1,721,007 research outputs found
TEM study of annealed Pt nanostructures grown by electron beam induced deposition
No full textIn this paper we report on the microstructural characterization of Pt nanostructures fabricated by electron beam-induced deposition in a dual beam system and subsequently annealed in furnace. The as-deposited natiostructures are made of a mixture of nanocrystalline Pt and amorphous carbon. We show by transmission electron microscopy and electron energy loss spectroscopy that the annealing in presence of oxygen at 550 degrees C for 30 min is able to remove the amorphous carbon from the nanostructure, leaving polycrystalline Pt grains. (c) 2006 Elsevier B.V. All rights reserved
Transmission Electron Microscopy characterization and sculpting of sub-1 nm Si-O-C freestanding nanowires grown by electron beam induced deposition
No full textThe authors present a transmission electron microscopy characterization and sculpting of freestanding Si-O-C nanowires, fabricated by electron beam induced deposition from a tetraethylorthosilicate precursor, in a dual beam system. Electron energy loss spectroscopy and near edge structure analyses performed on as deposited wires show the formation of amorphous silicon dioxide with extra oxygen and carbon content. Subsequent electron beam sculpting by 200 keV transmission electron microscope irradiation decreases carbon and oxygen contents leaving the silicon oxidation state unchanged and narrows Si-O-C wire width to less than 1 nm. (c) 2006 American Institute of Physics
Strain field reconstruction in shallow trench isolation structures by CBED and LACBED
No full textUsing a combination of the CBED and the LACBED techniques in the transmission electron microscopy (TEM), we have investigated the strain field in the silicon active region of a shallow trench isolation structure, underlying a TiSi2 layer. Starting from the analysis of the deformation in a sample, thinned for TEM analysis, we have reconstructed the displacement field, simulating the split HOLZ lines visible in the experimental CBED patterns. From the comparison between the experimental LACBED patterns, taken in a suitable sample orientation to evidence the stressors distribution in the polycrystalline silicide layer, and the corresponding dynamically simulated ones, we have reproduced the strain field in the unthinned, bulk sample. (c) 2006 Elsevier B.V. All rights reserved
Role of mechanical stress in the resistance drift of Ge2Sb2Te5 films and phase change memories
No full text
Going Beyond Counting First Authors in Author Co-citation Analysis
Full text linkThe present study examines one of the fundamental aspects of author co-citation analysis (ACA) - the way co-citation
counts are defined. Co-citation counting provides the data on which all subsequent statistical analyses and mappings
are based, and we compare ACA results based on two different types of co-citation counting - the traditional type that
only counts the first one among a cited work's authors on the one hand and a non-traditional type that takes into
account the first 5 authors of a cited work on the other hand. Results indicate that the picture produced through this non-traditional author co-citation counting contains more coherent author groups and is therefore considerably clearer. However, this picture represents fewer specialties in the research field being studied than that produced through the traditional first-author co-citation counting when the same number of top-ranked authors is selected and analyzed. Reasons for these effects are discussed
Method for determination of the displacement field in patterned nanostructures by TEM/CBED analysis of split high-order Laue zone line profiles
No full textA method to extract accurate information on the displacement field distribution from split high-order Laue zones lines in a convergent-beam electron diffraction pattern of nanostructures has been developed. Starting from two-dimensional many beam dynamical simulation of HOLZ patterns, we assembled a recursive procedure to reconstruct the displacement field in the investigated regions of the sample, based on the best fit of a parametrized model. This recursive procedure minimizes the differences between simulated and experimental patterns, taken in strained regions, by comparing the corresponding rocking curves of a number of high-order Laue zone reflections. Due to its sensitivity to small displacement variations along the electron beam direction, this method is able to discriminate between different models, and can be also used to map a strain field component in the specimen. We tested this method in a series of experimental convergent-beam electron diffrac tion patterns, taken in a shallow trench isolation structure. The method presented here is of general validity and, in principle, it can be applied to any sample where not negligible strain gradients along the beam direction are present
Variations on the Author
Full text link“Variations on the Author” discusses two of Eduardo Coutinho’s recent films (Um Dia na Vida, from 2010, and Últimas Conversas, posthumously released in 2015) and their contribution to the general question of documentary authorship. The director’s filmography is characterized by a consistent yet self-effacing form of authorial self-inscription: Coutinho often features as an interviewer that rather than express opinions propels discourses; an interviewer that is good at listening. This mode of self-inscription characterizes him as an author who is not expressive but who is nonetheless markedly present on the screen. In Um Dia na Vida, however, Coutinho is completely absent form the image, while Últimas Conversas, on the contrary, includes a confessional prologue that moves the director from the margins to the center of his films. This article examines the ways in which these works stand out in the filmography of a director who offers new insights into the notion of cinematic authorship
Appropriate Similarity Measures for Author Cocitation Analysis
Full text linkWe provide a number of new insights into the methodological discussion about author cocitation analysis. We first argue that the use of the Pearson correlation for measuring the similarity between authors’ cocitation profiles is not very satisfactory. We then discuss what kind of similarity measures may be used as an alternative to the Pearson correlation. We consider three similarity measures in particular. One is the well-known cosine. The other two similarity measures have not been used before in the bibliometric literature. Finally, we show by means of an example that our findings have a high practical relevance.information science;Pearson correlation;cosine;similarity measure;author cocitation analysis
Quantitative strain mapping in nano electronic silicon dvices by convergent beam electron diffraction
No full textLattice deformations which are generated in thedifferent process steps of the current technology fornanoelectronic devices can affect either positively ornegatively their electrical performances. In both casesquantitative information on strains at the nanometerscale are necessary, and presently this can only beachieved by convergent beam electron diffraction(CBED), a technique available in any moderntransmission electron microscope (TEM). In this paper the basic principles of CBED, the method to extract the local strain tensorfrom an experimental diffraction pattern and its application to twodimensional strain mapping in the active silicon region of ultra-scaled isolation structures are reported. The limitations of this method, particularly in the case of high strain gradients along a direction perpendicular to the plane of the device TEM cross section, are discussed. Possible solutions to obtain the displacement field distribution, with reference to a practical case, are described
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