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    Characterization of oxygen and oxygen-related defects in high and lowly doped silicon

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    imec Publications (Interuniversity Microelectronics Centre)

    Silicon-based cryogenic electronics: from physical curiosity to quantum computing

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    imec Publications (Interuniversity Microelectronics Centre)

    Low-frequency noise diagnostics of CMOS technologies

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    imec Publications (Interuniversity Microelectronics Centre)

    Defect control in advanced high-mobility substrates

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    imec Publications (Interuniversity Microelectronics Centre)

    Substrate current characteristics of partially depleted SOI n-MOSFETs from room down to liquid helium temperatures

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    imec Publications (Interuniversity Microelectronics Centre)

    Metals in germanium

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    imec Publications (Interuniversity Microelectronics Centre)

    Low temperature electronics: from physical curiosity to quantum computing

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    imec Publications (Interuniversity Microelectronics Centre)

    Defect engineering in high-mobility substrates for advanced CMOS technologies

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    imec Publications (Interuniversity Microelectronics Centre)

    Low-frequency noise characterisation of g-irradiated silicon-on-insulator MOSFETs

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    imec Publications (Interuniversity Microelectronics Centre)

    The use of body ties in cryogenic SOI CMOS

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    imec Publications (Interuniversity Microelectronics Centre)
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