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(Transcript) SEAC oral history interview, September 18, 2002 / with Russell Kirsch, Ruth Cahn, Robert Elbourn, and Sidney Greenwald.
No full textDennis K. Branstad
No full textDENNIS K. BRANSTAD
Inducted: 2002
Citation:
For leadership in computer cryptography and information security research leading to federal standards for data encryption and password usage
Tenure: 1973 - 1994
Birth: 1939, Leland, Iowa
Education:
Iowa State University: BS (Mathematics), 1961, MS (Computer Science), 1968, PhD (Computer Science), 1970
Positions held:
Computer Scientist
Computer Security Group Leader
NBS/NIST Fellow
Honors:
U.S. Department of Commerce: Silver Medal, 1975; Gold Medal 1980
Iowa State University Alumni Citation of Merit, 1989
National Computer Security Award, 1995
Memberships:
Institute of Electrical and Electronics Engineers
American National Standards Institute: Member and Technical Committee Chairman
International Standards Organization: Member
Federal Information Processing Standards (FIPS) Committees: Member and Technical Committee Chairman
National Computer Security Conference: Cofounder and Technical Sessions Chairman
Publications:
FIPS 46: Data Encryption Standard (DES), Editor and Project Leader
FIPS 74: Guidelines for Implementing and Using the DES
FIPS 81: Password Usage Standard, Editor and Project Leader
Articles and Book Chapters on Information Processing Security Technolog
Burton H. Colvin
No full textBurton H. Colvin
Inducted: 2002
Citation: For management of important NBS/NIST programs in applied mathematics and academic affairs
Tenure: 1972-1994
Birth: 1916, West Warwick, Rhode Island
Death: 2001, Gaithersburg, Maryland
Education:
Brown University: BA, 1938; MA, 1938
University of Wisconsin, PhD, 1943
Positions held:
Chief, Applied Mathematics Division
Director, Center for Applied Mathematics
Director, Office of Academic Affairs
Deputy Director, Office of Academic Affairs
Honors:
U.S. Department of Commerce Silver Medal, 1978; Gold Medal, 1981
Presidential Meritorious Executive Rank Award, 1980
NIST Equal Employment Opportunity Award, 1988
Who’s Who in America
Memberships:
American Association for the Advancement of Science, Fellow and Council Member
Mathematical Association of America
National Council of Teachers of Mathematics
Society for Industrial and Applied Mathematics, President, and Chair, Board of Trustees
Professional activities:
Boeing Scientific Research Laboratories, Head, Mathematics and Information Sciences
Conference Board of Mathematical Sciences, Chair
Committee of Scientific Society Presidents
Council on Science Education, Vice Chair
Knox College, Seattle Comm. College, Advisory Committee
National Academy of Sciences, Board on Math Science Education, Board on Computer Science & Engineering
National Physical Sciences Consortium, Vice President & Board of Directors
Stanford University, Chair, Computer Science Advisory Committee
U.S. Air Force Office of Scientific Research, Chair, Math Sciences Evaluation Committe
Bernadine Dunfee
No full textBERNADINE L. DUNFEE
NBS: 1943-1976
Birth: May 13, 1914, Coal Grove, Ohio
Death: October 14, 2009
Education:
Wilmington College (Ohio), BS (education), 1939
George Washington University, MS (physics), 1955
Principal Field:
Voltage and Current Ratio Standards
Positions Held at NBS:
Project Leader, Electricity Division
Chief, Electrical Instruments Section, Electricity Division
NBS Museum Committee (w/ Francis Silsbee)
Honors:
U. S. Department of Commerce Silver Medal, 1969
NBS Nominee for Federal Women’s Award, 1968
Institute of Electrical and Electronics Engineers (IEEE): IEEE Prize Paper, 1960
Sigma Pi Sigma
Sigma Xi
Memberships:
Institute of Electrical and Electronics Engineers, Senior Member, Fellow
American National Standards Institute (ANSI)
Standards Alumni Association, Director, 1988-1994
Publications:
Numerous papers related to electrical standards and measurements, including:
Methods for Measuring the “Q” of Large Reactors (coauthor),Trans. AIEE Winter Meeting, (Jan-Feb 1956)
An A-C Kelvin Bridge for the Audio-Frequency Range, AIEE Trans., (May 1956)
A Standard Current Transformer and Comparison Method... , IRE Trans. Instr., (1960)
Method for Calibrating a Standard Volt Box, NBS J. Res. 67, (Jan-Mar 1963)
The Design and Performance of Multi-Range Current Transformer Standards for Audio Frequencies, IEEE Trans. IM-14, 4, (Dec. 1965)
An International Comparison of Current Ratios at Audio Frequencies (co-author), IEEE Trans. IM-14, 4, (Dec. 1965)
Electrical Standards and Measurements (co-author), ElectroTechnology, 79, (Jan. 1967)
Resistive Voltage Ratio Standard and Measuring Circuit (co-author), IEEE Trans. IM-19, (Nov. 1970
(Audio Part 2 of 4) SEAC oral history interview, September 18, 2002 / with Russell Kirsch, Ruth Cahn, Robert Elbourn, and Sidney Greenwald.
