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Length and dimensional measurements at NIST
No full textThis paper discusses the past, present, and future of length and dimensional measurements at NIST. It covers the evolution of the SI unit of length through its three definitions and the evolution of NBS-NIST dimensional measurement from early linescales and gage blocks to a future of atom-based dimensional standards. Current capabilities include dimensional measurements over a range of fourteen orders of magnitude. Uncertainties of measurements on different types of material artifacts range down to 7x10(-8) m at 1 m and 8 picometers (pm) at 300 pm. Current work deals with a broad range of areas of dimensional metrology. These include: large-scale coordinate systems; complex form; microform; surface finish; two-dimensional grids; optical, scanning-electron, atomic-force, and scanning-tunneling microscopies; atomic-scale displacement; and atom-based artifacts
The candela and photometric and radiometric measurements
No full textThe national measurement system for photometric and radiometric quantities is presently based upon techniques that make these quantities traceable to a high-accuracy cryogenic radiometer. The redefinition of the candela in 1979 provided the opportunity for national measurement laboratories to base their photometric measurements on optical detector technology rather than on the emission from high-temperature blackbody optical sources. The ensuing technical developments of the past 20 years, including the significant improvements in cryogenic radiometer performance, have provided the opportunity to place the fundamental maintenance of photometric quantities upon absolute detector based technology as was allowed by the 1979 redefinition. Additionally, the development of improved photodetectors has had a significant impact on the methodology in most of the radiometric measurement areas. This paper will review the status of the NIST implementation of the technical changes mandated by the 1979 redefinition of the candela and its effect upon the maintenance and dissemination of optical radiation measurements
Studies of excess heat and convection in a water calorimeter
No full textTo explain a difference of 0.5 % between the absorbed-dose standards of the National Institute of Standards and Technology (NIST) and the National Research Council of Canada (NRCC), Seuntjens et al. suggest the fault lies with the NIST water calorimeter being operated at 22 degreesC and the method with which the measurements were made. Their calculations show that this difference is due to overprediction of temperature rises Of Six Consecutive Co-60 radiation runs at NIST. However, the consecutive runs they refer to were merely preliminary measurements to determine the procedure for the NIST beam calibration. The beam calibration was determined from only two consecutive runs followed by water circulation to re-establish temperature equilibrium. This procedure was used for measurements on 77 days, with 32 runs per day. Convection external to the glass cylindrical detector assembly performed a beneficial role. It aided (along with conduction) in increasing the rate of excess heat transported away from the thin cylindrical wall. This decreased the rate of heat conducted toward the axially located thermistors. The other sources of excess heat are the: (1) non-water materials in the temperature probe, and (2) exothermic effect of the once-distilled water external to the cylinder. Finite-element calculations were made to determine the separate and combined effects of the excess heat sources for the afterdrift. From this analysis, extrapolation of the measured afterdrifts of two consecutive runs to mid radiation leads to an estimated overprediction of no more than about 0.1 %. Experimental measurements contradict the calculated results of Seuntjens et al. that convective motion (a plume) originates from the thermistors operated with an electrical power dissipation as low as 0.6 LW, well below the measured threshold of 50 micro W. The method used for detecting a plume was sensitive enough to measure a convective plume (if it had started) down to about the 10 micro W power level. Measurements also contradict the NRCC calculations in predicting the behavior of the NIST afterdrifts
Electron diffraction using transmission electron microscopy
No full textElectron diffraction via the transmission electron microscope is a powerful method for characterizing the structure of materials, including perfect crystals and defect structures. The advantages of electron diffraction over other methods, e. g., x-ray or neutron, arise from the extremely short wavelength ( approximate to2 pm), the strong atomic scattering, and the ability to examine tiny volumes of matter ( approximate to nm(3)). The NIST Materials Science and Engineering Laboratory has a history of discovery and characterization of new structures through electron diffraction, alone or in combination with other diffraction methods. This paper provides a survey of some of this work enabled through electron microscopy
