66 research outputs found

    Three-dimensional structured illumination microscopy using Lukosz bound apodization reduces pixel negativity at no resolution cost

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    The quality of the reconstructed image in structured illumination microscopy (SIM) depends on various aspects of the image filtering process. To optimize the trade-off between resolution and ringing artifacts, which lead to negative intensities, we extend Lukosz-bound filtering to 3D SIM and derive the parametrization of the 3D SIM cut-off. We compare the use of the Lukosz-bound as apodization filter to triangular apodization and find a tenfold reduction in the most negative pixel value with a minimal resolution loss. We test this algorithm on experimental SIM images of tubulin filaments and DAPI stained DNA structure in cancer cells and find a substantial reduction in the most negative pixel value and the percentage of pixels with a negative value. This means that there is no longer a need to clip the final image to avoid these negative pixel values.ImPhys/Imaging PhysicsApplied Science

    Image filtering in structured illumination microscopy using the Lukosz bound

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    Various aspects of image filtering affect the final image quality in Structured Illumination Microscopy, in particular the regularization parameter and type of regularization function, the relative height of the side bands, and the shape of the apodization function. We propose an apodization filter without adjustable parameters based on the application of the Lukosz bound in order to guarantee a non-negative point spread function. Simulations of digital resolution charts and experimental data of chromatin structures and of actin filaments show artefact free reconstructions for a wide range of filter parameters. In general, a trade-off is observed between sharpness and noise suppression.IST/Imaging Science and TechnologyApplied Science

    Integrated-Optical Nanomechanical Systems

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