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3370: James Mueller
Photograph of author Jim Mueller, professor in the Mayborn school of Journalism at UNT, posing with his book, "Shooting Arrows and Slinging Mud"
Mueller matrix cone and its application to filtering
S.1376-1384We show that there is an isometry between the real ambient space of all Mueller matrices and the space of all Hermitian matrices that maps the Mueller matrices onto the positive semidefinite matrices. We use this to establish an optimality result for the filtering of Mueller matrices, which roughly says that it is always enough to filter the eigenvalues of the corresponding ""coherency matrix."" Then we further explain how the knowledge of the cone of Hermitian positive semidefinite matrices can be transferred to the cone of Mueller matrices with a special emphasis towards optimisation. In particular, we suggest that means of Mueller matrices should be computed within the corresponding Riemannian geometry.3Nr.
Boy Scout Camp at Egg Harbor City (NJ) Lake Park
This photograph shows a troop of Boy Scouts taken at the Boy Scout Cabin located at the Egg Harbor City Lake Park, Egg Harbor City, NJ. The photograph was taken in 1931. Individuals from left to right are: unknown, unknown, unknown, unknown, Paul Bauder, Kurt Konrady, Paul Mangold (1st bugler), unknown, Jim Stone, Laurence Konrady, unknown, unknown, Warren Hall, Tim Mueller. The Scout Master was named Hall
Data for "Mueller Matrix Extrapolations from Linear Partial Polarimetry"
To demonstrate our method for extrapolating full, depolarizing Mueller matrices from fewer than 16 measurements, we measured an ensemble of roughened plastic bricks using a Mueller imaging polarimeter and a linear Stokes camera. The Mueller matrix images from the Mueller imaging polarimeter and the images taken with four polarizer orientations from the linear Stokes camera are included.
For inquiries regarding the contents of this dataset, please contact the Corresponding Author listed in the README.txt file. Administrative inquiries (e.g., removal requests, trouble downloading, etc.) can be directed to [email protected]</p
Imaging Mueller matrix ellipsometry setup for optical nanoform metrology
We designed, realized, and characterised an imaging Mueller matrix ellipsometry setup for the pixelwise measurement of the Mueller matrices in microscope images. Our setup is capable of performing measurements in reflection as well as in transmission in a broad range of angles of incidence for wavelengths between 400 nm and 700 nm. We compared measurements of specially designed nanostructured samples with AFM and SEM measurements as well as with numerical simulations using the finite element method
Nanoform evaluation approach using Mueller matrix microscopy and machine learning concepts
We realized an imaging Mueller matrix microscope for nanostructure characterization. For investigations on nanoform characterization via Mueller matrix images, we measured and simulated Mueller matrix images of specially designed nanostructures. As an approach towards machine learning evaluation in imaging ellipsometry, we calculated Haar-like features of the images and observed a higher sensitivity to subwavelength features in off-diagonal matrix elements compared to microscopy
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