1,720,991 research outputs found
Assessment of Two-Dimensional Materials-based technology for Analog Neural Networks
Embedding advanced cognitive capabilities in battery-constrained edge devices requires specialized hardware with new circuit architecture and – in the medium/long term - new device technology. We evaluate the potential of recently investigated devices based on 2D materials for the realization of analog deep neural networks, by comparing the performance of neural networks based on the same circuit architecture using three different device technologies for transistors and analog memories. As a reference result, it is included in the comparison also an implementation on a standard 0.18 μm CMOS technology. Our architecture of choice makes use of current-mode analog vector-matrix multipliers based on programmable current mirrors consisting of transistors and floating-gate non-volatile memories. We consider experimentally demonstrated transistors and memories based on a monolayer Molibdenum Disulfide channel and ideal devices based on heterostructures of multilayer-monolayer PtSe2. Following a consistent methodology for device-circuit co-design and optimization, we estimate layout area, energy efficiency and throughput as a function of the equivalent number of bits (ENOB), which is strictly correlated to classification accuracy. System-level tradeoffs are apparent: for a small ENOB experimental MoS2 floating-gate devices are already very promising; in our comparison a larger ENOB (7 bits) is only achieved with CMOS, signaling the necessity to improve linearity and electrostatics of devices with 2D materials
Temperature-Resilient Analog Neuromorphic Chip in Single-Polysilicon CMOS Technology
In analog neuromorphic chips, designers can embed computing primitives in the intrinsic physical properties of devices and circuits, heavily reducing device count and energy consumption, and enabling high parallelism, because all devices are computing simultaneously. Neural network parameters can be stored in local analog non-volatile memories (NVMs), saving the energy required to move data between memory and logic. However, the main drawback of analog sub-threshold electronic circuits is their dramatic temperature sensitivity. In this paper, we demonstrate that a temperature compensation mechanism can be devised to solve this problem. We have designed and fabricated a chip implementing a two-layer analog neural network trained to classify low-resolution images of handwritten digits with a low-cost single-poly complementary metal-oxide-semiconductor (CMOS) process, using unconventional analog NVMs for weight storage. We demonstrate a temperature-resilient analog neuromorphic chip for image recognition operating between 10°C and 60°C without loss of classification accuracy, within 2% of the corresponding software-based neural network in the whole temperature range
A 6.78 MHz Maximum Efficiency Tracking Active Rectifier with Load Modulation Control for Wireless Power Transfer to Implantable Medical Devices
This paper presents a novel integrated wireless power transfer receiver for implantable medical devices, including a load-modulation feedback loop and an active rectifier with maximum efficiency tracking technique. The feedback loop enables the control of the power delivered to the load by means of a frequency modulation of the receiver load, introducing an efficiency loss of only 1.64 %. The active rectifier maximizes the efficiency of the link through a second feedback calibration loop of the off-transition of the active diodes, showing a Voltage Conversion Ratio of 0.98 and a Power Conversion Efficiency between 0.86 and 0.91 for a wide range of load conditions. The chip was designed in the 180 nm BCD-on-SOI XFAB technology and evaluated with accurate electrical simulations and Monte Carlo runs
Pixel Design Driven Performance Improvement in 4T CMOS Image Sensors: Dark Current Reduction and Full-Well Enhancement
Dark current (DC) limits the optical performance of CMOS image sensors. The main sources of the DC in a modern submicrometer process are the defects induced by the shallow trench isolation fabrication process steps. In this brief, we present a pixel layout technique to reduce the impact of these defects by removing the trench-oxide between the two adjacent edges of neighboring photodiodes (PDs). This isolation scheme relies only on the p-well layer and provides the further advantage of requiring less area. Hence, a larger PD can be designed, leading to an increased pixel fill factor. Experimental results show that this approach reduces the DC by 21% and increases the linear full well capacity by approximately 9%
Time Domain Analog Neuromorphic Engine Based on High-Density Non-Volatile Memory in Single-Poly CMOS
Increasing the energy efficiency of deep learning systems is critical for improving the cognitive capability of edge devices, often battery operated, as well as for data centers, constrained by the total power envelope. Specialized architectures accelerated by analog vector-matrix multipliers (VMMs) can reduce by orders of magnitude the energy per operation, since the reduced precision of analog computation does not undermine the classification accuracy of the neural network. We show an analog vector-matrix multiplier fabricated with industry-standard 0.18 μm CMOS process, exploiting a single-transistor non-volatile analog memory cell and dedicated technology circuit co-design. The design is focused on implementation in neural networks performing offline training. The VMM performs the analog multiplication of a vector of inputs, encoded in the duration of time pulses, times a matrix of weights, encoded in the programmable currents of the memory cells. A 1.72 μm2 memory cell is realized with a single transistor with floating gate, which can be operated as a two-terminal analog memristive device with more than 64 programmable current levels and high Ihigh/Ilow ratio (> 10 3 ), tuned by the charge injected in the floating gate. A small-area charge amplifier is used to convert the multiply and accumulate operation result into a voltage. System-level projections based on our measurements and simulations provide a throughput of 333.17 GOps/s and an energy efficiency of 122.3 TOps/J, higher than comparable-precision VMMs reported in the literature, and an equivalent area per cell down to 2.15 μm2 , lower than any similar state-of-the-art solution. Of critical importance in view of translation to industry, our proposal uses in a new way an industry-standard low-cost single-poly CMOS process flow
