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Yong-Ki Kim
No full textYONG-KI KIM
Inducted: 2008
Citation:
For research on the relativistic calculation of atomic structure and the calculation of cross sections for the ionization of atoms and molecules by electron impact
Tenure: 1983-2002
B: 1932, Seoul, Korea
D: 2006
Education:
Seoul National University, BS (Physics), 1957
University of Delaware, MS (Physics), 1961
University of Chicago, PhD (Physics), 1966
Positions held:
Physicist, Atomic Theory Group, Plasma Measurements Division, 1983 - 1988
Supervisory Physicist, Atomic Radiation Data Group, Atomic & Plasma Radiation Division, 1988 - 1995
Physicist, Atomic Processes Group, Atomic Physics Division, 1995 - 2002
NIST Guest Researcher, Atomic Spectroscopy Group, Atomic Physics Division, 2002 - 2006
Honors:
US Department of Commerce Silver Medal (1987)
US Department of Energy Certificate of Appreciation (2003)
Memberships:
Fellow, American Physical Society
Publications:
More than 120 publications including:
Kim, Y.-K., “Relativistic Self-Consistent-Field Theory for Closed-Shell Atoms,” Phys. Rev. 154, 17 (1967)
Cheng, K. T., Kim, Y.-K., and Desclaux, J. P., “Electric Dipole, Quadrupole, and Magnetic Dipole Transition Probabilities of Ions Isoelectronic to the First-row Atoms, Li through F,” Atomic Data Nuclear Data Tables 24, 111 (1979)
Kim Y.-K. and Cheng, K. T., “Stopping Power for Partially Stripped Ions,” Phys. Rev. A 22, 61 (1980)
Kim, Y.-K., “Theory of Electron-Atom Collisions,” Physics of Ion-Ion and Electron-Ion Collisions, edited by F. Brouillard and J. W. McGowan, NATO Adv. Study Institute Series B: Physics Vol. B83, 101 Plenum Press New York (1983)
Kim Y.-K. and Rudd, M. E., “Binary-encounter-dipole Model for Electron-impact Ionization,” Phys. Rev. A 50, 3954 (1994)
Kim, Y.-K., “Scaling of Plane-wave Born Cross Sections for Electron-Impact Excitation of Neutral Atoms,” Phys. Rev. A 64, 032713 (2001
Portrait of Margarete Ehrlich
No full textPhysicist Margarete Ehrlich 1915-2007.
Margarete Ehrlich received her undergraduate degree in physics at the University of Vienna in 1938. From 1941-47, she was chief X-ray technician at Grady Memorial Hospital in Atlanta, Georgia. Ehrlich was hired by L.S. Taylor in the National Bureau of Standards (NBS, now the National Institute of Standards and Technology, NIST) X-Ray Section of the Atomic Physics Division in 1947. Ehrlich earned her doctorate in physics in 1955 while concurrently working in NIST’s Radiation Physics division. She studied photographic techniques for radiation dosimetry, established a method to calibrate radiation protection instruments using neutron beams, and researched the measurement of radiation used for cancer treatments. Her work helped to create reliable and practical radiation measurements for personal protection and cancer therapy.
She received her Ph.D. in physics from the Catholic University of America in 1955, with a thesis on X-ray and electron interactions with photographic emulsions.
