imec Publications (Interuniversity Microelectronics Centre)

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45628 research outputs found

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Simulation of 0.35 μm / 0.25 μm CMOS technology doping profiles

Author: Lorenzini Martino
Haspeslagh Luc
Van Houdt Jan
Maes Herman
Publication venue
Publication date: 31/12/9999
Field of study

BinRec: Atack surface reduction through dynamic binary recovery

Author: Kroes Taddeus
Altinay Anil
Nash Joseph
Na Yeoul
Volckaerts Stijn
Bos Herbert
Publication venue
Publication date: 31/12/9999
Field of study

Comparison between intrinsic and integrated reliability properties of low-k materials

Author: Croes Kristof
Pantouvaki Marianna
Carbonell Laure
Zhao Larry
Beyer Gerald
Tokei Zsolt
Publication venue
Publication date: 31/12/9999
Field of study

High-k dielectrics and metal gates for future generation memory devices

Zero-temperature-coefficient of planar and MuGFET SOI devices

Author: Martino J.A.
Camillo L.M.
Almeida L.M.
Simoen Eddy
Claeys Cor
Publication venue
Publication date: 31/12/9999
Field of study

Scaling friendly design methodology for inductively-degenerated common-source low noise amplifiers

Author: Vandersteen Gerd
Bos Lynn
Dobrovolny Petr
Publication venue
Publication date: 31/12/9999
Field of study

A 79GHz 2x2 MIMO PMCW radar SoC in 28nm CMOS

Author: Guermandi Davide
Shi Qixian
Dewilde Andy
Derudder Veerle
Ahmad Ubaid
Spagnolo Annachiara
Ocket Ilja
Bourdoux André
Wambacq Piet
Craninckx Jan
Van Thillo Wim
Publication venue
Publication date: 31/12/9999
Field of study

Joint hardware-software leakage minimization approach for the register file of VLIW embedded architectures

Author: Atienza David
Raghavan Praveen
Ayala Jose
De Micheli G.
Catthoor Francky
Verkest Diederik
Lopez-Vallejo Marisa
Publication venue
Publication date: 31/12/9999
Field of study

Trustful ad hoc cross-organizational data exchanges based on the Hyperledger Fabric framework

Author: Van Hoye Laurens
Wauters Tim
De Turck Filip
Volckaert Bruno
Publication venue
Publication date: 31/12/9999
Field of study

Towards barrier height modulation in HfO2/TiN by oxygen scavenging - Dielectric defects or metal induced gap states?

Author: Pantisano Luigi
Afanasiev Valeri
Cimino Salvatore
Adelmann Christoph
Goux Ludovic
Chen Yangyin
Kittl Jorge
Wouters Dirk
Jurczak Gosia
Publication venue
Publication date: 31/12/9999
Field of study

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imec Publications (Interuniversity Microelectronics Centre)

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