Power Electronics Based on Wide-Bandgap Semiconductors: Opportunities and Challenges
The expansion of the electric vehicle market is driving the request for efficient and reliable power electronic systems for electric energy conversion and processing. The efficiency, size, and cost of a power system is strongly related to the performance of power semiconductor devices, where massive industrial investments and intense research efforts are being devoted to new wide bandgap (WBG) semiconductors, such as silicon carbide (SiC) and gallium nitride (GaN). The electrical and thermal properties of SiC and GaN enable the fabrication of semiconductor power devices with performance well beyond the limits of silicon. However, a massive migration of the power electronics industry towards WBG materials can be obtained only once the corresponding fabrication technology reaches a sufficient maturity and a competitive cost. In this paper, we present a perspective of power electronics based on WBG semiconductors, from fundamental material characteristics of SiC and GaN to their potential impacts on the power semiconductor device market. Some application cases are also presented, with specific benchmarks against a corresponding implementation realized with silicon devices, focusing on both achievable performance and system cost
Assessment of InAs/AlGaSb Tunnel-FET Virtual Technology Platform for Low-Power Digital Circuits
In this work, a complementary InAs/Al0.05Ga0.95Sb
tunnel field-effect-transistor (TFET) virtual technology platform
is benchmarked against the projection to the CMOS FinFET
10-nm node, by means of device and basic circuit simulations.
The comparison is performed in the ultralow voltage regime
(below 500 mV), where the proposed III–V TFETs feature
ON-current levels comparable to scaled FinFETs, for the same
low-operating-power OFF-current. Due to the asymmetrical
n- and p-type I–Vs, trends of noise margins and performances
are investigated for different Wp/Wn ratios. Implications of the
device threshold voltage variability, which turned out to be
dramatic for steep slope TFETs, are also addressed
Analog Vector-Matrix Multiplier Based on Programmable Current Mirrors for Neural Network Integrated Circuits
We propose a CMOS Analog Vector-Matrix Multiplier for Deep Neural Networks, implemented in a standard single-poly 180 nm CMOS technology. The learning weights are stored in analog floating-gate memory cells embedded in current mirrors implementing the multiplication operations. We experimentally verify the analog storage capability of designed single-poly floating-gate cells, the accuracy of the multiplying function of proposed tunable current mirrors, and the effective number of bits of the analog operation. We perform system-level simulations to show that an analog deep neural network based on the proposed vector-matrix multiplier can achieve an inference accuracy comparable to digital solutions with an energy efficiency of 26.4 TOPs/J, a layer latency close to 100 mu s and an intrinsically high degree of parallelism. Our proposed design has also a cost advantage, considering that it can be implemented in a standard single-poly CMOS process flow
Data Loggers for High-Temperature Industrial Environments
Monitoring temperature in harsh environments is necessary for many applications in space exploration, oil and gas production, renewable energy, and process manufacturing. There are several high-temperature scenarios where placing data loggers close to sensors is mandatory. For instance, the fabrication of high-quality photovoltaic cells requires monitoring the thermal processes inside sealed ovens or along conveyor belts, with temperature often well beyond the operating range of industrial-grade electronic components. In this work, we propose two distinct data acquisition systems to address this challenge. The main novelty of the first data logger over existing solutions is that it leverages specialized high-temperature resistant components to withstand temperature up to 200◦C, and, therefore, can be used inside industrial ovens without the need for thermal protection. The second system, instead, employs cheaper and more efficient industrial-grade components, but occupies a larger volume for thermal shielding. We discuss the design of both systems at the hardware and software level, with an emphasis on the key issues related to high-temperature operation. We characterize and test the two data loggers in real case scenarios, demonstrating their robustness where common platforms are inadequate. The two systems achieve a resolution of 0.48◦C and 0.12◦C, and an accuracy of +/− 0.6◦C and +/− 0.4◦C, respectively. Our findings can be generalized and translated to a wide range of industrial applications in harsh environments
An Ultralow-Voltage Energy-Efficient Level Shifter
This brief presents an energy-efficient level shifter (LS) able to convert extremely low level input voltages to the nominal voltage domain. To obtain low static power consumption, the proposed architecture is based on the single-stage differential-cascode-voltage-switch scheme. Moreover, it exploits self-adapting pull-up networks to increase the switching speed and to reduce the dynamic energy consumption, while a split input inverting buffer is used as the output stage to further improve energy efficiency. When implemented in a commercial 180-nm CMOS process, the proposed design can up-convert from the deep subthreshold regime (sub-100 mV) to the nominal supply voltage (1.8 V). For the target voltage level conversion from 0.4 to 1.8 V, our LS exhibits an average propagation delay of 31.7 ns, an average static power of less than 60 pW, and an energy per transition of 173 fJ, as experimentally measured across the test chips
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