No full text
The 1997 North American Interagency Intercomparison of Ultraviolet Spectroradiometers Including Narrowband Filter Radiometers
No full textThe fourth North American Intercomparison of Ultraviolet Monitoring Spectro-radiometers was held September 15 to 25, 1997 at Table Mountain outside of Boulder, Colorado, USA. Concern over stratospheric ozone depletion has prompted several government agencies in North America to establish networks of spectroradiometers for monitoring solar ultraviolet irradiance at the surface of the Earth. The main purpose of the Intercomparison was to assess the ability of spectroradiometers to accurately measure solar ultraviolet irradiance, and to compare the results between instruments of different monitoring networks. This Intercomparison was coordinated by NIST and NOAA, and included participants from the ASRC, EPA, NIST, NSF, SERC, USDA, and YES. The UV measuring instruments included scanning spectroradiometers, spectrographs, narrow band multi-filter radiometers, and broadband radiometers. Instruments were characterized for wavelength accuracy, bandwidth, stray-light rejection, and spectral irradiance responsivity. The spectral irradiance responsivity was determined two to three times outdoors to assess temporal stability. Synchronized spectral scans of the solar irradiance were performed over several days. Using the spectral irradiance responsivities determined with the NIST traceable standard lamp, and a simple convolution technique with a Gaussian slit-scattering function to account for the different bandwidths of the instruments, the measured solar irradiance from the spectroradiometers excluding the filter radiometers at 16.5 h UTC had a relative standard deviation of +/-4% for wavelengths greater than 305 nm. The relative standard deviation for the solar irradiance at 16.5 h UTC including the filter radiometer was +/-4% for filter functions above 300 nm
The microcalorimeter for industrial applications
No full textTo achieve the dramatic increases in x-ray spectral resolution (<20 eV at 1.5k eV) desired by market segments such as the semiconductor industry, NIST developed a transition-edge sensor (TES) microcalorimeter. To bring this exciting, yet demanding, new technology to the industrial users, certain criteria must be addressed. Aspects of resolution, cooling and hold time, count rates as well as vibrations are considered. Data is presented to the present efforts to handle these issues as well as discussing development plans for the future
Stability of standard electrolytic conductivity solutions in glass containers
No full textThe stability of solutions having an electrolytic conductivity, kappa, of 5 micro S/cm to 100 000 micro S/cm packaged in glass screw-cap bottles, glass serum bottles, and glass ampoules was monitored for 1 year to 2 years. The conductivity was determined by measuring the ac resistance of the solution. Mass loss was also monitored for solutions packaged in bottles. The solutions were prepared using KCl in water (kappa greater than or equal to 100 micro S/cm) or KCl in 30 % (by mass) n-propanol 70 % (by mass) water (kappa less than or equal to 15 micro S/cm). The conductivity changes were compared by packaging type and by nominal kappa. The main causes of the kappa changes are evaporation (screw-cap bottles) and leaching (screw-cap bottles, serum bottles, and ampoules). Evaporation is determined from mass loss data; leaching occurs from the glass container with no change in mass. The choice of optimal packaging, which depends on the conductivity level, is the packaging in which kappa changes the least with time. Ampoules are the most suitable packaging for standards having nominal kappa values of 500 micro S/cm to 100 000 micro S/cm. Screw-cap bottles are most suitable for standards having a nominal kappa of 5 micro S/cm to 100 micro S/cm
