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The state of the art and practice in digital preservation
No full textThe goal of digital preservation is to ensure long-term access to digitally stored information. In this paper, we present a survey of techniques used in digital preservation. We also introduce representative digital preservation projects and case studies that provide insight into the advantages and disadvantages of different preservation strategies. Finally, the pros and cons of current strategies, critical issues for digital preservation, and future directions are discussed
Exploring collective dynamics in communication networks
No full textA communication network, such as the Internet, comprises a complex system where cooperative phenomena may emerge from interactions among various traffic flows generated and forwarded by individual nodes. To identify and understand such phenomena, we model a network as a two-dimensional cellular automaton. We suspect such models can promote better understanding of the spatial-temporal evolution of network congestion, and other emergent phenomena in communication networks. To search the behavior space of the model, we study dynamic patterns arising from interactions among traffic flows routed across shared network nodes, as we employ various configurations of parameters and two different congestion-control algorithms. In this paper, we characterize correlation in congestion behavior within the model at different system sizes and time granularities. As expected, we find that long-range dependence (LRD) appears at some time granularities, and that for a given network size LRD decays as time granularity increases. As network size increases, we find that long-range dependence exists at larger time scales. To distinguish effects due to network size from effects due to collective phenomena, we compare congestion behavior within networks of selected sizes to congestion behavior within comparably sized sub-areas in a larger network. We find stronger long-range dependence for sub-areas within the larger network. This suggests the importance of modeling networks of sufficiently large size when studying the effects of collective dynamics
Lattice matching (LM) - Prevention of inadvertent duplicate publications of crystal structures
No full textLattice-matching techniques have proved to be extremely effective for the identification of unknown crystalline materials. A commonly employed lattice-matching strategy is based on matching the reduced cell of an unknown against a database of known materials represented by their respective standard reduced cells. The success of the method relies on the fact that the lattice or the lattice plus chemical information (e. g., element types) is highly characteristic of a material-like a fingerprint. Because of its intrinsic power, the procedure has many and diverse applications-in materials characterization, in nano-technology, in epitaxial growth, in materials design, etc. An especially fruitful role for the method is in the journal publication process as the quality of the scientific literature can be enhanced. The focus herein is on the major role that lattice matching can play in the prevention of inadvertent duplicate publications of the same structure and in the determination of key cross-references
Optimization of wavelength daspersive x-ray spectrometry analysis conditions
No full textIn setting up the conditions for quantitative wavelength-dispersive electron microprobe analysis a number of parameters have to be defined for each element, namely accelerating voltage, beam current, and (for each element) x-ray line, spectrometer crystal, pulse-height analyser settings, background offsets, and counting times for peak and background. The choices made affect both the reliability of the results and the time taken to obtain a complete analysis. It is difficult for even an experienced user to arrive at the optimum set of conditions for any particular application, in view of the large number of interacting factors involved. Furthermore, optimum choices of some parameters are dependent not only on the concentration of the element concerned (for example, counting times) but also the concentrations of other elements which may have peaks that interfere with peak and/or background measurements, requiring alternative selections of x-ray line or spectrometer crystal. The various factors involved in arriving at an optimum routine and practical possibilities for computer-aided optimization are discussed here
Noise-parameter uncertainties: A Monte Carlo simulation
No full textThis paper reports the formulation and results of a Monte Carlo study of uncertainties in noise-parameter measurements. The simulator permits the computation of the dependence of the uncertainty in the noise parameters on uncertainties in the underlying quantities. Results are obtained for the effect due to uncertainties in the reflection coefficients of the input terminations, the noise temperature of the hot noise source, connector variability, the ambient temperature, and the measurement of the output noise. Representative results are presented for both uncorrelated and correlated uncertainties in the underlying quantities. The simulation program is also used to evaluate two possible enhancements of noise-parameter measurements: the use of a cold noise source as one of the input terminations and the inclusion of a measurement of the "reverse configuration," in which the noise from the amplifier input is measured directly
