1,721,079 research outputs found
Scaling trends toward N3 and beyond: Device architecture and standard cells innovation impact on patterning and layout
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Method for driving a scanning probe microscope at elevated scan frequencies
No full textA method for operating a scanning probe microscope at elevated scan frequencies has a characterization stage of sweeping a plurality of excitation frequencies of the vertical displacement of the scanning element; measuring the value attained by the reading parameter at the excitation frequencies; and identifying plateau regions of the response spectrum of the reading parameter. The reading parameter variation is limited within a predetermined range over a predefined frequency interval, thereby defining corresponding fast scanning frequency windows in which the microscope assembly is sufficiently stable to yield a lateral resolution comparable to the one obtained during slow measurements. The measurement stage includes driving the scanning element along at least a scanning trajectory over the surface of the specimen at a frequency selected among the frequencies included in a fast scanning frequency window
Sequential 3D standard cell 4T architecture using design crenellation and self-aligned MOL for N2 technology and beyond
Full text linkStandard cell architectures for N2 node: transition from FinFET to nanosheet and to forkheet device
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Understanding workfunction tuning in HKMG by Lanthanum diffusion combining simulations and measurements
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Fast & Accurate Methodology for Aging Incorporation in Circuits using Adaptive Waveform Splitting (AWS)
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