1,721,191 research outputs found
EOT-scaling by interface layer scavenging and HfO2 $j-value increase in high-k/metal gate CMOS devices: trade-offs and perspectives
No full textHigh-field transport investigation for 25-nm MOSFETs with 0.64nm EOT: intrinsic performance and parasitic effects
No full textTime dependent dielectric breakdown and stress induced leakage current characteristics of 8 Å EOT HfO2 n-MOSFETs
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Mobility improvement study for 8-Å-EOT HfO2 UTBB-FD-SOI-MOSFET based on the direct extraction of the back channel mobility
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Physical and electrical properties of reactive molecular-beam-deposited aluminum nitride in metal-oxide-silicon structures
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