1,721,050 research outputs found
Test structure Design for the Evaluation of Carrier-Carrier Scattering Effect on Hole and Electron Mobilities
No full textAnalytical Model of the Effective Recombination Velocity of Diffused p-p+ (n-n+) High-Low Junctions at Artbitrary Injection Level
No full textDetection of Recombination Centers in Epitaxial Layers by Temperature Scanning and Depth Lifetime Profiling
No full textA New Test Structure for Recombination Measurements in Thin Silicon Layers for VLSI Structures
No full textExperimental Analysis of the Temperature Dependence of the S.H.R. Lifetime and of the Apparent Bandgap Narrowing in n-type Silicon
No full textAn Analytical Model for p+-n-n+ (n+-p-p+) Epitaxial Diodes Valid from Low to High Injection Levels
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