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1,720,963 research outputs found

CCE 92-05 intercomparison of ac-dc voltage transfer standards at high frequencies (1-50 MHz

Author: van Mullem C.J.
van Mullem C.J. (author)
Publication venue
Publication date: 01/01/1999
Field of study

TU Delft Repository

Novel microelectromechanical references for electric metrology

Author: Kyynäräinen Jukka
Oja Aarne
Seppä Heikki
Publication venue
Publication date: 01/01/2000
Field of study

VTT Research System

Guest editorial

Author: Van Mullem C.J. (author)
Wolffenbuttel R.F. (author)
Publication venue
Publication date: 01/01/2001
Field of study

Electrical Engineering, Mathematics and Computer Scienc

TU Delft Repository

Novel microelectromechanical references for electric metrology

Author: Kyynäräinen Jukka
Oja Aarne
Seppä Heikki
Publication venue
Publication date: 01/01/2000
Field of study

VTT Research System

The relationship between microsystem technology and metrology

Author: van Mullem C.J.
van Mullem C.J. (author)
Wolffenbuttel R.F. (author)
Wolffenbuttel R.F.
Publication venue
Publication date: 01/01/2001
Field of study

Electrical Engineering, Mathematics and Computer Scienc

TU Delft Repository

Microtechnology and microsystems in measurement applications

Author: van Mullem C.J.
van Mullem C.J. (author)
Wolffenbuttel R.F. (author)
Wolffenbuttel R.F.
Publication venue
Publication date: 01/01/2001
Field of study

TU Delft Repository

Micromachined silicon integrated resonant sensors

Author: van Mullem C.J.
Publication venue
Publication date: 26/08/1993
Field of study

University of Twente Research Information

Micromachined silicon integrated sensors

Author: van Mullem C.J.
Publication venue
Publication date: 16/03/1993
Field of study

University of Twente Research Information

Ontwerpen van "integrated" sensors met sensor masterchip

Author: van Mullem C.J.
Publication venue
Publication date: 01/01/1993
Field of study

University of Twente Research Information

Author Instructions

Author: Instructions Author
Publication venue
Publication date: 04/11/2013
Field of study

Cartographic Perspectives (E-Journal - North American Cartographic Information Society, NACIS)

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