1,721,078 research outputs found
Tip-Enhanced Raman Spectroscopy and Photoluminescence for Nanoelectronics: Advanced Quality Control of Strained-Silicon Devices and Transition Metal Dichalcogenides Monolayers
Electronic devices and their many and varied integrated circuits components are entangled in modern society so deeply that "nothing can really work without them". This statement led to the relentless demand for enhanced performance, which has driven continuous advancements in nanoelectronics, where scaling down transistor dimensions has triggered unprecedented challenges. With the number of transistors per chip growing exponentially following the Moore’s law to accommodate increasing data processing needs and low production costs, conventional silicon-based technologies are being pushed to their physical limits, especially the Metal-Oxide-Semiconductor Field-Effect Transistor (MOSFET), brought already to a critical point for a few years by now, undermined by quantum phenomena and thermal effects, that hinder performance predictability and further scaling. Overcoming these limitations requires new ideas, ranging from the enhancement and upgrade of already employed silicon-based technologies (More Moore), to the exploration of alternative materials to replace transistor parts, up to designs to revolutionize its overall architecture (More than Moore). While these new technologies hold the key to future advances and ensure to accomplish the tasks of the incoming technology nodes, they also pose new hurdles in terms of characterization, particularly regarding the assessment of structural integrity, performance reliability, and fabrication repeatability. This PhD thesis wants to face these challenges and proposes an exceptional answer to the needs of this era of nanoelectronics, which requires precise, real-time observation techniques that can operate in the nanometer domain. This work presents Tip-Enhanced Optical Spectroscopy (TEOS) as a highly effective solution for this demand. TEOS is a cutting-edge technique that comprises Tip-Enhanced Raman Spectroscopy (TERS) and Tip-Enhanced PhotoLuminescence (TEPL), based on the combination of optical spectroscopy and Atomic Force Microscopy (AFM) to provide both chemical and optoelectronic information at nanoscale resolution. By leveraging the high spatial resolution of the AFM, TEOS enables a correlative analysis of material properties, combining chemical and structural composition, morphological features, and optoelectronic behavior in a single, non-destructive process. This unique capability is crucial for real-time quality control in semiconductor manufacturing, particularly as the industry moves toward increasingly complex and miniaturized devices. The experimental section of this work aims to demonstrate the powerful capabilities of TEOS through its application on two prominent technologies proposed to enhance transistors performances: strained-silicon structures and Transition Metal Dichalcogenides (TMDs) monolayers. Strained-silicon, where the silicon crystal lattice is altered through controlled strain distribution, has great potential for improving the efficiency of conventional MOSFETs without requiring significant changes to existing manufacturing fabrication lines. However, achieving consistent strain configurations and detecting structural defects during the production process requires advanced, real-time analysis. Similarly, TMDs single sheets are less than a nanometer thick, thus imposing challenges in verifying their structural integrity and electronic properties, particularly in terms of defect detection, uniformity, and overall material quality. TEOS, with its nanometer-scale resolution and non-invasive nature, provides a robust tool for addressing these challenges, enabling detailed analysis of both strained-silicon and TMDs with unprecedented precision. The thesis is structured to first provide a comprehensive overview of the technological context, beginning with the history of transistor miniaturization and the barriers faced by the semiconductor industry in the Front-End Of Line of integrated circuits to guarantee the requirements of each technology node. It then introduces the concept of optical spectroscopy, both at the micro- and nano-scale, as a viable solution for seeing those structures and devices. A detailed discussion of TEOS is followed
by an in-depth exploration of its application to strained-silicon and TMDs. For both the case studies proposed, the thesis will provide a comprehensive explanation of their features, the benefit they offer to semiconductor devices and thus how they can be efficiently characterized envisioning their future
large-scale integration. Therefore, the experimental results of each section will highlight the efficacy of multiscale optical spectroscopies as standalone characterization methods. This research is conducted within the framework of the European project Challenges–Real-time nano-CHAracterization reLatEd techNoloGIES, which ran from April 2020 to August 2024. The project aimed to develop versatile non-destructive techniques for in-line multiscale characterization and real-time quality control of semiconductor devices, ensuring their compatibility with industrial production environments like cleanrooms, thanks to the development and testing of plasmonic TEOS tips, characterized by a titanium nitride (TiN) coating. A consistent part of the results of this thesis in fact will concern the TiN probes testing process, which was conducted on the macro-area of samples related to the silicon-based semiconductor industry. Therefore, the research presented here not only contributes to the goals of the single project and the broader European Chips Act, but also paves the way for the integration of Tip-Enhanced Optical Spectroscopy into standard semiconductor manufacturing processes, ensuring that the next wave of technological innovation is built on a solid foundation of detailed material understanding and quality control
Going Beyond Counting First Authors in Author Co-citation Analysis
The present study examines one of the fundamental aspects of author co-citation analysis (ACA) - the way co-citation
counts are defined. Co-citation counting provides the data on which all subsequent statistical analyses and mappings
are based, and we compare ACA results based on two different types of co-citation counting - the traditional type that
only counts the first one among a cited work's authors on the one hand and a non-traditional type that takes into
account the first 5 authors of a cited work on the other hand. Results indicate that the picture produced through this non-traditional author co-citation counting contains more coherent author groups and is therefore considerably clearer. However, this picture represents fewer specialties in the research field being studied than that produced through the traditional first-author co-citation counting when the same number of top-ranked authors is selected and analyzed. Reasons for these effects are discussed
