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Optical-Fiber Power Meter Comparison between NIST and LAMETRO
No full textWe describe the results of a comparison of reference standards between the National Institute of Standards and Technology (NIST, USA) and Laboratorio de Metrologia, Instituto Costarricense de Electricidad (LAMETRO-ICE, Costa Rica) for optical fiber-based power measurements at wavelengths of 1310.0 nm, 1550.2 nm, and 1625.0 nm. We compared the laboratories' reference standards by means of a commercial temperature-controlled optical-fiber power meter. Measurement results showed the largest difference of less than 5.8 parts in 10(3), which is within the combined standard (k = 1) uncertainty for the two laboratories' reference standards
Apparatus for Characterizing Gas-Phase Chemical Precursor Delivery for Thin Film Deposition Processes
No full textThin film vapor deposition processes, e.g., chemical vapor deposition, are widely used in high-volume manufacturing of electronic and optoelectronic devices. Ensuring desired film properties and maximizing process yields require control of the chemical precursor flux to the deposition surface. However, achieving the desired control can be difficult due to numerous factors, including delivery system design, ampoule configuration, and precursor properties. This report describes an apparatus designed to investigate such factors. The apparatus simulates a single precursor delivery line, e.g., in a chemical vapor deposition tool, with flow control, pressure monitoring, and a precursor-containing ampoule. It also incorporates an optical flow cell downstream of the ampoule to permit optical measurements of precursor density in the gas stream. From such measurements, the precursor flow rate can be determined, and, for selected conditions, the precursor partial pressure in the headspace can be estimated. These capabilities permit this apparatus to be used for investigating a variety of factors that affect delivery processes. The methods of determining the pressure to (1) calculate the precursor flow rate and (2) estimate the headspace pressure are discussed, as are some of the errors associated with these methods. While this apparatus can be used under a variety of conditions and configurations relevant to deposition processes, the emphasis here is on low-volatility precursors that are delivered at total pressures less than about 13 kPa downstream of the ampoule. An important goal of this work is to provide data that could facilitate both deposition process optimization and ampoule design refinement
Translator from Extended SysML to Physical Interaction and Signal Flow Simulation Platforms
No full textDesigning complex systems often requires engineers from multiple disciplines (mechanical, electrical, production, and so on) to communicate with each other and exchange system design information. Systems engineering models are a cross-disciplinary foundation for this process, but are not well-integrated with specialized engineering information, leading to redundant and inconsistent system specifications. The software provided here translates system models in the Systems Modeling Language (SysML) to physical interaction and signal flow (also known as lumped-parameter, one-dimensional, or network) files on two simulation platforms used in many engineering domains.
The translator implements the SysML Extension for Physical Interaction and Signal Flow Simulation (SysPhS), published by the Object Management Group. It can generate Modelica1 or Simulink/Simscape files from SysML models extended according to the SysPhS specification. Several example models are provided to demonstrate the translator in various engineering domains
Forced Edges and Graph Structure
No full textFor a degree sequence, we define the set of edges that appear in every labeled realization of that sequence as forced, while the edges that appear in none are define as forbidden. We examine the structure of graphs in which the degree sequences contain either forced or forbidden edges. The results include the determination of the structure of the forced or forbidden edge sets, the relationship between the sizes of forced and forbidden sets for a sequence, and the structural consequences to their realizations. This includes showing that the diameter of every realization of a degree sequence containing forced or forbidden edges is no greater than 3, and that these graphs are maximally edge-connected
Process Monitoring Dataset from the Additive Manufacturing Metrology Testbed (AMMT): "Three-Dimensional Scan Strategies"
No full textThis document provides details on the files available in the dataset “20180708-HY-3D Scan Strategies” pertaining to a three-dimensional (3D) additive manufacturing (AM) build performed on the Additive Manufacturing Metrology Testbed (AMMT) by Ho Yeung on July 8, 2018. The files include the input command files, in-situ process monitoring data, and metadata. This data is the first of future planned “AMMT Process Monitoring Datasets,” as part of the Metrology for Real-Time Monitoring of Additive Manufacturing project at the National Institute of Standards and Technology (NIST)
Design, Manufacturing, and Inspection Data for a Three-Component Assembly
No full textTo better understand and address the challenges faced in linking all stages of a manufacturing and design process, an investigative fabrication process was designed and enacted as part of a collaboration between the National Institute of Standards and Technology (NIST) and the Manufacturing Technology Centre (MTC).This collaboration sought to test selected open standards’ ability to integrate the product-lifecycle stages of engineering design, manufacturing, and quality assurance through a thorough implementation of a small scale model-based enterprise (MBE). A dataset was generated as a result of the collaboration. This article provides details about the dataset and instructions for how to access and/or retrieve it
Robert L. Watters Jr.
