1,720,994 research outputs found
Simplified analytic formulae for magneto-optical Kerr effects in ultrathin magnetic films
No full textExpressions are presented for various magneto-optical Kerr effects in the ultrathin film limit with arbitrary magnetization direction by considering the multiple reflections within an optically thin film. The Kerr effect of p- and s-polarization consists of products of two factors: the prefactor, dependent only on the optical parameters of the system, and the main factor of the polar Kerr effect for normal incidence in the ultrathin limit. (C) 1999 Elsevier Science B.V. All rights reserved.This work was supported by the Creative Research Initiatives of the Ministry of Science and Technology of Korea, and
one author (CYY) wishes to acknowledge the financial support of the Korea Research Foundation made in program
Year 1997, and the hospitality of Argonne National Laboratory. Argonne was supported by the US Department of
Energy, BES-Material Science, under contract No. W-31-109-ENG-38
First-order approximations of the general magneto-optical Kerr effects for an optically thin capping layer
No full textWe formulate analytic expressions for the magneto-optical Ken effect (MOKE) of a magnetic layer covered by an optically thin capping layer, which is common in ex situ experimental situations. Within the first order of a capping layer thickness, polar and longitudinal magneto-optical Kerr effects of p and s polarized waves can be approximated with simple closed forms. They cover all cases of an oblique incident angle with various polarizations and magnetization directions. Especially, it is found that it becomes an extremely simple form for the normal incident case. The dependence of magneto-optical Kerr effects on the thickness and the optical properties of the capping layer is found with these analytic expressions. The validity of the approximated expressions is confirmed via exact numerical solutions for various materials, and it is found that the estimated error is less than 5% for the capping layer thickness 2nd(1)vertical bar n(2)vertical bar/lambda similar to 0.1. We present a guideline for a choice of capping layers for MOKE signal enhancement. (c) 2005 Elsevier B.V. All rights reserved
Determination of the off-diagonal element of the dielectric tensor without measuring the ellipticity
No full textIn addition to the measurement of the Kerr rotation angle, the measurement of the ellipticity is generally known to be necessary for determining the off-diagonal element of the dielectric tenser. We have found a new method for determining the off-diagonal element of the dielectric tensor, without measuring the ellipticity, for a sample deposited on a transparent substrate. (C) 1996 American Institute of Physics.This work was supported by the Ministry of Science and
Technology of Korea
Analytic expressions of the general magneto-optical Kerr effects for a nanometer-thick magnetic layer with a capping layer
No full textWe have formulated analytic expressions for magneto-optical Kerr effect (MOKE) of a magnetic layer covered by a capping layer, when two layers are optically thin enough. Within the first order of the thickness of the magnetic and capping layers, the polar and longitudinal magneto-optical Kerr effects of p and s polarized waves can be approximated with simple closed forms for the general cases of an arbitrary oblique incident angle. It is found that the capping layer thickness dependent part can be separated from the first-order term of the magnetic layer thickness, and it turns out to be the simple form for the normal incident case. The validity of the approximated expressions was examined by comparison with the exact numerical solutions, and it is confirmed that the estimated error was small enough for optically thin enough magnetic and capping layers. (C) 2004 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
Effects of polarizer and analyzer imperfections in a magneto-optical Kerr spectrometer
No full textWe have analyzed the effects of polarizer and analyzer imperfections in a phase-modulated magneto-optical Kerr spectrometer, using Jones matrices, and found that these imperfections do not seriously affect measurements of magneto-optical effects, to a first-order approximation. The analysis was experimentally proved in a magneto-optical Kerr spectrometer with a dichroic polarizer and analyzer with an extinction ratio of similar to 10(-2). (C) 2000 Optical Society of America [S0740-3224(00)03006-X].This study was supported by the Creative Research Initiatives of the Ministry of Science and Technology of Korea. C.-Y. You acknowledges ®nancial support of the Ko-
rea Research Foundation given in the program year 1997
Generalized analytic formulae for magneto-optical Kerr effects
No full textWe have developed simplified analytic expressions for magneto-optical Kerr effects of both optically thick and ultrathin films in the general case, where a magnetic medium had an arbitrary direction of magnetization and a beam of light was obliquely incident to the medium. It was found that the simplified analytic formulae for the Kerr effects of p and s waves consisted of a product of two factors for both optically thick and ultrathin films: the prefactor dependent only on the optical parameters of the system and the main factor of the polar Kerr effect for a normal incidence case. We have also derived some useful relations among the Kerr effects in the polar and longitudinal configurations. We-have demonstrated that the theoretical calculations using the present analytic formulae could well match the experimental polar and longitudinal Kerr rotation angles of magnetic films measured with varying incident angles. (C) 1998 American Institute of Physics.One of the authors ~C.-Y.Y.! gratefully acknowledges
the Korea Research Foundation ~KRF! for providing an op-
portunity and ®nancial assistance to carry out this work
Novel method to determine the off-diagonal element of the dielectric tensor in a magnetic medium
No full textA new method to determine the off-diagonal element of the dielectric tensor from the measurements of p- and s-wave Kerr rotation angles, without measuring the ellipticity is reported on in this letter. The method has been verified by determining the off-diagonal elements of Cu/Co multilayer having in-plane magnetization and Co/Pd multilayer having perpendicular magnetization. (C) 1997 American Institute of Physics.This work was supported by the Ministry of Science and
Technology of Korea
Zone-averaged method to minimize polarizer and analyzer imperfections in a phase-modulated spectroscopic ellipsometer
No full textWe have theoretically investigated the effects of polarizer and analyzer imperfections in a phase-modulated spectroscopic ellipsometer adopting a photoelastic modulator. Jones matrices having off-diagonal elements have been introduced to represent the imperfections of the polarizer and analyzer, and the effects of the imperfections were analytically derived to the first-order approximation. It was found that the effects of the imperfections could be completely eliminated by the zone average. Also, the effects of an incorrect setting of the modulation amplitude were found to be largely reduced by the zone average. (C) 1997 American Institute of Physics.This work was supported by the Ministry of Science and
Technology of Korea
Derivation of simplified analytic formulae for magneto-optical Kerr effects
No full textWe have derived simplified analytic expressions for various magneto-optical Kerr effects of an optically thick medium having an arbitrary magnetization direction. We have found that the simplified formulae for the Kerr effects of p and s waves consisted of a product of two factors: the prefactor dependent pure optical parameters of the system and the main factor of the polar Kerr effect for a normal incidence case. The measured magneto-optic polar Kerr rotation angles of Co/Pd multilayers and the longitudinal Kerr rotation angles of Cu/Co multilayers with varying incident angles could be well fitted using the simplified analytical formulae. (C) 1996 American Institute of Physics
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