The analysis of particles at low accelerating voltages (<= 10 kV) with energy dispersive x-ray spectroscopy (EDS)
No full textIn recent years, there have been a series of advancements in electron beam instruments and x-ray detectors which may make it possible to improve significantly the quality of results from the quantitative electron-probe analysis of individual particles. These advances include: (1) field-emission gun electron beam instruments such as scanning electron microscopes (FEG-SEMs) that have high brightness electron guns with excellent performance at low beam energies, E-o less than or equal to 10 keV and (2) high-resolution energy-dispersive x-ray spectrometers, like the microcalorimeter detector, that provide high-resolution (< 10 eV) parallel x-ray collection. These devices make it possible to separate low energy (< 4 keV) x-ray lines including the K lines of carbon, nitrogen and oxygen and the L and M lines for elements with atomic numbers in the range of 25 to 83. In light of these advances, this paper investigates the possibility of using accelerating voltages less than or equal to 10 kV, as a method to improve the accuracy of elemental analysis for micrometer-sized particles
Effect of loading rate upon conventional ceramic microindentation hardness
No full textThe world standards for conventional ceramic hardness have varying requirements for control of loading rate during the indentation cycle. A literature review suggests that loading rate may affect measured hardness in some instances. In view of the uncertainty over this issue, new experiments over a range of indentation loading rates were performed on a steel, sintered silicon carbide, and an aluminum oxynitride. There was negligible effect upon Vickers hardness when loading rate was varied by almost four orders of magnitude from approximately 0.03 N/s to 10 N/s
A knowledge-navigation system for dimensional metrology
No full textGeometric dimensioning and tolerancing (GD&T) is a method to specify the dimensions and form of a part so that it will meet its design intent. GD&T is difficult to master for two main reasons. First, it is based on complex 3D geometric entities and relationships. Second, the geometry is associated with a large, diverse knowledge base of dimensional metrology with many interconnections. This paper describes an approach to create a dimensional metrology knowledge base that is organized around a set of key concepts and to represent those concepts as virtual objects that can be navigated with interactive, computer visualization techniques to access the associated knowledge. The approach can enable several applications. First is the application to convey the definition and meaning of GD&T over a broad range of tolerance types. Second is the application to provide a visualization of dimensional metrology knowledge within a control hierarchy of the inspection process. Third is the application to show the coverage of interoperability standards to enable industry to make decisions on standards development and harmonization efforts. A prototype system has been implemented to demonstrate the principles involved in the approach
High count rate electron probe microanalysis
No full textReducing the measurement uncertainty of quantitative analyses made using electron probe microanalyzers (EPMA) requires a careful study of the individual uncertainties from each definable step of the measurement. Those steps include measuring the incident electron beam current and voltage, knowing the angle between the electron beam and the sample (takeoff angle), collecting the emitted x rays from the sample, comparing the emitted x-ray flux to known standards (to determine the k-ratio) and transformation of the k-ratio to concentration using algorithms which includes, as a minimum, the atomic number, absorption, and fluorescence corrections. This paper discusses the collection and counting of the emitted x rays, which are diffracted into the gas flow or sealed proportional x-ray detectors. The representation of the uncertainty in the number of collected x rays collected reduces as the number of counts increase. The uncertainty of the collected signal is fully described by Poisson statistics. Increasing the number of x rays collected involves either counting longer or at a higher counting rate. Counting longer means the analysis time increases and may become excessive to get to the desired uncertainty. Instrument drift also becomes an issue. Counting at higher rates has its limitations, which are a function of the detector physics and the detecting electronics. Since the beginning of EPMA analysis, analog electronics have been used to amplify and discriminate the x-ray induced ionizations within the proportional counter. This paper will discuss the use of digital electronics for this purpose. These electronics are similar to that used for energy dispersive analysis of x rays with either Si(Li) or Ge(Li) detectors except that the shaping time constants are much smaller