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In the center of this image is a sample of red and gray sandstone from Marquette, Michigan, part of the NIST stone wall
No full textThe NIST stone wall was built using 2,352 stones from 47 US states and 320 from 16 foreign countries. The wall is approximately 12 m long, 4 m high, 0.6 m thick at the bottom, and 0.3 m at the top. The aim of the wall construction was to study the aging process of stones used in construction under outside weathering conditions
Jack Sugar
No full textJACK SUGAR
NBS/NIST: 1960-1995
INDUCTED: 2017
Birth: 22 December 1929, Baltimore, Maryland
Death: 15 August 2009, Maryland
EDUCATION:
Johns Hopkins University, BS (Physics), 1955
Johns Hopkins University, PhD (Physics), 1960
CITATION:
For elucidating, both experimentally and theoretically, the atomic structure of rare earth atoms and for critically evaluating and compiling their spectral properties.
POSITIONS HELD AT NBS/NIST:
Physicist, Atomic Spectroscopy Group, Physics Laboratory (PL), 1960-1995
Guest Researcher/Contractor, Atomic Spectroscopy Group, PL, 1995-1999
HONORS:
Fulbright Grant (1966)
Chairman, Atomic Spectroscopy Topical Group of the Optical Society of America (1970-1974)
Fellow, Optical Society of America (1970)
U.S. Department of Commerce Silver Medal (1971)
U.S. Department of Commerce Gold Medal (1994)
MEMBERSHIPS:
Optical Society of America
Phi Beta Kappa
PUBLICATIONS:
More than 170 publications including:
Sugar, J., "Energy Levels of Pr3+ in the Vapor State," Phys. Rev. Lett. 14, 731 (1965)
Sugar J., "Potential-Barrier Effects in Photoabsorption. II. Interpretation of Photoabsorption Resonances in
Lanthanide Metals of the 4d-Electron Threshold," Phys. Rev. B 5, 1785 (1972)
Sugar J. and Reader, J., "Ionization Energies of Doubly and Triply Ionized Rare Earths," J. Chem. Phys. 59, 2083
(1973)
Sugar, J. and Kaufman, V., "Tokamak-Generated Tungsten Radiation Identified in Ag I Isoelectronic Sequence
(W XXVIII)," Phys. Rev. A 21, 2096 (1980)
Reader, J., Sugar, J., Acquista, N., and Bahr, R., "Laser-Produced and Tokamak Spectra of Lithiumlike Iron,
Fe23+," J. Opt. Soc. Am. B 11, 1930 (1994)
Shirai, T., Sugar, J., Musgrove, A., and Wiese, W.L., "Spectral Data for Highly Ionized Atoms: Ti, V, Cr, Mn,
Co, Ni, Cu, Kr, and Mo," J. Phys. Chem. Ref. Data, Monograph No. 8, AIP Press, Melville, NY 632 pp (2000
Partial Ionization Cross Sections of Organic Molecules
No full textPartial ionization cross sections are the absolute yields of specific ions from an electron-molecule collision. They are necessary for..modeling plasmas and for determining the sensitivity of mass spectrometers, among other applications. One mass-spectrometric..application is estimating the abundance of organic compounds on Mars, as sampled by the rover Curiosity. This is a report of..semitheoretical data obtained for a collection of organic molecules identified as possible biomarkers in this exotic context
Method for Measuring the Phase Spectrum of the Output of a Frequency Source Used in the Calibration of an Electroshock Weapon Characterization System
No full textElectroshock weapons (ESWs) output a transient burst of impulse-like high-voltage electrical signals that can incapacitate a human target. To ensure safe and effective operation of ESW, their outputs must be accurately measured. Accordingly, the systems used to measure the output of an ESW must be accurately characterized, and their response functions must be known for subsequent processing of the ESW output waveforms (current and high voltage). The long epochs (> 5 s) and high-bandwidth frequency content (> 200 MHz) of the ESW output require unique measurement instrumentation and calibration tools. A frequency-domain swept-frequency method is proposed here for the calibration of the phase response of an ESW measurement system. This method, although motivated by the ESW measurement application, is also applicable to other systems
Joseph Reader
No full textJOSEPH READER
NBS/NIST: 1963-2014
INDUCTED: 2016
Birth: 1 December 1934, Chicago, Illinois
EDUCATION:
Purdue University, BS (Physics), 1956; MS (Physics), 1957 University of California, Berkeley, PhD (Physics), 1962
CITATION:
For exceptional contributions to development of the NIST atomic reference data program covering production, evaluation, collection, and dissemination of the best atomic data in the world.
