1,722,641 research outputs found
A computer-assisted noise parameter test-set for the characterization of microwave transistors in terms of noise, gain and scattering parameters
No full textAn automated measuring system for the simultaneous determination of noise, gain and scattering parameters of HEMTs
No full textAn automated test-set for the complete characterization on low noise microwave transistors
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A computer-controlled test-set for the complete characterization of GaAs low noise devices
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Comments on `A method for measurement of losses in the noise-matching microwave network while measuring transistor noise parameters' [and reply]
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