imec Publications (Interuniversity Microelectronics Centre)
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Transmission electron microscopy investigation of the crystallographic quality of silicon films grown epitaxially on porous silicon
No full textObservation and suppression of nickel germanide overgrowth on germanium substrates with patterned SiO2 structures
No full textCharacterisation of 2% mismatched InGaAs and InAsP layers, grown on different buffer layers and at different growth temperatures
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Miniaturized loaded crossed dipole antenna with omnidirectional radiation pattern in the horizontal plane
No full textImplications of gate-sided hydrogen release for post-stress degradation build-up after BTI stress
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Barrier integrity effect on leakage mechanism and dielectric reliability of copper/OSG interconnects
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