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    Resistance versus temperature of an Indium Oxide thin film sample "b15c12" at various applied perpendicular magnetic field values

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    DC sheet resistance of a thin amorphous indium oxide film, measured as a function of temperature at a range of magnetic fields to show a transition from a superconducting state to an metallic state. Each file gives sheet resistance as a function of temperature at a unique value of magnetic field applied perpendicular to the film.Sheet resistance of a thin superconducting amorphous indium oxide film as a function of temperature and perpendicular magnetic field. Increasing field leads to the apparent destruction of the superconducting state and a transition to a metallic high field state.This work was supported by the National Science Foundation under Grant Nos. DMR-1209578 and DMR-1704456. Portions of this work were conducted in the Minnesota Nano Center, which is supported by the National Science Foundation through the National Nano Coordinated Infrastructure Network (NNCI) under Award Number ECCS-1542202.Lewellyn, Nicholas A; Goldman, Allen M. (2019). Resistance versus temperature of an Indium Oxide thin film sample "b15c12" at various applied perpendicular magnetic field values. Retrieved from the University Digital Conservancy, https://doi.org/10.13020/sf5h-xh91

    Allen M. Boyer (S2_B1_F21_41)

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    Portrait of Allen M. Boyer, class of 1942

    Allen M. Brewick

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    Allen M. Cormack papers

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    Finding aid for the Allen M. Cormack papers at the Digital Collections and Archives, Tufts University

    Mrs. Allen M. Greer

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    The photograph shows Mrs. Allen M. Greer in a bridal dress with a veil and bouquet in her hand. Published in Fort Worth Star-Telegram morning edition May 3, 1954.https://mavmatrix.uta.edu/specialcollections_startelegram1950s/32276/thumbnail.jp

    Allen, M

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    Indium Oxide Resistance Fluctuation Measurements

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    Voltage versus time traces for indium oxide film that undergoes an SIT. The noise measurement was in a Wheatstone bridge configuration and measured resistance fluctuations. Resistance versus temperature sweeps are also included. All data was measured in an Oxford Kelvinox K400 dilution refrigerator.For superconducting indium oxide films with higher disorder, a more conventional superconductor-insulator transition is observed. Low frequency resistance measurements performed on such a film are shown in this dataset. Contrary to initial expectations there were no significant changes in the noise properties near the quantum critical point. However, it was found that the noise varied in a way that was consistent with predictions based on a percolation model. Specifically, the noise properties suggest that the superconductor-insulator transition can be modeled by p-model percolation. This model is based on random Josephson junction array models which have been used extensively to explain the properties of granular superconductors.Sponsorship: This work was supported by the National Science Foundation under Grant Nos. DMR-1209578 and DMR-1704456. Portions of this work were conducted in the Minnesota Nano Center, which is supported by the National Science Foundation through the National Nano Coordinated Infrastructure Network (NNCI) under Award Number ECCS-1542202.Lewellyn, Nicholas A; Goldman, Allen M. (2021). Indium Oxide Resistance Fluctuation Measurements. Retrieved from the University Digital Conservancy, https://doi.org/10.13020/V2VB-9E61

    Allen, M W, NX55252

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    This record was harvested from a previous catalogue system and will be withdrawn in 2025. Information in this record may be superseded or incomplete. Visit this record in UMA's new catalogue at: https://archives.library.unimelb.edu.au/nodes/view/368278Surname: ALLEN Given Name(s) or Initials: M W Military Service Number or Last Known Location: NX55252 Missing, Wounded and Prisoner of War Enquiry Card Index Number: 21876178324 Item: [2016.0049.00609] "Allen, M W, NX55252

    Going Beyond Counting First Authors in Author Co-citation Analysis

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    The present study examines one of the fundamental aspects of author co-citation analysis (ACA) - the way co-citation counts are defined. Co-citation counting provides the data on which all subsequent statistical analyses and mappings are based, and we compare ACA results based on two different types of co-citation counting - the traditional type that only counts the first one among a cited work's authors on the one hand and a non-traditional type that takes into account the first 5 authors of a cited work on the other hand. Results indicate that the picture produced through this non-traditional author co-citation counting contains more coherent author groups and is therefore considerably clearer. However, this picture represents fewer specialties in the research field being studied than that produced through the traditional first-author co-citation counting when the same number of top-ranked authors is selected and analyzed. Reasons for these effects are discussed
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