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Polarization-Entangled Photon Pairs From Periodically-Poled Crystalline Waveguides Over a Range of Frequencies
No full textWe propose a method to extend the frequency range of polarization entanglement in periodically poled rubidium-doped potassium titanyl phosphate (Rb:KTP) waveguides. Our calculations predict that output wavelengths from 1130 nm to 1257 nm may be achieved using Rb:KTP by the appropriate selection of a direction of propagation for the waveguide. The fidelity using a poling period of 1 mm is approximately 0.98
Ambulance Design Survey 2011: A Summary Report
No full textCurrent ambulance designs are ergonomically inefficient and often times unsafe for practical treatment response to medical emergencies. Thus, the patient compartment of a moving ambulance is a hazardous working environment. As a consequence, emergency medical services (EMS) workers suffer fatalities and injuries that far exceed those of the average work place in the United States. To reduce injury and mortality rates in ambulances, the Department of Homeland Security Science and Technology Directorate has teamed with the National Institute of Standards and Technology, the National Institute for Occupational Safety and Health, and BMT Designers & Planners in a joint project to produce science-based ambulance patient compartment design standards. This project will develop new crash-safety design standards and improved user-design interface guidance for patient compartments that are safer for EMS personnel and patients, and facilitate improved patient care. The project team has been working with practitioners, EMS workers' organizations, and manufacturers to solicit needs and requirements to address related issues. This paper presents an analysis of practitioners' concerns, needs, and requirements for improved designs elicited through the web-based survey of ambulance design, held by the National Institute of Standards and Technology. This paper also introduces the survey, analyzes the survey results, and discusses recommendations for future ambulance patient compartments design
VASIR: An Open-Source Research Platform for Advanced Iris Recognition Technologies
No full textThe performance of iris recognition systems is frequently affected by input image quality, which in turn is vulnerable to less-than-optimal conditions due to illuminations, environments, and subject characteristics (e.g., distance, movement, face/body visibility, blinking, etc.). VASIR (Video-based Automatic System for Iris Recognition) is a state-of-the-art NIST-developed iris recognition software platform designed to systematically address these vulnerabilities. We developed VASIR as a research tool that will not only provide a reference (to assess the relative performance of alternative algorithms) for the biometrics community, but will also advance (via this new emerging iris recognition paradigm) NIST's measurement mission. VASIR is designed to accommodate both ideal (e.g., classical still images) and less-than-ideal images (e.g., face-visible videos). VASIR has three primary modules: 1) Image Acquisition 2) Video Processing, and 3) Iris Recognition. Each module consists of sever
M. Carroll Croarkin
No full textM. CARROLL CROARKIN
NBS/NIST (Gaithersburg): 1955-1963 & 1973-2000
INDUCTED: 2013
B: 1934, Takoma Park, Maryland
EDUCATION:
Dumbarton College, BS (Mathematics), 1956
University of Maryland, MS (Statistics and Probability), 1974
CITATION:
For groundbreaking technical contributions to NBS/NIST calibration and measurement assurance programs, and dissemination to industry of advanced statistical methods for measurement assurance, uncertainty assessment, and inter-laboratory studies through international standards.
