-396Costa, C.A.R., Leite, C.A.P., Souza, E.F., Galembeck, F., (2001) Langmuir, 17, pp. 189-194Costa, C.A.R., Leite, C.A.P., Galembeck, F., (2003) J. Phys. Chem. B, 107, pp. 4747-4755Leite, C.A.P., Souza, E.F., Galembeck, F., (2001) J. Braz. Chem. Soc., 12, pp. 519-525Iler, R.K., (1979) The Chemistry of Silica, , Wiley. New YorkJain, T.K., Roy, I., De, T.K., Maitra, A., (1998) J. Am. Chem. Soc., 120, pp. 11092-11095Kulak, A., Hall, S.R., Mann, S., (2004) Chem. Commun., 5, pp. 576-577Bauer, D., Buchhammer, H., Fuchs, A., Jaeger, W., Killmann, E., Lunkwitz, K., Rehmet, R., Schwarz, S., (1999) Colloids Surf., A, 156, pp. 291-305Oh, M.H., So, J.H., Lee, J.D., Yang, S.M., (1999) Korean J. Chem. Eng., 16, pp. 532-537Suratwala, T., Hanna, M.L., Whitman, P., (2004) J. Non-cryst. Solids, 349, pp. 368-376Kim, D.Y., Kowach, G.R., Johnson, D.W., Bhandarkar, S., Du, H., (2004) J. Non-cryst. Solids, 342, pp. 18-24Ohno, T., Suzuki, H., Takahashi, J., Shimada, S., Ota, T., Takahashi, M., Hikichi, Y., (2002) Key Eng. Mater., 206, pp. 2185-2188Amalvy, J.I., Percy, M.J., Armes, S.P., Leite, C.A.P., Galembeck, F., (2005) Langmuir, 21, pp. 1175-1179Phan, T.N.T., Louvard, N., Bachiri, S.A., Perselho, J., Foissy, A., (2004) Colloids Surf., 244, pp. 131-140Gabriel, U., Charlet, L., Schlapfer, C.W., Vial, J.C., Brachmann, A., Geipel, G., (2001) J. Colloid Interface Sci., 239, pp. 358-368Dekany, I., Nemeth, J., Szekeres, M., Schoonheydt, R., (2003) Colloid Polym. Sci., 282, pp. 1-6Wang, Z., Friedrich, D.M., Bersersluis, M.R., Hemmer, S.L., Joly, A.G., Huesemann, M.H., Truex, M.I., Peyton, B.M., (2001) Environ. Sci. Technol., 35, pp. 2710-2716Bhosale, S., Wang, T.Y., Li, G.T., Siggel, U., Fuhrhop, J.H., (2004) J. Am. Chem. Soc., 126, pp. 13111-13118Ozkaya, D., Zhou, W., Thomas, I.M., Midgley, P., Keast, V.J., Hermans, S., (1999) Catal. Lett., 60, pp. 113-120Qalembeck, F., Souza, E.F., (1999) Polymer Interfaces and Emulsions, pp. 119-166. , Esumi, K., Ed.Marcel Dekker: New YorkRosemary, M.I., MacLeren, I., Pradeep, T., (2004) Carbon, 42, pp. 2352-2356Rippel, M.M., Leite, C.A.P., Lee, L.T., Galembeck, F., (2005) Colloid Polym. Sci., 283, pp. 570-574Sun, X.H., Li, C.P., Wong, W.K., Wong, N.B., Lee, C.S., Lee, S.T., Leo, B.K., (2002) J. Am. Chem. Soc., 124, pp. 14464-14471Wiacek, A., Chibowski, E., (2000) Colloids Surf., B, 17, pp. 175-190Soltys, A., Lazarz, M., Chibowski, E., (1997) Colloids Surf., A, 127, pp. 163-173Castaing, R., Hennenquin, J.F., Henry, L., Slodzian, G., The magnetic prism as an optical system (1967) Focusing of Charged Particles, pp. 265-293. , Septier, A., Ed.Academic Press: New YorkEgerton, R.F., (1986) Electron Energy-loss Spectroscopy in the Electron Microscope, , Plenum PressNew YorkReimer, L., Zepke, U., Moesch, J., Schulze-Hillert, S., Ross-Messemer, M., Probst, W., Weimer, E., (1992) EELS Spectroscopy: A Reference Handbook of Standard Data for Identification and Interpretation of Electron Energy-loss Spectra and for Generation of Electron Spectroscopic Images, , Carl Zeiss: Oberkochen, GermanyProbst, W., personal communicationJoy, D.C., (1986) Principles of Analytical Electron Microscopy, p. 256. , Plenum Press: New YorkPrinciples of Analytical Electron Microscopy, 50, p. 20Kiraly, Z., Tun, L., Dekany, I., Bean, K., Vincent, B., (1995) Magy. Kem. Foly., 101, pp. 501-510Denkov, N.D., Velev, O.D., Kralchevsky, P.A., Ivanov, I.B., Yoshimura, H., Nagayama, K., (1992) Langmuir, 8, pp. 3183-3190Cardoso, A.H., Leite, C.A.P., Galembeck, F., (2001) Colloids Surf., A, 181, pp. 49-55Szekeres, M., Tóth, J., Dékány, I., (2002) Langmuir, 18, pp. 2678-2685Goncalves, M.D., Marques, G.D.S., Galembeck, F., (1983) Sep. Sci. Technol., 18, pp. 893-904Wiese, H., Rupaner, R., (1999) Colloid Polym. Sci., 277, pp. 372-375Kazakov, S.V., Kaholek, M., (2002) Proc. SPIE Int. Soc. Opt. Eng., 4695, pp. 42-51Lee, L.-T., Leite, C.A.P., Galembeck, F., (2004) Langmuir, 20, pp. 4430-4435Galembeck, F., Costa, C.A.R., Galembeck, A., Silva, M.D.C.V.M., (2001) An. Acad. Bras. Ciênc., 73, pp. 495-51
- …
