1,721,133 research outputs found
Simulation of monolithic silicon LLL scanning X-ray interferometer
No full textA model of a monolithic silicon LLL scanning X-ray interferometer capable of displacements up to 100 mu m is described. It can be used for the measurement of the (2 (2) over bar 0) lattice plane spacing of silicon in studies concerning the Avogadro constant and for the calibration of linear displacement transducers having sub-nanometer sensitivity
Lattice strain effects in the measurement of the Si lattice parameter by Laue-case double-crystal diffractometry
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Non-Linear Analysis of the Elastic Behaviour of a Translation Device for X-Ray Interferometry
No full textINTERNATIONAL WORKSHOP ON THE AVOGADRO CONSTANT AND THE REPRESENTATION OF THE SILICON MOLE - FOREWORD
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Influence of surface stress in the determination of the (220) lattice spacing of silicon
No full textOptically polished surfaces parallel to the (220) lattice planes of silicon monocrystals (vol 10, pg 549, 1999)
No full textMeasuring small lattice distortions in Si-crystals by phase-contrast x-ray topography
No full textX-ray phase-contrast topography has been improved by using phase modulation and computing techniques to determine lattice distortions inside near-perfect Si monocrystals. The technique presented is based on the detection of the spatially varying phase shift at the output of a monolithic x-ray interferometer of the triple Laue type using phase modulation and a multi-element detector. Information was obtained about the degree of perfection of crystals being used in the determination of the (220) lattice plane spacing of silicon and of the Avogadro constant
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