POSITIONS HELD AT NBS/NIST:
Mathematician, Office of Measurement Services, Institute for Basic Standards (IBS), 1955-1963
Mathematical Statistician, Office of Measurement Service, IBS, 1973-1977
Mathematical Statistician, Statistical Engineering Division, Information Technology Laboratory (ITL), 1977-2000
Acting Division Chief, Statistical Engineering Division, ITL, 1994-1995 and 1997
Chief, Measurement Process Evaluation Group, Statistical Engineering Division, ITL, 1996-1997 Mathematical Statistician, Statistical Engineering Division, ITL 1998-2000
HONORS:
NIST Bronze Medal (1982) and U.S. Department of Commerce Silver Medal (1987)
Allen V. Astin Measurement Science Award (1989)
Allen V. Astin Measurement Science Award (Group) (1994)
MEMBERSHIPS:
American Statistical Association (ASA)
American Society for Quality (ASQ)
ASTM E-11 (Quality & Statistics) and ASTM E-11.20 (Test Method Evaluation & Quality Control)
U.S. Technical Advisory Group (TAG) to ISO TC- 69 on Stat Methods, Member, Vice-Chair (1998), Chair (2000- 2001) and U.S. TAG to ISO TAG 4
ISO TC69 SC6 Applications of Statistical Methods WG7 (Relating GUM & ISO 5752: Accuracy Measurements Methods & Results)
ANSI ASC Statistics Z1 Subcommittee, Chair (1996-1999)
Natrella Scholarship Committee (ASA Quality & Productivity Section), Chair
PUBLICATIONS: More than 45 publications including:
Beers, J., Tucker, C., and Croarkin, M.C., Measurement Assurance for Gage Blocks, NBS Monograph 163 (1979)
Croarkin, M.C., Measurement Assurance Programs, Part II: Development and Implementation, NBS Special Publication 676-2 (revised) (1985)
Croarkin, C., “An Extended Error Model for Comparison Calibration,” Metrologia (1989)
Baghdadi, D., Bullis, D.M., Croarkin, M.C., Yue-Zhen, L., Scace, R.I., Series, R.W., Stallhofer, P., and Watanabe, M., “Interlaboratory Determination of the Calibration Factor for the Measurement of the Interstitial Oxygen Content of Silicon by Infrared Absorption,” Journal of the Electrochemical Society, 136, p. 2015-2024 (1989) Croarkin, M.C., “Statistics and Measurements,” Journal of Research of the National Institute of Standards and Technology, 106 (1) Jan-Feb, pp. 279-292 (2001)
Heckert, N.A., Filliben, J.J., Croarkin, M.C., Hembree, B., Guthrie, W.F., Tobias, P., and Prins, J., NIST/SEMATECH e-Handbook of Statistical Methods, NIST Handbook 151 (2002
Richard Gann
No full textRICHARD G. GANN
NBS/NIST (Gaithersburg): 1976-2012
INDUCTED: 2013
B: 1944, Hartford, Connecticut
EDUCATION:
Trinity College, BS (Chemistry), 1965
Massachusetts Institute of Technology, PhD (Physical
Chemistry), 1970
CITATION:
For leadership in the science of fire behavior and its
implementation into fire safety standards and engineering
practice of extraordinary significance.
POSITIONS HELD AT NBS/NIST:
Head, Fire Chemistry Research, Center for Fire Research, National Engineering Laboratory (NEL), 1976-1980
Head, Exploratory Fire Research, Center for Fire Research, NEL, 1980-1982
Program Analyst, Office of the Director, NBS, 1981
Chief, Fire Science Division, Building and Fire Research Laboratory (BFRL), 1981-1999
Senior Executive Fellow, John F. Kennedy School of Government, Harvard University, 1984
Senior Research Scientist, BFRL/Engineering Laboratory, 1999–2012
Scientist Emeritus, Engineering Laboratory, 2013
HONORS:
U.S. Department of Commerce Silver Medal (1994) and Gold Medals (2003, 2005)
ASTM International Simon H. Ingberg Award (2002)
Congressman John Joseph Moakley Award (2005)
NIST Edward Uhler Condon Award (2006)
Forum of International Fire Laboratory Directors Sjolin Award (2008)
U.S. Presidential Distinguished Rank Award (2011)
MEMBERSHIPS:
ASTM International; Chair: Groups on Smoke Toxicity and Cigarette Ignition
International Standards Organization (ISO); Chair TC92 SC3, Fire Threat to People and the Environment
National Fire Protection Association (NFPA); Chair, Toxicity Technical Advisory Committee
Technical journal Boards of Editors: Combustion and Flame, Fire and Materials, Fire Technology
PUBLICATIONS:
More than 140 publications, including:
Gann, R.G., Babrauskas, V., Peacock, R.D., and Hall, Jr., J.R., "Fire Conditions for Smoke Toxicity
Measurement," Fire and Materials, 18, 193-199 (1994)
Ohlemiller, T.J., Villa, K.M., Braun, E., Eberhardt, K.R., Harris, Jr., R.H., Lawson, R., and Gann, R.G.,
"Quantifying the Ignition Propensity of Cigarettes," Fire and Materials, 19, 155-169 (1995)
Ohlemiller, T.J., and Gann, R.G., "Estimating Reduced Fire Risk Resulting from an Improved Mattress
Flammability Standard," NIST Technical Note 1446, 80 pages (2002)
Gann, R.G., ed., Final Report of the National Construction Safety Team on the Collapses of the World Trade
Center Towers, NIST NCSTAR 1, 247 pages (2005)
Gann, R.G., ed., Advanced Technology for Fire Suppression in Aircraft, NIST SP 1069, 1240 pages (2007)
Gann, R.G., Averill, J.D., Nyden, M.R., Johnsson, E.L., and Peacock, R.D., “Fire Effluent Component Yields
from Room-scale Fire Tests,” Fire and Materials, 34, 285-314 (2010
Stuart Katzke
No full textSTUART W. KATZKE
NBS/NIST (Gaithersburg): 1975-1999 & 2001-2008
INDUCTED: 2013
B: 1939, New York, NY
EDUCATION:
City College of NY, BS (Mathematics), 1962
Trinity College, MS (Mathematics), 1966
Case Western Reserve University, PhD (Computer Science), 1973
CITATION:
For outstanding contributions in cyber security, the founding director of NIST’s Computer Security Division, and nationally and internationally recognized leader in the development of cyber security standards.