Notable honors and awards: Silver Medal, U.S. Department of Commerce, 1962 Gold Medal, U.S. Department of Commerce, 1977. Research interests: fundamental physics of radiation interactions with emulsions and photographic films; personnel protection dosimetry devices for accurate transfer measurements for electrons, photons and neutrons; national and international standards for protection of radiation workers
A Low-Cost Fiducial Reference Phantom for Computed Tomography
No full textTo detect the growth in lesions, it is necessary to ensure that the apparent changes in size are above the noise floor of the system. By introducing a fiducial reference, it may be possible to detect smaller changes in lesion size more reliably. We suspend three precision spheres with a precision structure built from pieces from a popular children's building toy. We measure the distances between the centroids of the structures three ways; namely, with a high-precision mechanical method, micro computerized tomography, and medical computerized tomography. The three methods are in agreement, and also agree with the design values for the structure. It is also possible to pick a threshold so that the three spheres have their nominal volumes in the medical computerized tomography images. The use of volumetric measures allows the determination of lengths to much less than the voxel size using materials which have x-ray properties within the range of the human body. A suitable structure may be built with a very small parts cost
Microarray scanner performance over a five-week period as measured with Cy5 and Cy3 serial dilution slides
No full textTo investigate scanner performance and guide development of an instrument qualification method, slides with replicates of successive dilutions of cyanine 5 (Cy5) and cyanine 3 (Cy3) dyes (referred to as dye slides) were scanned. The successive dilutions form a dose-response curve from which performance can be assessed. The effects of a variety of factors, including the number of scans and slide storage conditions, on scanner performance over a five-week period were investigated and tracked with time series charts of dye signal intensity, signal-to-noise (S/N), signal background, slope, and limit of detection (LOD), Scanner drift was tracked with a known stable reference material, Standard Reference Material (SRM) 2242. The greatest effect on the figures of merit was the dye, with the Cy5 dye showing signs of degradation after one week of scanning independent of all other factors while the Cy3 dye remained relatively stable, Use of the charts to track scanner performance over time holds promise for development of a method for in microarray scanner performance qualification. Although not a prescription for performance qualification. this introductory study provides sufficient information regarding the Use of dye slides to enable the user to institute a preliminary test method
Workshop on Measurement Needs for Local-Structure Determination in Inorganic Materials
No full textThe functional responses (e. g., dielectric, magnetic, catalytic, etc.) of many industrially-relevant materials are controlled by their local structure-a term that refers to the atomic arrangements on a scale ranging from atomic (sub-nanometer) to several nanometers. Thus, accurate knowledge of local structure is central to understanding the properties of nanostructured materials, thereby placing the problem of determining atomic positions on the nanoscale-the so-called "nanostructure problem"-at the center of modern materials development. Today, multiple experimental techniques exist for probing local atomic arrangements; nonetheless, finding accurate comprehensive, and robust structural solutions for the nanostructured materials still remains a formidable challenge because any one of these methods yields only a partial view of the local structure. The primary goal of this 2-day NIST-sponsored workshop was to bring together experts in the key experimental and theoretical areas relevant to local-structure determination to devise a strategy for the collaborative effort required to develop a comprehensive measurement solution on the local scale. The participants unanimously agreed that solving the nanostructure problem-an ultimate frontier in materials characterization-necessitates a coordinated interdisciplinary effort that transcends the existing capabilities of any single institution, including national laboratories, centers, and user facilities. The discussions converged on an institute dedicated to local structure determination as the most viable organizational platform for successfully addressing the nanostructure problem. The proposed "institute" would provide an intellectual infrastructure for local structure determination by (1) developing and maintaining relevant computer software integrated in an open-source global optimization framework (Fig. 2), (2) connecting industrial and academic users with experts in measurement techniques, (3) developing and maintaining pertinent databases, and (4) providing necessary education and training
Fingerprint Scanner Angle Manipulation Device
No full textThe Fingerprint Scanner Angle Manipulation Device is a tool designed by the National Institute of Standards and Technology (NIST) in 2008 to test the usability of U.S. Department of Homeland Security fingerprint scanners when placed at various angles. The NIST test device shown is a hinged plastic stand and wood cylinders that allowed a fingerprint scanner to be set at one of the four angles being tested. The device is shown here with a foam mock-up of a fingerprint scanner.
In 2008 the U.S. Department of Homeland Security’s United States Visitor and Immigration Status Indicator Technology (US-VISIT) program was preparing to transition U.S. port of entry identity technology from a two-fingerprint capture process to a ten-fingerprint slap capture process. In preparing for the ten-fingerprint pilot testing, there was concern that the existing counter tops that housed the fingerprint scanners were too tall to support the ten-fingerprint collection process. Lowering the counter tops at US-VISIT facilities was not possible, but the fingerprint scanners could be angled on the counters. US-VISIT asked the NIST Biometrics Usability team, part of the NIST Information Technology Laboratory, to examine the impact on fingerprint capture performance when angling the fingerprint scanners at the existing counter heights. The NIST Biometrics Usability team’s study was specifically designed to determine what was the “best” angle to position the fingerprint scanner for efficiency in the time required to complete the task, the effectiveness in obtaining usable prints, and user comfort. The angles to test were first chosen by computer-aided design (CAD) modeling with a 95th percentile male model and a 5th percentile female model (this covers over 90% of the U.S. population). The Fingerprint Scanner Angle Manipulation Device was designed and built at NIST to enable the setting of four angles: 0 degrees, 10 degrees, 20 degrees, and 30 degrees. NIST collected data at all four angles (counterbalanced to control for ordering effects) regarding speed, quality, and user satisfaction with the fingerprinting process. NIST's analysis showed that an angle of 20 degrees was the best overall angle to position the fingerprint scanner. The Department of Homeland Security adopted NIST's guidance and have placed all fingerprint scanners at 20 degree angles at each point of entry to the United States, as well as at consulates and embassies. This angling of the scanners impacts 350,000 visitors entering the U.S. every day, and results in better user experience.[H] 19.3 cm [W] 22.86 cm [D] 30.48 c
Neil Olien
No full textNeil Olien
Inducted: 2007
Citation: For pioneering efforts in information and data activities in cryogenics, including early adaptation and development of computer technologies, and for exceptional leadership in thermophysics and chemical-engineering programs.
