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imec Publications (Interuniversity Microelectronics Centre)
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45628 research outputs found
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Quality parameters as modeling language abstractions for context-aware applications: An AAL case study
Author
Hoyos Jose Ramon
Preuveneers Davly
García-Molina Jesus J.
Publication venue
Publication date
31/12/9999
Field of study
No full text
Implementing scalable list detectors for MIMO-SDM in LTE
Author
Desset Claude
Lopez Estraviz Eduardo
Li Min
Fasthuber Robert
Publication venue
Publication date
31/12/9999
Field of study
No full text
Use of MIR-FTIR and k-value measurements to assess potential solutions to reduce damage during porous low-k integration
Author
Beynet Julien
De Roest David
+4 more
Rochat N.
Kellens Kristof
Verdonck Patrick
Sprey Hessel
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31/12/9999
Field of study
No full text
A ballistic electron emission microscopy (BEEM)-investigation of the effects of reactive ion etching (RIE) and of chemical pretreatment on III-V semiconductors
Author
Van Meirhaeghe R. L.
Vanalme G. M.
+3 more
Goubert L.
Cardon F.
Van Daele P.
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Publication date
31/12/9999
Field of study
No full text
KrF lithography for 130nm
Author
Finders Jo
van Schoot J.
+5 more
Vanoppen Peter
Dusa M.
Socha B.
Vandenberghe Geert
Ronse Kurt
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31/12/9999
Field of study
No full text
Mejora de la recarga de los vehiculos electricos
Author
Torres-Sanz Vicente
Sanguesa Julio
+3 more
Martinez Francisco
Garrido Piedad
Marquez-Barja Johann
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31/12/9999
Field of study
No full text
Thin-film transistors and circuits on plastic foil
Author
Heremans Paul
Genoe Jan
+10 more
Steudel Soeren
Myny Kris
Smout Steve
Vicca Peter
Grillberger Christiane
Hild Olaf R.
Furthner Francois
van der Putten Bas
Tripathi Ashutosh K.
Gelinck Gerwin H.
Publication venue
Publication date
31/12/9999
Field of study
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Spectral calibration for close-range hyperspectral images
Author
Liao Wenzhi
Ochoa Daniel
+3 more
Reyes Rodrigo
Criollo Ronald
Philips Wilfried
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31/12/9999
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Dielectric response of Ta2O5, Nb2O5, and NbTaO5 from first-principles investigations
Author
Clima Sergiu
Pourtois Geoffrey
+7 more
Hardy An
Van Elshocht Sven
Van Bael Marlies
De Gendt Stefan
Wouters Dirk
Heyns Marc
Kittl Jorge
Publication venue
Publication date
31/12/9999
Field of study
No full text
CD control comparison of step & repeat versus step & scan DUV lithography for sub-0.25 μm gate printing
Author
Ronse Kurt
Maenhoudt Mireille
+7 more
Marschner Thomas
Van den hove Luc
Streefkerk B.
Finders Jo
van Schoot J.
Luehrmann P.
Minvielle A.
Publication venue
Publication date
31/12/9999
Field of study
No full text
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imec Publications (Interuniversity Microelectronics Centre)
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