POSITIONS HELD AT NBS/NIST:
Computer Scientist, Systems and Software Technology Division, Institute for Computer Sciences and Technology (ICST), 1975-1979
Manager, Security Management and Evaluation Group, ICST, 1979-1986
Chief, Systems Components Division, ICST, 1986-1987
Chief, Computer Security Division (CSD), Information Technology Laboratory (ITL), 1987-1999
Senior Research Scientist, CSD, ITL, 2001-2008
HONORS:
NIST Bronze Medal (1985) and U.S. Department of Commerce Silver Medal (1987)
Senior Executive Service, DoC/NIST (1988)
Senior Level Expert, NSA (1999)
Senior Research Scientist, NIST (2001)
Washington Academy of Sciences Award for Outstanding Contributions in the Field of Mathematics and
Computer Science (2003)
MEMBERSHIPS:
IEEE Life Member
PUBLICATIONS:
More than 30 publications, including:
Ross, R. and Katzke S., Swanson, M., Stoneburner, G., and Johnson, A., Guide for the Security Certification and Accreditation of Federal Information Systems, NIST Special Publication 800-37 (May 2004)
Ross, R. and Katzke S., Standards for Security Categorization of Federal Information and Information Systems, FIPS Publication 199 (February 2004)
Ross, R. and Katzke S., Swanson, M., Stoneburner, G., Johnson, A., Rogers, G., and Lee, A., Recommended Security Controls for Federal Information Systems, NIST Special Publication 800-53 (February 2005)
Ross, R. and Katzke S., Minimum Security Requirements for Federal Information and Inf
Measurement of Scattering and Absorption Cross Sections of Microspheres for Wavelengths between 240 nm and 800 nm
No full textA commercial spectrometer with a 150 mm integrating sphere (IS) detector was used to estimate the scattering and absorption cross sections of monodisperse polystyrene microspheres suspended in water. Absorbance measurements were performed with the sample placed inside the IS detector. The styrene absorption was non zero for wavelengths less than 300 nm. Correction for fluorescence emission by styrene was carried out and the imaginary part of the index of refraction, ni, was obtained. Absorbance measurements with the sample placed outside the IS detector were sensitive to the loss of photons from the incident beam due to scattering. The absorbance data was fitted with Lorenz-Mie scattering cross section and a correction for the finite acceptance aperture of the spectrometer. The fit parameters were the diameter, the suspension concentration, and the real part of the index of refraction. The real part of the index was parameterized using an expansion in terms of powers of the inverse wavelength. The fits were excellent from 300 nm to 800 nm. By including the imaginary part obtained from the absorbance measurements below 300 nm, it was possible to obtain a good fit to the observed absorbance data over the region 240 nm to 800 nm. The value of ni at 266 nm was about 0.0060�0.0016 for microspheres with diameters of 1.5 �m, 2.0 �m, and 3.0 �m. The scattering cross section, absorption cross section, and the quantum yield at 266 nm of microsphere with a diameter of 2.0 �m was 5.65�0.01 �m2, 1.54�0.03 �m2, and 0.027�0.002 respectively. The styrene absorption reduces the scattering cross section by 20 % at 266 nm
Long-Wavelength Beam Steerer Based on a Micro-Electromechanical Mirror
No full textCommercially available mirrors for scanning long-wavelength beams are too large for high-speed imaging. There is a need for a smaller, more agile pointing apparatus to provide images in seconds, not minutes or hours. A fast long-wavelength beam steerer uses a commercial micro-electro-mechanical system (MEMS) mirror controlled by a high-performance digital signal processor (DSP). The DSP allows high-speed raster scanning of the incident radiation, which is focused to a small waist onto the 9mm2, gold-coated, MEMS mirror surface, while simultaneously acquiring an undistorted, high spatial-resolution image of an object. The beam steerer hardware, software and performance are described. The system can also serve as a miniaturized, high-performance long-wavelength beam chopper for lock-in detection
