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imec Publications (Interuniversity Microelectronics Centre)
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45628 research outputs found
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A framework for functional testing of VNFs
Author
Nuriddinov Askhat
Tavernier Wouter
Colle Didier
Pickavet Mario
Publication venue
Publication date
31/12/9999
Field of study
No full text
GraphQL-LD: Linked data querying with GraphQL
Author
Taelman Ruben
Vander Sande Miel
Verborgh Ruben
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Publication date
31/12/9999
Field of study
No full text
Abnormal wave reflections and left ventricular hypertrophy late after coarctation of the aorta repair
Author
Quail Michael A.
Short Rebekkah
+6 more
Pandya Bejal
Steeden Jennifer A.
Khushnood Abbas
Taylor Andrew M.
Segers Patrick
Muthurango Vivek
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31/12/9999
Field of study
No full text
The STORM technology CAD system
Author
Lorenz J.
Hill C.
+8 more
Jaouen H.
Lombardi C.
Lyden C.
De Meyer Kristin
Pelka J.
Poncet A.
Rudan M.
Solmi S.
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31/12/9999
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No full text
Interplay between plasma modification of surfaces & atomic layer deposition for semiconductor applications
Author
Swerts Johan
Adelmann Christoph
+7 more
Armini Silvia
Delabie Annelies
Nyns Laura
Popovici Mihaela Ioana
Schaekers Marc
Verdonck Patrick
Van Elshocht Sven
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Publication date
31/12/9999
Field of study
No full text
Just-Clean- Enough technology for the 21st century
Author
Heyns Marc
Meuris Marc
+13 more
Mertens Paul
Hurd Trace
Schmidt Harald
Depas Michel
Rotondaro Antonio
Vermeire Bert
Vandervorst Wilfried
Storm Wolfgang
Polleunis C.
Bertrand P.
McGeary M. J.
Lubbers A.
Hatcher Z.
Publication venue
Publication date
31/12/9999
Field of study
No full text
Scaling trends and performance evaluation of 2-dimensional polarity-controllable FETs
Author
Resta Giovanni
Agarwal Kumar Tarun
+5 more
Lin Dennis
Radu Iuliana
Catthoor Francky
Gaillardon Pierre-Emmanuel
Micheli Giovanni
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31/12/9999
Field of study
No full text
Electro-chemical activity in reflective LCOS panels
Author
Cuypers Dieter
Van Calster Andre
De Smet Herbert
Publication venue
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31/12/9999
Field of study
No full text
Carrier spilling revisited: the on-bevel junction behavior of different electrical depth profiling techniques
Author
Clarysse Trudo
Eyben Pierre
+3 more
Duhayon Natasja
Xu Mingwei
Vandervorst Wilfried
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31/12/9999
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No full text
BEOL pre-metallization wet clean: post-etch residue removal and metal compatibility
Author
Le Quoc Toan
Kesters Els
+3 more
Akanishi Yuya
Iwasaki Akihisa
Holsteyns Frank
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31/12/9999
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imec Publications (Interuniversity Microelectronics Centre)
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