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Treasure of the past: II - The atomic weight of bromine (Reprinted from Bulletin of the Bureau of Standards, vol 9, pg 131-150, 1913)
No full textCapability in Rockwell C scale hardness
No full textA measurement system is capable if it produces measurements with uncertainties small enough for demonstration of compliance with product specifications. To establish the capability of a system for Rockwell C scale hardness, one must assess measurement uncertainty and, when hardness is only an indicator, quantify the relation between hardness and the product property of real interest. The uncertainty involves several components, which we designate as lack of repeatability, lack of reproducibility, machine error, and indenter error. Component-by-component assessment leads to understanding of mechanisms and thus to guidance on system upgrades if these are necessary. Assessment of some components calls only for good-quality test blocks, and assessment of others requires test blocks that NIST issues as Standard Reference Materials (SRMs). The important innovation introduced in this paper is improved handling of the hardness variation across test-block surfaces. In addition to hardness itself, the methods in this paper might be applicable to other local measurement of a surface
Robert P. Madden
No full textROBERT P. MADDEN
NBS/NIST: 1961 ‑ 1998
Birth: December 20, 1928, Schenectady, New York
Education:
University of Rochester, BS, 1950
Johns Hopkins University, PhD (Physics), 1956
Principal fields:
Spectroscopy; optical instrumentation; thin films; radiometry; synchrotron radiation
Positions held at NBS/NIST:
Chief, Far Ultraviolet Physics Section, Optical Physics Division
Leader, Far Ultraviolet Physics Group, Electron and Optical Physics Division
Director, Synchrotron Ultraviolet Radiation Facility (SURF)
National Synchrotron Light Source Research Program Coordinator
Honors:
U.S. Department of Commerce Silver Medal, 1964
U.S. Army Engineer R & D Laboratories Director's Medal for Technological Achievement, 1961
Washington Academy of Sciences Award for Scientific Achievement in the Physical Sciences, 1965
NBS Stratton Award, 1970
Optical Society of America William F. Meggers Award, 1978
U.S. President Meritorious Executive Award, 1982
Elected to Sigma Xi
Memberships:
American Physical Society (Fellow)
Optical Society of America (President; Fellow)
Council of Scientific Society Presidents
Washington Academy of Sciences (Fellow)
Publications:
Many technical papers in the field of atomic and molecular spectroscopy, optical instrumentation, surface physics, thin films and radiometry. Five book chapters
Responding to National Needs, Cover
No full textResponding to National Needs: The National Bureau of Standards Becomes the National Institute of Standards and Technology, 1969-1993 (SP955) by James F. Schooley documents the organization's new assignments and responsibilities - from fire safety to computer security - as directed by Congress during the 1970s and 1980s. In 1988, Congress changed the institution's name and transformed it into the National Institute of Standards and Technology
Responding to National Needs, Supplement 1994-2009
No full textThe appendices of Special Publication 955, Responding to National Needs, are updated in this supplement, covering years 1994-2009
Oskars Petersons
No full textOSKARS PETERSONS
NBS/NIST: 1968 ‑ 1994
Birth: October 7, 1932, Similtene, Latvia
Education:
University of Toronto, BASc (Electrical Engineering), 1958
Carleton University, Ottawa, Canada, ME (Electrical Engineering), 1965
George Washington University, ScD (Electrical Engineering), 1974
Principal field:
Precision electrical and electronic measurements
Positions held at NBS/NIST:
Chief, High Voltage Measurements Section
Chief, Electrosystems Division
Chief, Electricity Division
Post‑retirement: Guest Researcher
Honors:
U.S. Department of Commerce: Silver Medal, 1971; Gold Medal, 1990
Institute of Electrical and Electronics Engineers Outstanding Paper Award, 1979
National Society of Professional Engineers, Federal Engineer of the Year Award, 1990
Memberships:
Institute of Electrical and Electronics Engineers (Life Fellow)
Publications:
Twenty‑five technical papers on electrical engineering, particularly on power system‑related measurements, high voltage capacitors, and instrument transformers; U.S. and Canadian patent on a high voltage capacitance bridge
High resolution gamma-ray spectroscopy: the first 85 years
No full textThis opening review attempts to follow the main trends in crystal diffraction spectrometry of nuclear gamma rays from its 1914 beginning in Rutherford's laboratory to the ultra-high resolution instrumentation realized in the current generation of spectrometers at the Institute Laue Langeven (ILL). My perspective is that of an instrumentalist hoping to convey a sense of our intellectual debt to a number of predecessors, each of whom realized a certain elegance in making the tools that have enabled much good science, including that to which the remainder of this workshop is dedicated. This overview follows some of the main ideas along a trajectory toward higher resolution at higher energies, thereby enabling not only the disentangling of dense spectra, but also allowing detailed study of aspects of spectral profiles sensitive to excited state lifetimes and interatomic potentials. The parallel evolution toward increasing efficiency while preserving needed resolution is also an interesting story of artful compromise that should not be neglected. Finally, it is the robustness of the measurement chain connecting gamma-ray wavelengths with optical wavelengths associated with the Rydberg constant that only recently has allowed gamma-ray data to contribute to determination of particle masses and fundamental constants, as will be described in more detail in other papers from this workshop