Tenure: 1961-1991
Birth: 1935, Lemmon, South Dakota
Education:
South Dakota School of Mines and Technology, BS (Physics), 1960
Stanford University, MA (Science Education), 1961
Positions held:
Physicist, Cryogenic Technical Services Section, Cryogenics, 1961-65
Project Leader, Cryogenic Technical Services Section, Cryogenics, 1965-74
Section Chief, Cryogenic Data Center, Cryogenics Division, 1974-76
Section Chief, Fluid Properties, Thermophysical Properties Division, 1976-80
Chief, Chemical Engineering Science Division, 1980-84
Program Analyst, Program Office, 1984-85
Chief, Thermophysics Division, 1985-89
Director, Center for Chemical Technology, 1989-90
Director, Chemical Science and Technology Laboratory, 1990-1991
Honors:
Department of Commerce Silver Medal (1982)
Chief Editor a) Cryogenic Current Awareness Service, b) Superconducting Devices and Materials, c) Liquefied Natural Gas, and d) Hydrogen Future Fuel
Chair Local Committee for Fifth International IUPAC/CODATA Conference (1976)
Centennial 100 Alumni Award, South Dakota School of Mines and Technology (1985)
Program Chair, American Institute of Chemical Engineers National Meeting (1988)
Memberships:
ASTM and various Committees
American Institute of Chemical Engineers
American Society for Information Science
American Association for the Advancement of Science
IUPAC Committee on Atmospheric Gases and Committee on Transport Properties
Gas Research Institute Steering Committee
Publications:
More than 30 publications including:
Olien, N. A., �The Cryogenics Data Center, An Information Service in the Field of Cryogenics,� Cryogenics 11, 11-18 (1971).
Olien, N.A., �LNG Materials & Fluids (A User�s Manual of Property Data),� Fluids Editor (1978).
Haynes, W.M., Kidnay, A.J., and Olien, N.A., �Status of Thermophysical Properties Data for Pure Fluids and Mixtures of Cryogenic Interest,� Adv. Cryo. Eng. 27, 919-942 (1984).
Younglove, B.A. and Olien, N.A., �Tables of Industrial Gas Container Contents and Density for Oxygen, Argon, Nitrogen, Helium, and Hydrogen,� Nat. Bur. Stand. Tech. Note 1079 (1985).
Olien, N.A., �Thermophysical Properties for Bioprocess Engineering,� Chem. Eng. Prog. 83 (10), 45-48 (1987)
(Audio Part 1 of 4) Oral history interview of Curt Reimann , April 9, 2007 / with David Lide, Harry Hertz, and Hans Oser
No full textCurt Reimann recalls his career at NBS/NIST from October 1, 1962 until his retirement in 1995. The Malcolm Baldrige Award was initiated under the Directorship of Ernest Ambler, National Bureau of Standards Director, through the efforts of Curt Reimann
Oral history interview of Curt Reimann , April 9, 2007 / with David Lide, Harry Hertz, and Hans Oser
No full textCurt Reimann recalls his career at NBS/NIST from October 1, 1962 until his retirement in 1995. The Malcolm Baldrige Award was initiated under the Directorship of Ernest Ambler, National Bureau of Standards Director, through the efforts of Curt Reimann
Comparison of calibration methods for tristimulus colorimeters
No full textUncertainties in source color measurements with a tristimulus colorimeter are estimated for calibration factors determined, based on a known source spectral distribution or on accurate measurements of the spectral responsivities of the colorimeter channels. Application is to the National Institute of Standards and Technology (NIST) colorimeter and an International Commission on Illumination (CIE) Illuminant A calibration. Detector-based calibration factors generally have lower uncertainties than source-based calibration factors. Uncertainties are also estimated for calculations of spectral mismatch factors. Where both spectral responsivities of the colorimeter channels and the spectral power distributions of the calibration and test sources are known, uncertainties are lowest if the colorimeter calibration factors are recalculated for the test source; this process also avoids correlations between the CIE Source A calibration factors and the spectral mis-match factors