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Restoration of short voltage glitches by deconvolution for the diagnosis of IC failures using EBT
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About the number of records to be acquired for histogram testing of A/D converters using synchronous sinewave and clock generators
No full textCross-correlation noise measurements in A/D converters
No full textThis is the second paper of a series describing theories and experiments of a new analysis technique able to accurately characterize the time-varying noise of A/D converters (ADC). In the previous work, the effects of the quantization and nonlinearities on the jitter measurement were considered, and an efficient solution to this problem was demonstrated. This paper presents a dual channel measurement technique that is still independent of quantization and nonlinearities, and that allows one to separate from the ADC noise the noise contribution of the test setup. The method, based on the measurement of the cross-correlated noise between the two channels, provides more accurate measurements of the ADC noise than may be possible with traditional test equipmen
About the number of records to be acquired for histogram testing of A/D converters using synchronous sinewave and clock generators
No full text- …