No full textROBERT L. WATTERS, JR.
NBS/NIST: 1976-2016
INDUCTED: 2019
Birth: 1948, Schenectady, New York
EDUCATION:
University of Notre Dame, BS (Chemistry), 1970 University of Wisconsin, PhD (Analytical Chemistry), 1976
CITATION: For lifetime contributions to measurement services at NIST. He championed the implementation of the Baldrige quality framework that impacted Standard Reference Materials, calibration services, and Standard Reference Data, and his leadership on international standards committees that promoted SRMs globally.
POSITIONS HELD AT NBS/NIST:
Research Chemist, Inorganic Analytical Research Division (IARD), Center for Analytical Chemistry
(CAC), National Measurement Laboratory (NML), 1976-1987
Group Leader, Spectrochemical Methods, IARD, CAC, NML, 1987-1989
Program Analyst, Office of the NIST Director, 1989-1991
Group Leader, Atomic and Molecular Spectrometry (and Electrochemical Methods in 1993) IARD,
Chemical Science and Technology Laboratory (CSTL), 1991-1995
Deputy Division Chief and Group Leader of Spectrochemical Methods, Analytical Chemistry Division,
CSTL, 1995-1996
Senior Scientific Advisor, CSTL, 1996-2000
Program Manager, International Comparisons Database; Senior Scientific Advisor, Technology Services,
2000-2004
Chief, Measurement Services Division, Technology Services, 2004-2011
Associate Director for Measurement Services and Director, Office of Reference Materials, Material
Measurement Laboratory, 2011-2016
HONORS:
Society of Applied Spectroscopy National Tour Speaker (1987)
NIST Bronze Medal (1999)
U.S. Department of Commerce Silver Medal (2009)
MEMBERSHIPS:
ISO Committee on Reference Materials
Federation of Analytical Spectroscopy Societies
ASTM International
Society for Applied Spectroscopy
American Chemical Society
PUBLICATIONS:
More than 35 publications including:
Turk, G.C. and Watters, R.L. Jr., "Resonant Laser-Induced Ionization of Atoms in an Inductively Coupled
Plasma", Anal. Chem. 57, 1979 (1985)
Watters, R.L., Jr., Spiegelman, C.H., and Carroll, R.J., "Error Modeling and Confidence Interval
Estimation for Inductively Coupled Plasma Calibration Curves", Anal. Chem. 59, 1639 (1987)
Watters, R.L. Jr., Carroll, R.J., and Spiegelman, C.H., "Heteroscedastic Calibration Using Analyzed
Reference Materials as Calibration Standards", Proceedings of the Symposium of Accuracy in Trace
Analysis - Accomplishments, Goals and Challenges, J. Res. Natl. Bur. Stand. 93, 264 (1988)
Watters, R.L. Jr., DeVoe, J.R., Shen, F.H., Small, J.A., and Marinenko, R.B., "Characteristics of Aerosols
Produced by the Spark Discharge", Anal. Chem. 61, 1826 (1989)
Turk, G.C., Yu, L.J., Watters, R.L. Jr., and Travis, J.C., "Laser-Induced Ionization of Atoms in a Power-Modulated Inductively Coupled Plasma", Appl. Spectrosc. 46, 1217 (1992
Raymond D. Mountain
No full textRAYMOND D. MOUNTAIN
NBS/NIST: 1963–2008
INDUCTED: 2018
B: 1937, Great Falls, Montana
EDUCATION:
Montana State College, BS (Physics), 1959
Case Western Reserve, PhD (Physics), 1963
CITATION:
For major advances in the fundamental, molecular-level understanding of complex fluids, in particular water, through the pioneering development of light scattering theory and high-performance scientific computing at NIST.
