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    Invited; Atomic-order surface reaction of reactant gas on group IV semiconductor (100) surface

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    Atomic-order surface reactions of reactant gases on group IV semiconductor (100) surface in ultra-clean hotwall low-pressure CVD are described as a function of reactant gas partial pressure with the fitting parameters. Now, assuming that one reactant molecule occupies one free surface site according to Langmuir-type model, total adsorption site density n0 on the (100) substrate surface is given by the sum of free site density Qs and the site density QMs where reactant molecule M is adsorbed. Surface adsorption velocity on the surface is given by dQMs/dt = kMsPMQs - k-MsQMs = kMsPMn0 - (kMsPM + k-M)QMs, where kMs and k-Ms is adsorption and desorption rate constants of M, respectively, and PM is partial pressure of M. Please click Download on the upper right corner to see the full abstract

    Process design of a fully integrated continuous biopharmaceutical process using economic and ecological impact assessment

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    Marching toward implementation of an ultra-high density dynamic perfusion process

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    Integrated semi-continuous manufacturing of lentiviral vectors

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    Transient expression of CHIKV VLP in large stirred tank bioreactors

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    Expression of stress proteins during fed batch and perfusion cultures

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    Closing the loop on cell culture analyzer variability

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    Quantitation of amino acids in diverse mammalian cell culture media types with the REBEL at-line analyzer

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