Variations on the Author
“Variations on the Author” discusses two of Eduardo Coutinho’s recent films (Um Dia na Vida, from 2010, and Últimas Conversas, posthumously released in 2015) and their contribution to the general question of documentary authorship. The director’s filmography is characterized by a consistent yet self-effacing form of authorial self-inscription: Coutinho often features as an interviewer that rather than express opinions propels discourses; an interviewer that is good at listening. This mode of self-inscription characterizes him as an author who is not expressive but who is nonetheless markedly present on the screen. In Um Dia na Vida, however, Coutinho is completely absent form the image, while Últimas Conversas, on the contrary, includes a confessional prologue that moves the director from the margins to the center of his films. This article examines the ways in which these works stand out in the filmography of a director who offers new insights into the notion of cinematic authorship
Appropriate Similarity Measures for Author Cocitation Analysis
We provide a number of new insights into the methodological discussion about author cocitation analysis. We first argue that the use of the Pearson correlation for measuring the similarity between authors’ cocitation profiles is not very satisfactory. We then discuss what kind of similarity measures may be used as an alternative to the Pearson correlation. We consider three similarity measures in particular. One is the well-known cosine. The other two similarity measures have not been used before in the bibliometric literature. Finally, we show by means of an example that our findings have a high practical relevance.information science;Pearson correlation;cosine;similarity measure;author cocitation analysis
Dispelling the Myths Behind First-author Citation Counts
We conducted a full-scale evaluative citation analysis study of scholars in the XML research field to explore just how different from each other author rankings resulting from different citation counting methods actually are, and to demonstrate the capability of emerging data and tools on the Web in supporting more realistic citation counting methods. Our results contest some common arguments for the continued
use of first-author citation counts in the evaluation of scholars, such as high correlations between author rankings by first-author citation counts and other citation
counting methods, and high costs of using more realistic citation counting methods that are not well-supported by the ISI databases. It is argued that increasingly available digital full text research papers make it possible for citation analysis studies to go beyond what the ISI databases have directly supported and to employ more
sophisticated methods
koamabayili/VECTRON-author-checklist: VECTRON author checklist
We have done our best to complete the author checklist relating to the use of animals in the hut study. Note that the objective for the hut study was to evaluate the IRS treatment applications for residual efficacy against Anopheles mosquitoes, including the local An. coluzzii mosquito population. Cows were only used to attract mosquitoes into the huts and no tests were carried out directly on the cows. The author checklist is intended for use with studies where experiments are carried out on animals, which is why we have had such difficulty in completing this for the hut study, as many of the questions do not relate to how the cows were used
Author-wise bibliometric analysis based on entropy.
Author-wise bibliometric analysis based on entropy.</p
Author Under Sail The Imagination of Jack London, 1893-1902
In Author Under Sail, Jay Williams offers the first complete literary biography of Jack London as a professional writer engaged in the labor of writing. It examines the authorial imagination in London's work, the use of imagination in both his fiction and nonfiction, and the ways he defined imagination in the creative process in his business dealings with his publishers, editors, and agents. In this first volume of a two-volume biography, Williams traverses the years 1893 to 1902, from London's "Story of a Typhoon" to The People of the Abyss. The Jack London who emerges in the pages of Author Under Sail is a writer whose partnership with publishers, most notably his productive alliance with George Brett of Macmillan, was one of the most formative in American literary history. London pioneered many author models during the heyday of realism and naturalism, blurring the boundaries of these popular genres by focusing on absorption and theatricality and the representation of the seen and unseen. London created an impassioned, sincere, and extremely personal realism unlike that of other American writers of the time. Author Under Sail is a literary tour de force that reveals the full range of London as writer, creative citizen, and entrepreneur at the same time it sheds light on the maverick side of machine-age literature.Intro -- Title Page -- Copyright Page -- Dedication -- Contents -- Acknowledgments -- Introduction -- 1. Spirit Truth -- 2. From Absorption to Theatricality and Back Again -- 3. "I Will Build a New Present" -- 4. Sons as Authors -- 5. Fathers as Publishers -- 6. The Daughter as Author -- 7. Lovers as Authors -- 8. At Sea with the Family -- 9. Yellow News, Yellow Stories -- 10. The Return Home -- Notes -- Bibliography -- Index -- About Jay WilliamsIn Author Under Sail, Jay Williams offers the first complete literary biography of Jack London as a professional writer engaged in the labor of writing. It examines the authorial imagination in London's work, the use of imagination in both his fiction and nonfiction, and the ways he defined imagination in the creative process in his business dealings with his publishers, editors, and agents. In this first volume of a two-volume biography, Williams traverses the years 1893 to 1902, from London's "Story of a Typhoon" to The People of the Abyss. The Jack London who emerges in the pages of Author Under Sail is a writer whose partnership with publishers, most notably his productive alliance with George Brett of Macmillan, was one of the most formative in American literary history. London pioneered many author models during the heyday of realism and naturalism, blurring the boundaries of these popular genres by focusing on absorption and theatricality and the representation of the seen and unseen. London created an impassioned, sincere, and extremely personal realism unlike that of other American writers of the time. Author Under Sail is a literary tour de force that reveals the full range of London as writer, creative citizen, and entrepreneur at the same time it sheds light on the maverick side of machine-age literature.Description based on publisher supplied metadata and other sources.Electronic reproduction. Ann Arbor, Michigan : ProQuest Ebook Central, YYYY. Available via World Wide Web. Access may be limited to ProQuest Ebook Central affiliated libraries
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