1,720,994 research outputs found
Going Beyond Counting First Authors in Author Co-citation Analysis
Full text linkThe present study examines one of the fundamental aspects of author co-citation analysis (ACA) - the way co-citation
counts are defined. Co-citation counting provides the data on which all subsequent statistical analyses and mappings
are based, and we compare ACA results based on two different types of co-citation counting - the traditional type that
only counts the first one among a cited work's authors on the one hand and a non-traditional type that takes into
account the first 5 authors of a cited work on the other hand. Results indicate that the picture produced through this non-traditional author co-citation counting contains more coherent author groups and is therefore considerably clearer. However, this picture represents fewer specialties in the research field being studied than that produced through the traditional first-author co-citation counting when the same number of top-ranked authors is selected and analyzed. Reasons for these effects are discussed
Al2O3 Surface Passivation Characterized on Hydrophobic and Hydrophilic Si by Combination of QSSPC, CV and FTIR
No full textVariations on the Author
Full text link“Variations on the Author” discusses two of Eduardo Coutinho’s recent films (Um Dia na Vida, from 2010, and Últimas Conversas, posthumously released in 2015) and their contribution to the general question of documentary authorship. The director’s filmography is characterized by a consistent yet self-effacing form of authorial self-inscription: Coutinho often features as an interviewer that rather than express opinions propels discourses; an interviewer that is good at listening. This mode of self-inscription characterizes him as an author who is not expressive but who is nonetheless markedly present on the screen. In Um Dia na Vida, however, Coutinho is completely absent form the image, while Últimas Conversas, on the contrary, includes a confessional prologue that moves the director from the margins to the center of his films. This article examines the ways in which these works stand out in the filmography of a director who offers new insights into the notion of cinematic authorship
Appropriate Similarity Measures for Author Cocitation Analysis
Full text linkWe provide a number of new insights into the methodological discussion about author cocitation analysis. We first argue that the use of the Pearson correlation for measuring the similarity between authors’ cocitation profiles is not very satisfactory. We then discuss what kind of similarity measures may be used as an alternative to the Pearson correlation. We consider three similarity measures in particular. One is the well-known cosine. The other two similarity measures have not been used before in the bibliometric literature. Finally, we show by means of an example that our findings have a high practical relevance.information science;Pearson correlation;cosine;similarity measure;author cocitation analysis
Dispelling the Myths Behind First-author Citation Counts
Full text linkWe conducted a full-scale evaluative citation analysis study of scholars in the XML research field to explore just how different from each other author rankings resulting from different citation counting methods actually are, and to demonstrate the capability of emerging data and tools on the Web in supporting more realistic citation counting methods. Our results contest some common arguments for the continued
use of first-author citation counts in the evaluation of scholars, such as high correlations between author rankings by first-author citation counts and other citation
counting methods, and high costs of using more realistic citation counting methods that are not well-supported by the ISI databases. It is argued that increasingly available digital full text research papers make it possible for citation analysis studies to go beyond what the ISI databases have directly supported and to employ more
sophisticated methods
koamabayili/VECTRON-author-checklist: VECTRON author checklist
No full textWe have done our best to complete the author checklist relating to the use of animals in the hut study. Note that the objective for the hut study was to evaluate the IRS treatment applications for residual efficacy against Anopheles mosquitoes, including the local An. coluzzii mosquito population. Cows were only used to attract mosquitoes into the huts and no tests were carried out directly on the cows. The author checklist is intended for use with studies where experiments are carried out on animals, which is why we have had such difficulty in completing this for the hut study, as many of the questions do not relate to how the cows were used
Electrical Characterization of Al2O3 Passivation Layers for p-Type CZ-Si PERC Solar Cells
No full textThis work characterizes p-type Silicon surface
passivation using a high-k material (Al2O3 or HfO2) combining
capacitance voltage (CV) and lifetime measurements.
For Al2O3 samples, the Silicon substrate bulk and surface
quality is equivalent to CZ Silicon used in industrial solar cell
processing. While Al2O3 has been proven to provide high quality
surface passivation on p-type doped Silicon surfaces, the
influence of the growth conditions and the post-deposition
annealing is not yet completely understood. The dielectric thin
film has been deposited by common techniques (ALD, PECVD)
on H-/OH- terminated Silicon surfaces (hydrophobic and
hydrophilic, respectively). The impact of the roughness of the
surface prior to the deposition has been also considered. Then,
the passivation of each layer has been investigated as a function
of different Al2O3 thicknesses (5 to 20 nm) and post-deposition
annealing temperatures (300 to 800 °C). CV measurements have
been used to characterize chemical passivation (= interface trap
density, Dit) and field effect passivation (= fixed charge density,
Qf). Lifetime measurements have been used to assess the effective
surface passivation. The results of both types of electrical
characterization fit well together. (i) Prior post-deposition
anneal, only either chemical passivation (ALD) or field effect
passivation (PECVD) is adequate, resulting in lower effective
lifetimes. (ii) At higher annealing temperatures, a negative net
charge in the Al2O3 and a low Dit at the interface are measured,
ideal for p-type CZ Silicon passivation and causing maximal
effective lifetimes. (iii) At too high annealing temperatures,
chemical passivation is destroyed resulting in decreasing effective
lifetimes even though negative field effect remains in many cases.
Another candidate as passivation layer on Silicon is HfO2.
Being a new material in photovoltaics, it has been studied on FZ
Silicon substrates and its electrical characterization has
demonstrated interesting passivation properties at low anneal
temperatures (also without thermal treatment)
Author-wise bibliometric analysis based on entropy.
No full textAuthor-wise bibliometric analysis based on entropy.</p
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