Temperature Effect on the Nanostructure of SDS Micelles in Water
No full textSodium dodecyl sulfate (SDS) surfactants form micelles when dissolved in water. These are formed of a hydrocarbon core and hydrophilic ionic surface. The small-angle neutron scattering (SANS) technique was used with deuterated water (D2O) in order to characterize the micelle structure. Micelles were found to be slightly compressed (oblate ellipsoids) and their sizes shrink with increasing temperature. Fits of SANS data to the Mean Spherical Approximation (MSA) model yielded a calculated micelle volume fraction which was lower than the SDS surfactant (sample mixing) volume fraction; this suggests that part of the SDS molecules do not participate in micelle formation and remain homogeneously mixed in the solvent. A set of material balance equations allowed the estimation of the SDS fraction in the micelles. This fraction was found to be high (close to one) except for samples around 1 % SDS fraction. The micelle aggregation number was found to decrease with increasing temperature and/or decreasing SDS fraction
Wen-li Wu
No full textWEN-LI WU
NBS/NIST (Gaithersburg): 1979-2013
INDUCTED: 2013
B: 1945, Chentu, China
EDUCATION:
National Taiwan University, BS (Mechanical Engineering), 1967
Massachusetts Institute of Technology, MS (Mechanical
Engineering), 1969
Massachusetts Institute of Technology, PhD (Mechanical
Engineering), 1972
CITATION:
For advancing world-class applications of x-ray and neutron
scattering to polymer physics in areas ranging from semiconductor
electronics to dental composites.
POSITIONS HELD AT NBS/NIST:
Materials Research Engineer, Polymers Division, MSEL, 1979-1998
Group Leader, Polymers Division, MSEL, 1998-2002
Senior Scientist, Polymers Division, MSEL, 2002-2004
NIST Fellow, Polymers Division, MML, 2004-2013
HONORS:
NIST Bronze Medals (1984, 2010) and U.S. Department of Commerce Silver Medals (1987, 2006) and Gold Medal
(1992)
Fellow, the American Physical Society (1992)
Samuel Wesley Stratton Award (1997)
William P. Slichter Award (2001, 2007)
PMSE Fellow, American Chemical Society (2006)
Fellow, Neutron Scattering Society of America (2010)
MEMBERSHIPS:
American Physical Society
American Chemical Society
AMAG Advisory Member, SEMATECH
Advisory Board Member, Center on Polymer Interfaces and Macromolecular Assemblies (CPIMA) – Stanford
University
Organizing Committee Member, China Semiconductor Technology International Conference
PUBLICATIONS:
More than 240 publications, including:
Wu, W., “Thermodynamic Approach for Stress Induced Crystallization in Cross linked Rubber,” J. Polym. Sci., Polym. Phys. Ed., 16(9), 1671 (1978)
Wu, W. and McKinney, J.E., “Influence of Chemicals on Wear of Dental Composites,” J. Dental Res. 61(10), 1180 (1982)
Orts, W.J., van Zanten, J.H., Wu, W., Satija, S.K., “Temperature Dependent Thickness of Ultrathin Polystyrene Films on Silicon”. Phys. Rev. Lett., 71(6), 867 (1993)
Wu, W., “Off-specular Reflection from Flat Interfaces”, J. Chem. Phys., 101(5), 4198 (1994)
Lin, E.K., Soles, C.L., Goldfarb, D.L., Trinque, B.C., Burns, S.D., Jones, R.L., Lenhart, J.L., Angelopoulos, M.,
Willson, C.G., Satija, S.K., Wu, W., “Direct Measurement of the Reaction Front in Chemically Amplified
Photoresists with Nanometer Resolution”, Science, 297, 372 (2002)
Hu, T., Jones, R.L., Wu, W., Lin, E.K., Lin, Q., Keane, D., Weigand, S., Quintana, J., “Small angle X-ray
scattering metrology for sidewall angle and cross section of nanometer scale line gratings”, J. Appl. Phys., 96(4), 1983 (2004