1,721,418 research outputs found
RTN Analysis as a Tool to Link Physical Device Characteristics to Electrical Reliability in Nanoscale Devices
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Impedance Investigation of MIFM Ferroelectric Tunnel Junction using a Comprehensive Small-Signal Model
Full text linkThe urge to develop efficient and ultra-low power architectures for modern and future technological needs lead to an increasing interest and investigation of neuromorphic and ultra-low power computing. In this respect, ferroelectric technology is found to be a perfect candidate to guide this technological transition. Elucidating the physical mechanisms occurring during ferroelectric-based devices operations is fundamental in order to improve the reliability of emerging architectures. In this work, we investigate metal/insulator/ferroelectric/metal (MIFM) ferroelectric tunnel junctions (FTJs) consisting of a ferroelectric hafnium zirconium oxide (HZO) layer and an alumina (Al2O3) layer by means of C-f and G-f measurements performed at multiple voltages and temperatures. For a trustworthy interpretation of the measurements results, an innovative small signal model is introduced that goes beyond the state of the art by i) separating the role played by the leakage in the two layers; ii) including the impact of the series impedance (that depends on the samples layout); iii) including the frequency dependence of the dielectric permittivity; iv) accounting for the fact that not the whole HZO volume crystallizes in the orthorhombic ferroelectric phase. The model correctly reproduces measurements taken on different devices in different conditions. Results highlight that the typical estimation method for interface trap density may be misleading
Guest Editorial TDMR IIRW Special Section
No full textThe IEEE International Integrated Reliability Workshop (IIRW) is a unique event that takes place every year at the beautiful Fallen Leaf Lake, South Lake Tahoe, CA, USA. The workshop brings together reliability engineers and researchers from all around the world, to exchange ideas over four days in a welcoming, pleasant, and informal setting. The workshop focuses on the recent advances in research on semiconductor device reliability and the related challenges. Topics include transistor and front-end-of-the-line (FEOL) reliability, time-dependent dielectric breakdown (TDDB), bias temperature instability (BTI), hot carrier (HC), back-end-of-the-line (BEOL) reliability, electro-migration, circuit reliability, packaging reliability, conventional and emerging memory reliability, failure analysis, wafer-level reliability, and many others. Specifically, in 2022 IIRW focus areas were circuit reliability (device-circuit degradation and aging), in-memory computing and neuromorphic reliability, plasma-induced damage (PID), and electrostatic discharge (ESD)
On the Ride Comfort Effect of Unsprung Mass Reduction Using a Composite Wheel Rim
No full textIs it possible to feel the difference in terms of comfort and handling between wheel rims having the same size but different weight in a sports vehicle? It is well known that reducing the unsprung mass has a positive effect both on vertical accelerations and forces transferred from the ground to the body of the vehicle. In the present study, a simplified quarter car model is exploited to quantify the real advantage of using composite wheel rim instead of aluminium one for a sports vehicle. Despite the common belief, a reduction of more than 12 kg of the unsprung mass leads to a reduction of less than 1% of the vertical force oscillation; unfortunately, this positive effect is not perceived by the occupants. The influence of the damping parameter on the dynamic response is critically discussed. © 2022, The Author(s), under exclusive license to Springer Nature Switzerland AG
Checkpoint inhibitors, fertility, pregnancy, and sexual life: a systematic review
No full textImmune checkpoint inhibitors (i.e. anti-PD1, anti-PDL1, and anti-CTLA4) have revolutionized the therapeutic approach of several cancer types. In a subset of metastatic patients, the duration of the response is so long that a cure might be hypothesized, and a treatment discontinuation strategy could be proposed. Considering that long-term efficacy, some patients could also plan to have a child. Moreover, immunotherapy is moving to the early setting in several diseases including melanoma and breast cancer that are common cancers in young patients. However, there is a paucity of data about their potential detrimental effect on fertility, pregnancy, or sexuality. Herein, we conducted a systematic review with the aim to comprehensively collect the available evidence about fertility, pregnancy, and sexual adverse effects of checkpoint inhibitors in order to help clinicians in daily practice and trialists to develop future studies
Circuit Reliability Analysis of RRAM-based Logic-in-Memory Crossbar Architectures Including Line Parasitic Effects, Variability, and Random Telegraph Noise
No full textThe Logic-in-Memory paradigm is considered a promising solution for improving the energy efficiency and computing power of architectures aimed at low power and/or data-intensive applications. Among in-memory computing enabling technologies, emerging non-volatile memories (e.g., RRAMs) are promising as they offer BEOL integration and small feature size. Several studies have shown that IMPLY architectures based on RRAM devices and the material implication logic enable the efficient computation of logic operations using the RRAM device both as storing and computing element. However, RRAM devices non-idealities introduce important circuit reliability issues, that are frequently neglected, thus undermining the circuit functionality. In this work, we use a physics-based compact model calibrated on experimental data to simulate the IMPLY operation performed on a crossbar array including line parasitic effects and RRAM devices non-idealities. We then introduce a novel smart scheme, SIMPLY, and show the circuit reliability improvement
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