POSITIONS HELD AT NBS/NIST:
Physicist, Atomic Spectroscopy Group, Physics Lab. (PL)/Physical Measurement Lab. (PML), 1963-1999
Group Leader, Atomic Spectroscopy Group, PL, 1999-2008
Director, NIST Atomic Spectroscopy Data Center, PL/PML, 2008-2014
NIST Fellow, PML, 2010-2014
Guest Researcher, Atomic Spectroscopy Group, Quantum Measurement Division, PML, 2014-present
HONORS:
Fellow, Optical Society of America (1972)
Fellow, American Physical Society (1984)
U.S. Department of Commerce Silver Medal (1979) and Gold Medal (1989)
Optical Society of America, William F. Meggers Award (1992)
NASA Group Achievement Award (2006)
Washington Academy of Sciences - Physical Science Award (2009)
Visiting Scholar, Dynasty Foundation, Russia (2010)
NIST Edward Uhler Condon Award (2013)
NIST Judson C. French Award (2015)
Sigma Xi
MEMBERSHIPS:
American Physical Society; Optical Society of America
Chairman, National Academy of Sciences-National Research Council Committee on Line Spectra of the Elements
( 1976-1979)
Editor, "Line Spectra of the Elements" published annually in the Handbook of Chemistry and Physics
Editorial Advisory Panel, Optics Letters (1977)
U. S. Representative to the International Atomic Energy Agency Committee on Atomic and Molecular Data, International Fusion Research Council (2011-2015)
PUBLICATIONS:
More than 190 publications and one patent including:
Kramida, A., Ralchenko, Y., Reader, J., and NIST ASD Team, NIST Atomic Spectra Database, NIST (2015) Reader, J. and Clark C.W., "1932 A Watershed Year in Nuclear Physics," Physics Today, 66, 44 (2013)
Reader, J., "Spectrum and Energy Levels of Five-Times Ionized Molybdenum, Mo VI," Journal of Physics B:
Atomic, Molecular and Optical Physics, 43, 074024 (2010)
Feldman, U. and Reader J., Method and Apparatus for Producing a Photopumped VUV Laser in Mo6+ Ion
Containing Plasma, U.S. Patent No. 4,939,744 (1990)
Reader, J. and Luther, G., "Spectra of Highly-Charged Cu- and Zn-like Ions," Physical Review Letters, 45, 609
(1980)
Reader, J., "Optimizing Czerny-Turner Spectrographs: A Comparison between Analytic Theory and Ray Tracing," Journal of the Optical Society of America, 59, 1189 (1969
An Analysis of Technologies and Standards for Designing Smart Manufacturing Systems
No full textSmart manufacturing is defined by high degrees of automation. Automation, in turn, is defined by clearly defined processes. The use of standards in this environment is not just commonplace, but essential to creating repeatable processes and reliable systems.
As with the rest of society, manufacturing systems are becoming more tightly connected through advances in information and communication technologies (ICT). As a result, manufacturers are able to receive information from their business partners and operational units much more quickly and are expected to respond quickly as well. Quick responses to changes in a manufacturing system are much more challenging than the responses that we have come to expect in other aspects of our lives.
Manufacturing revolves around heavy capital investments to rapidly produce large amounts of product in anticipation of steady streams of commerce. Changes under these conditions not only disrupt the operations, slowing the production of goods, but also create difficulties with managing the capital investments. These are challenges manufacturers face daily. A large part of these challenges is understanding how best to refit manufacturing facilities to respond to variability, and how to plan new production facilities. By analyzing the information that is available in a manufacturing system, manufacturers can make more informed decisions as to how to respond to change. Advances in the technological infrastructure underlying manufacturing systems are enabling more reliable and timely flow of information across all levels of the manufacturing operation. We propose that effective utilization of such operational information will enable more automated, agile responses to the changing conditions, i.e. Smart Manufacturing.
In this paper, we analyze the sources and the standards supporting the flow of that information throughout the enterprise. The analysis is based an intersection of two reference models: the Factory Design and Improvement (FDI) process and the ISA88 hierarchical model of manufacturing operations. The FDI process consists of a set of high-level activities for designing and improving manufacturing operations. The ISA88 hierarchical model specifies seven levels of control within a manufacturing enterprise
Helmholtz Energy Transformations of Common Cubic Equations of State for Use with Pure Fluids and Mixtures
No full textComprehensive sets of derivatives of Helmholtz energy transformations of several common cubic equations of state are presented. These derivatives can be used for implementing cubic equations of state into complex multi-fluid mixture models when no multiparameter equation of state is available for a mixture component. Thus, pure fluids (or mixtures) for which no accurate model exists in literature can be modeled with a relatively small set of fluid property data. Composition derivatives have been calculated for the cases where the last mole fraction is either an independent or dependent variable. Analytic derivatives are presented up to fourth order in the independent variables combined with composition derivatives up to third order; this set covers the common requirements for derivatives needed in the state-of-the-art thermophysical property libraries. A C++ implementation of the presented analyses, data for computer code validation, and information about the computer algebra tools used to calculate the intermediate derivatives are provided as supplementary information
(Transcript) Oral history interview of Joan R. Rosenblatt, March 31, 2016/ [persons present]: Bill Gadzuk, Jim Filliben, Hans Oser, Ron Boisvert, Jeffrey Fong (via phone), Barbara Uglik (via written word), Kristen Frederick-Frost.
No full textDr. Joan Rosenblatt had a distinguished career at NBS as a mathematician/statistician, chief of Statistical Engineering in the Center for Applied Math, and Director of the Computing and Applied Math Lab
Barbara Uglik's Notes for the Oral History Interview with Joan Rosenblatt
No full textDr. Joan Rosenblatt had a distinguished career at NBS as a mathematician/statistician, chief of Statistical Engineering in the Center for Applied Math, and Director of the Computing and Applied Math Lab