POSITIONS HELD AT NBS/NIST:
Postdoctoral Research Associate, Heat Division, Institute for Basic Standards (IBS) 1963-1965
Physicist, Heat Division, IBS 1965-1967
Section Chief, Statistical Physics, Heat Division, IBS, 1968-1978
Research Physicist, Statistical Physics, Thermophysics Division, Center for Thermodynamics and Molecular Science, National Measurement Laboratory, 1978-1986
NIST Fellow and Research Physicist, Physical and Chemical Properties Division, Chemical Science and Technology Laboratory, 1986-2008
Scientist Emeritus, Chemical Sciences Division, Material Measurement Laboratory, 2008-present
HONORS:
Outstanding Scientist of the Year, Maryland Academy of Science (1967)
John Simon Guggenheim Fellowship (1974)
NBS Bronze Medal (1980)
U.S. Department of Commerce Gold Medal (1983)
Fellow, American Physical Society,
Fellow, Washington Academy of Sciences
MEMBERSHIPS:
American Chemical Society
American Physical Society
Sigma Xi
Washington Academy of Sciences
PUBLICATIONS:
More than 150 publications including:
Mountain, R.D., "Spectral Distribution of Scattered Light in a Simple Fluid", Rev. Mod. Phys., 38 (1), 205-14 (1966)
Mountain, R.D., "Thermal Relaxation and Brillouin Scattering in Liquids", J. Res. Natl. Bur. Stand. Sect. A. Physics Chem., A 70 (3), 207-220 (1966)
Mountain, R.D., "Molecular Dynamics Investigation of Expanded Water at Elevated Temperatures", J. Chem. Phys., 90 (3), 1866-1870 (1989)
Mountain, R.D., "Comparison of a Fixed-Charge and a Polarizable Water Model", J. Chem. Phys., 103 (8),
3084-3090 (1995)
Mountain, R.D. and Thirumalai, D., "Hydration for a Series of Hydrocarbons", Proc. Natl. Acad. Sci. U. S. A.,
95 (15), 8436-8440 (1998)
Mountain, R.D., "Ergodic Convergence Times for Molecular Liquids", Int. J. Thermophyics 31, 766-773 (2010
Robert J. Celotta
No full textROBERT J. CELOTTA
NBS/NIST: 1971–2017
INDUCTED: 2018
B: 1943, New York, New York
EDUCATION:
City College of New York, BS (Physics), 1964
New York University, PhD (Physics), 1969
CITATION: For outstanding service as the founding Director of CNST and for his groundbreaking research in atomic and molecular physics, surface physics, and solid state physics.
POSITIONS HELD AT NBS/NIST:
Postdoctoral Research Associate, Joint Institute for Laboratory Astrophysics, 1969-1971
Physicist, Optical Physics Division, Institute for Basic Standards, 1971-1979
Leader, Electron Physics Group, Electron and Optical Physics Division, Physics Laboratory, 1979-2007
NIST Fellow, Physics Laboratory, 1987-2007
Director, Center for Nanoscale Science and Technology, 2007-2017
HONORS:
U.S. Department of Commerce Silver Medal (1978) and Gold Medal (1987)
NBS Edward Uhler Condon Award (1980)
IR-100 Award (1980 and 1985)
Federal Laboratory Consortium Award for Excellence in Technology Transfer (1988)
NIST William P. Slichter Award (1992)
Gaede-Langmuir Prize, American Vacuum Society (1994)
Presidential Distinguished Rank Award (2006 and 2015)
APS Joseph F. Keithley Award for Advances in Measurement Science (2015)
Fellow, American Association for the Advancement of Science, American Physical Society, American Vacuum Society, Washington Academy of Sciences
MEMBERSHIPS:
American Association for the Advancement of Science
American Physical Society
American Vacuum Society
Washington Academy of Sciences
PUBLICATIONS:
Four patents and more than 250 publications including:
Celotta, R.J., Bennett, R.A., Hall, J.L., Siegel, M.W., and Levine, J., "Molecular Photodetachment Spectrometry. II. The Electron Affinity of O2 and the Structure of O¯2", Physical Review A 6, 631 (1972)
Pierce, D.T., Celotta, R.J., Wang, G.-C., et al., "GaAs Spin Polarized Electron Source", Review of Scientific Instruments 51, 478 (1980)
Unguris, J., Celotta, R.J., and Pierce, D.T., "Observation of Two Different Oscillation Periods in the Exchange Coupling of Fe/Cr/Fe (100)", Physical Review Letters 67, 140 (1991)
Whitman L.J., Stroscio, J.A., Dragoset, R.A., and Celotta, R.J., "Manipulation of Adsorbed Atoms and Creation of New Structures on Room-Temperature Surfaces with a Scanning Tunneling Microscope", Science 251, 1206 (1991)
McClelland, J.J., Scholten, R.E., Palm, E.C., and Celotta, R.J., "Laser-Focused Atomic Deposition", Science 262, 877 (1993